Scanning 3D imaging device with power control using multiple wavelengths

Patent metadata

Field	Value
Publication number	US-10871569-B2
Application number	US-201815865128-A
Country	US
Kind code	B2
Filing date	Jan 8, 2018
Priority date	Jan 8, 2018
Publication date	Dec 22, 2020
Grant date	Dec 22, 2020

Abstract

Laser light pulses of at least two different wavelengths are reflected off a scanning mirror. A first time-of-flight distance measurement circuit receives reflected light pulses of a first wavelength and determines distances. A second time-of-flight distance measurement circuit receives reflected light pulses of a second wavelength and determines distances. The laser light pulses of different wavelengths may be interleaved in time to increase resolution. The laser light pulses of different wavelengths may also be used for detecting safety violations and/or power control.

First claim

What is claimed is:

1. A method comprising:
producing a first laser light pulse having a first power level and a first wavelength;
producing a second laser light pulse having a second power level and a second wavelength;
reflecting the first and second laser light pulses off a scanning mirror that scans in alternating sweeps in a field of view;
receiving reflections of the first and second laser light pulses to produce received first and second laser light pulses;
measuring amplitudes of the received first and second laser light pulses; and
based on the amplitudes of the received first and second laser light pulses, modifying the first and second power levels to produce laser light pulses for time-of-flight measurement, wherein the laser light pulses for time-of-flight measurements include laser light pulses at the first wavelength interleaved in time with laser light pulses of the second wavelength to decrease an effective minimum pulse spacing and increase a spatial measurement resolution in the field of view.

2. The method of claim 1 wherein the first and second laser light pulses are emitted in a first sweep of the scanning mirror, and the laser light pulses for time-of-flight measurement are emitted in the first sweep.

3. The method of claim 1 wherein the first and second laser light pulses are emitted in a first sweep of the scanning mirror, and the laser light pulses for time-of-flight measurement are emitted in a second sweep.

4. The method of claim 1 wherein the first and second laser light pulses are emitted in a first sweep of a first frame of the scanning mirror, and the laser light pulses for time-of-flight measurement are emitted in the first sweep of a second frame.

5. The method of claim 1 further comprising:
measuring a time-of-flight of the first and second laser light pulses; and
if the time-of-flight of the first and second laser light pulses are below a threshold, entering a safety state in which the first and second power levels are reduced below a safe level.

6. The method of claim 1 further comprising
producing a third laser light pulse having a third power level and a third wavelength; and
reflecting the third laser light pulse off the scanning mirror.

7. The method of claim 6 wherein the first, second, and third laser light pulses comprise laser light pulses at different infrared wavelengths.

8. The method of claim 1 further comprising:
producing laser light pulses in the visible spectrum; and
reflecting the laser light pulses in the visible spectrum off the scanning mirror to produce an image in the field of view.

9. An apparatus comprising:
a first laser light source to emit laser light pulses of a first wavelength;
a second laser light source to emit laser light pulses of a second wavelength;
at least one scanning mirror to reflect and scan the laser light pulses from the first and second laser light sources;
a first amplitude measurement circuit to receive reflections of, and to determine amplitudes of, reflected laser light pulses of the first wavelength;
a second amplitude measurement circuit to receive reflections of, and to determine amplitudes of, reflected laser light pulses of the second wavelength; and
a control circuit to compare the amplitudes from the first and second amplitude measurement circuits, and to adjust amplitudes of the laser light pulses of the first and second wavelengths, and to cause the laser light pulses of the first and second wavelengths to be interleaved in time to decrease an effective minimum pulse spacing and increase a spatial measurement resolution.

10. The apparatus of claim 9 wherein the first and second laser light sources emit infrared light of different wavelengths.

11. The apparatus of claim 10 further comprising at least one laser light source to produce laser light pulses in the visible spectrum.

Assignees

• Microvision Inc

Inventors

• Viswanathan P Selvan
• Xue Bin

Classifications

• G01S17/89

  for mapping or imaging · CPC title

• G01S7/4815

  using multiple transmitters · CPC title

• G01S7/4861

  Circuits for detection, sampling, integration or read-out · CPC title

• G01S7/4865

  Time delay measurement, e.g. time-of-flight measurement, time of arrival measurement or determining the exact position of a peak (peak detection in noise, signal conditioning G01S7/487) · CPC title

• G01S17/10 Primary

  using transmission of interrupted, pulse-modulated waves (determination of distance by phase measurements G01S17/32) · CPC title