Method for 3D waveform mapping of full-parallel structure

Patent metadata

Field	Value
Publication number	US-10885604-B2
Application number	US-201916435465-A
Country	US
Kind code	B2
Filing date	Jun 8, 2019
Priority date	Jun 21, 2018
Publication date	Jan 5, 2021
Grant date	Jan 5, 2021

Abstract

The present invention provides a method for 3D waveform mapping of full-parallel structure, first, a 3D waveform mapping database is created according to the size of a 3D waveform image, the number of bits of probability value and the ADC's resolution of data acquisition module, then the 3D waveform mapping database is divided into Mt×Ma independent mapping storage areas along the time axis and the amplitude axis, and each independent mapping storage area is assigned a RAM, then RAMs are selected and addresses are calculated based on the sampling values and the structure of created 3D waveform mapping database, finally, parallel mappings are performed simultaneously on the time axis and the amplitude axis according to the selected RAMs and calculated addresses. Thus, the mapping time are shorten, especially in vector mapping mode, several RAMs are used for mapping, so the WCR of DSO is improved.

First claim

What is claimed is:

1. A method for 3D waveform mapping of full-parallel structure, comprising:
(1). creating a 3D waveform mapping database, where the size of the 3D waveform mapping database is L×2 N ×B/8 (byte), L and 2 N are respectively the length and the width of a 3D waveform image, B is the number of bits of probability value, N is the ADC's (Analog-to-Digital Converter's) resolution of a data acquisition module;
(2). dividing the 3D waveform mapping database into M t vertical mapping storage areas along the time axis and M a horizontal mapping storage areas along the amplitude axis, thus M t ×M a independent mapping storage areas are obtained, where an independent mapping storage area is represented by S ij , i is the serial number of the independent mapping storage area on the time axis, i=0, 1, . . . , M t −1, j is the serial number of the independent mapping storage area on the amplitude axis, j=0, 1, . . . , M a −1;
assigning a random access memory (RAM) for each independent mapping storage area, where the size of the RAM is W data ×T addr , W data is the bit width of data of the RAM, and W data =B, T addr is the address length of the RAM, and T addr =(L×2 N )/(M t ×M a ), the RAM for independent mapping storage area S ij is represented by R ij ;
(3). 3D waveform mapping based on full-parallel structure: performing step 3.1) or step 3.2)
3.1). point mapping:
3.1.1). initializing serial number k of read to 0;
3.1.2). parallel reading out M t sampling values from a FIFO memory in which the sampling values acquired by the data acquisition module are stored, then selecting a RAM R ij for each sampling value Y kl , l=0, 1, . . . , M t −1, according to the following equations:
i=l,j=└Y kl /M a ┘;

where l is the serial number of sampling value Y kl , └ ┘ is the operator of downward rounding;
3.1.3). calculating a physical address A kl for each sampling value Y kl , l=0, 1, . . . , M t −1 according to the following equation:

A
kl

=

[

2
N

M
a

×

(

k
+
1

)

-
1

]

-

(

Y
kl

⁢
%
⁢

M
a

)

where % is the operator of Mod;
3.1.4). parallel updating the probability values of the storage units for the M t sampling values: for each sampling value Y kl , reading out a probability value (initial value is 0) from a storage unit according to physical address A kl in RAM R ij , and adding 1 to the probability value, then writing the added probability value back to the storage unit;
3.1.5). setting serial number k of read to k+1, and returning to step 3.1.2, until L sampling values have been mapped;
3.1.6). returning to step 3.1.1, until a screen refresh signal arrives;
3.2). vector mapping:
3.2.1). initializing serial number k of read to 0;
3.2.2). when in normal sampling mode, parallel reading out M t sampling values from a FIFO memory in which the sampling values acquired by the data acquisition module are stored, then selecting M t pairs of maximum values and minimum values Y kl,max , Y kl,min , l=0, 1, . . . , M t −1, according to the following rules:

{

Y

kl
,
max

=

Y

kl
,
min

=

Y
kl

if
⁢

⁢
l

=

k
=
0

;

Y

kl
,
max

=

max
⁡

(

Y

(

k
-
1

)

⁢

(

M
t

-
1

)

Assignees

• Univ Electronic Sci & Tech China

Inventors

• Huang Wuhuang
• Wang Pan
• Jiang Jun
• Ye Peng
• Yang Kuojun
• Guo Lianping
• Zeng Hao
• Wang Shuo
• Gao Jian

Classifications

• G06T11/26

  Drawing of charts or graphs · CPC title

• G06F3/0604

  Improving or facilitating administration, e.g. storage management · CPC title

• G01R13/0272

  for sampling · CPC title

• G06F3/0673

  Single storage device · CPC title

• G01R13/0209

  in numerical form · CPC title