Inspection jig and inspection device

Patent metadata

Field	Value
Publication number	US-10877085-B2
Application number	US-201716307955-A
Country	US
Kind code	B2
Filing date	Apr 26, 2017
Priority date	Jun 9, 2016
Publication date	Dec 29, 2020
Grant date	Dec 29, 2020

Abstract

An inspection jig may include: an electrode; a probe, the probe having a rear end portion and a tip portion to contact a bump; and a support member supporting the probe. The probe may include: an outer tubular body that is electrically conductive; and an inner tubular body that is electrically conductive, the inner tubular body being inserted into the outer tubular body. The outer tubular body may include outer spring parts to bias the rear end portion. The inner tubular body may include inner spring parts. The tip portion may be a first end of the inner tubular body, and protrudes from a first end of the outer tubular body. The support member may hold the outer tubular body such that the rear end portion is brought into contact with the electrode by the biasing force of the outer spring parts.

First claim

The invention claimed is:

1. An inspection jig comprising:
an electrode configured to be electrically connected to an inspection processing portion, the inspection processing portion configured to electrically inspect a target object;
a probe substantially having a rod shape, the probe comprising:
a rear end portion configured to be brought into contact with the electrode, and
a tip portion configured to be brought into contact with an inspection point on the target object; and

a support member supporting the probe,
wherein
the probe comprises:
an outer tubular body that is electrically conductive; and
an inner tubular body that is electrically conductive,
the inner tubular body being inserted into the outer tubular body,

the outer tubular body comprises an outer spring part configured to expand and contract along an axis of the outer tubular body and configured to bias the rear end portion toward the electrode,
the inner tubular body comprises an inner spring part configured to expand and contract along an axis of the inner tubular body,
the tip portion is a first end of the inner tubular body, and protrudes from a first end of the outer tubular body, and
the support member holds the outer tubular body such that the rear end portion is brought into contact with the electrode by a biasing force of the outer spring part,

wherein the probe further comprises:
a central conductor having a rod shape and that is electrically conductive, and
the central conductor being inserted into the inner tubular body, wherein

the rear end portion is a first end of the central conductor, and protrudes from a second end of the inner tubular body, the second end being opposite to the tip portion that is the first end of the inner tubular body, and
the central conductor is connected to the inner tubular body at a position closer to the rear end portion than the inner spring part of the inner tubular body.

2. The inspection jig according to claim 1 , wherein
the rear end portion is a second end of the outer tubular body, and
the outer tubular body and the inner tubular body are connected to each other at a position closer to the rear end portion than the outer spring part of the outer tubular body and at a position closer to the rear end portion than the inner spring part of the inner tubular body.

3. The inspection jig according to claim 1 , wherein
the electrode has a substantially flat face configured to be brought into contact with the rear end portion, and
the rear end portion has a flat face configured to be brought into contact with the electrode, the flat face being substantially flat and extending in a planar shape.

4. The inspection jig according to claim 1 , wherein
the target object has a target object surface being substantially flat,
the inspection point protrudes from the target object surface,
the support member comprises:
an opposed surface disposed opposite the target object surface; and
a protrusion portion protruding from the opposed surface to interfere with the target object surface,

the tip portion protrudes from an opening in the opposed surface, and
the protrusion portion protrudes from the opposed surface by a length shorter than a sum of a length of the tip portion protruding from the opposed surface and a length of the inspection point protruding from the target object surface.

5. An inspection device comprising:
the inspection jig according to claim 1 ; and
the inspection processing portion configured to inspect the target object, based on an electric signal from the electrode.

6. The inspection jig according to claim 1 , wherein the inner spring part is recessed within the outer tubular body.

7. A probe substantially having a rod shape, comprising:
a tip portion configured to be brought into contact with an inspection point on a target object;
a rear end portion configured to be the opposite side of the tip portion;
an outer tubular body that is electrically conductive;
an inner tubular body that is electrically conductive; and
a central conductor having a rod shape and that is electrically conductive,
wherein,
the inner tubular body is inserted in the outer tubular body,
the outer tubular body comprises an outer spring part configured to expand and contract along an axis of the outer tubular body and configured to bias the rear end portion,
the inner tubular body comprises an inner spring part configured to expand and contract along an axis of the inner tubular body,
the tip portion is a first end of the inner tubular body, and protrudes from a first end of the outer tubular body,
the central conductor being inserted into the inner tubular body, and
wherein
the rear end portion is a first end of the central conductor, and protrudes from a second end of the inner tubular body, the second end being opposite to the tip portion that is the first end of the inner tubular body, and
the central conductor is connected to the inner tubular body at a position closer to the rear end portion than the inner spring part of the inner tubular body.

8. The probe according to claim 7 , wherein
the rear end portion is a second end of the outer tubular body, and
the outer tubular body and the inner tubular body are connected to each other at a position closer to the rear end portion than the outer spring part of the outer tubular body and at a position closer to the rear end portion than the inner spring part of the inner tubular body.

9. The probe according to claim 7 , wherein
the outer spring part comprises an outer first spring part and an outer second spring part,
the inner spring part comprises an inner first spring part and an inner second spring part,
the outer first spring part and the outer second spring part are wound in opposite directions, and are substantially equal in number of turns to each other,
the inner first spring part and the inner second spring part are wound in opposite directions, and are substantially equal in number of turns to each other,
the outer first spring part and the inner first spring part are disposed facing each other, are substantially equal in number of turns to each other, and are wound in opposite directions,
the outer second spring part and the inner second spring part are disposed facing each other, are substantially equal in number of turns to each other, and are wound in opposite directions.

10. An inspection jig comprising:
an electrode configured to be electrically connected to an inspection processing portion, the inspection processing portion configured to electrically inspect a target object;
a probe substantially having a rod shape, the probe comprising:
a rear end portion configured to be brought into contact with the electrode, and
a tip portion configured to be brought into contact with an inspection point on the target object; and

a support member supporting the probe,
wherein
the probe comprises:
an outer tubular body that is electrically conductive; and
an inner tubular body that is electrically conductive,
the inner tubular body being inserted into the outer tubular body,

the outer tubular body comprises an outer spring part configured to expand and contract along an axis of the outer tubular body and configured to bias the rear end portion toward the electrode,
the inner tubular body comprises an inner spring part configured to expand and contract along an axis of the inner tubular body,
the tip portion is a first end of the inner tubular body, and protrudes from a first end of the outer tubular body, and
the support member holds the outer tubular body such that the rear end portion is brought into contact with the electrode by a biasing force of the outer

Assignees

• Nidec Read Corp

Inventors

• Kanai Toshihiko
• Ota Norihiro
• Yokota Yusuke

Classifications

• G01R1/067

  Measuring probes · CPC title

• G01R1/06

  Measuring leads; Measuring probes (G01R19/145, G01R19/165 take precedence) · CPC title

• G01R31/2886

  Features relating to contacting the IC under test, e.g. probe heads; chucks (G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06) · CPC title

• G01R1/0483

  Sockets for unleaded IC's having matrix type contact fields, e.g. BGA or PGA devices; Sockets for unpackaged, naked chips · CPC title

• G01R1/06738

  related to tip portion · CPC title