Tunable Optical Element
US-2016356959-A1 · Dec 8, 2016 · US
US10871663B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10871663-B2 |
| Application number | US-201916401956-A |
| Country | US |
| Kind code | B2 |
| Filing date | May 2, 2019 |
| Priority date | May 3, 2018 |
| Publication date | Dec 22, 2020 |
| Grant date | Dec 22, 2020 |
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A device, includes: a ring waveguide; a diode comprising a junction extending at least partly in the ring waveguide; and a first circuit configured to supply a signal representative of a leakage current in the diode.
Opening claim text (preview).
What is claimed is: 1. A device comprising: a ring waveguide; a diode comprising a junction extending at least partly in the ring waveguide; a measurement circuit coupled to the diode, the measurement circuit configured to generate a signal representative of a leakage current in the diode; and a control circuit coupled to the measurement circuit, the control circuit comprising: a memory element storage comprising instructions and a resonance wavelength target value; and a processor in communication with the memory element storage, wherein the processor executes the instructions to: determine a maximum value of the leakage current from the signal representative of the leakage current in the diode, determine a value of a resonance wavelength of the ring waveguide based on the maximum value of the leakage current; and calculate a difference between the determined value of the resonance wavelength of the ring waveguide and the resonance wavelength target value and, based thereon, modify a temperature of the ring waveguide. 2. The device of claim 1 , wherein the junction of the diode and the ring waveguide are concentric. 3. The device of claim 1 , wherein the diode is a PN-type diode. 4. The device of claim 1 , wherein the diode is a PiN-type diode having a junction corresponding to an intrinsic region of the diode. 5. The device of claim 1 , wherein the junction of the diode fully extends into the ring waveguide. 6. The device of claim 1 , further comprising a heating element coupled to the control circuit. 7. The device of claim 6 , wherein the heating element is controlled according to the signal representative of the leakage current. 8. The device of claim 6 , wherein modifying the temperature of the ring waveguide comprises supplying, to the heating element, a control signal determined by the calculated difference. 9. The device of claim 1 , further comprising at least another waveguide optically coupled to the ring waveguide. 10. The device of claim 1 , wherein a width of the ring waveguide is in a range from 200 nm to 500 nm. 11. The device of claim 1 , further comprising an insulating layer, and wherein the ring waveguide rests on top of and is in contact with the insulating layer. 12. The device of claim 11 , wherein a height of the ring waveguide from the insulating layer is in a range from 200 to 500 nm. 13. The device of claim 1 , wherein the ring waveguide is configured to transmit signals having wavelengths in a range from approximately 1 μm to approximately 2 μm. 14. The device of claim 1 , wherein the signal representative of the leakage current in the diode takes a plurality of values, each of which is representative of the leakage current in the diode for a given wavelength of the signal supplied to an input of the ring waveguide. 15. A device comprising: a ring waveguide; a diode comprising a p/n junction, the p/n junction comprising a region disposed in the ring waveguide; a transimpedance amplifier coupled to the diode; and a processing circuit comprising: a memory element storage comprising instructions; and a microprocessor in communication with the memory element storage, wherein the microprocessor executes the instructions to receive an output from the transimpedance amplifier, determine a value of a resonance wavelength of the ring waveguide by determining a wavelength corresponding to a maximum value of the output from the transimpedance amplifier, and calculate a difference between the determined value of the resonance wavelength of the ring waveguide and a resonance wavelength target value and, based thereon, modify a temperature of the ring waveguide. 16. The device of claim 15 , wherein the device further comprises a heating element coupled to the output of the processing circuit, wherein the microprocessor executes the instructions to output a control signal to the heating element based on the calculated difference. 17. The device of claim 16 , wherein the heating element comprises a resistor arranged proximate a portion of the ring waveguide, wherein the microprocessor is coupled between an analog-to-digital converter and a digital-to-analog converter. 18. A device comprising: a ring waveguide; a heater configured to heat the ring waveguide; a diode comprising a p/n junction, the p/n junction comprising a region disposed in the ring waveguide; an operational amplifier coupled to the diode, the operational amplifier configured to supply a signal representative of a leakage current in the diode; and a processing circuit comprising: a memory element storage comprising instructions; and a microcontroller in communication with the memory element storage, wherein the microcontroller executes the instructions to receive the signal from the operational amplifier, determine a value of a resonance wavelength of the ring waveguide by determining a wavelength corresponding to a maximum value of the leakage current, and calculate a difference between the determined value of the resonance wavelength of the ring waveguide and a resonance wavelength target value and, based thereon, modify a temperature of the ring waveguide. 19. The device of claim 18 , wherein the heater is controlled according to the signal representative of the leakage current. 20. The device of claim 18 , wherein the microcontroller executes the instructions to provide, to the heater, a control signal determined by the calculated difference.
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