Optical fiber strain and temperature measurement apparatus and optical fiber strain and temperature measurement method

US10871406B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10871406-B2
Application numberUS-201816031604-A
CountryUS
Kind codeB2
Filing dateJul 10, 2018
Priority dateSep 27, 2017
Publication dateDec 22, 2020
Grant dateDec 22, 2020

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A self-delayed homodyne interferometer includes light source unit, a splitting unit, an interference signal acquisition unit, a scattered light intensity acquisition unit, and a signal processing unit. The light source unit generates probe light. The splitting unit splits into two branches, Brillouin backscattered light occurring in an optical fiber to be measured with the probe light. The acquisition unit receives scattered light of one branch, and uses a self-delayed homodyne interferometer to generate an interference signal. The acquisition unit receives scattered light of the other branch, and acquires intensity of the scattered light. The signal processing unit separates and acquires a frequency shift amount from the intensity of the interference signal, and strain and temperature change from the intensity of the scattered light. The acquisition unit can change a phase of the scattered light of the one of the two branches.

First claim

Opening claim text (preview).

What is claimed is: 1. An optical fiber strain and temperature measurement apparatus comprising: a light source unit configured to generate probe light; a splitting unit configured to split Brillouin backscattered light into two branches, the Brillouin backscattered light occurring in an optical fiber to be measured with the probe light; an interference signal acquisition unit configured to receive scattered light of one of the two branches split by the splitting unit, and use self-delayed homodyne interferometer to generate an interference signal; a scattered light intensity acquisition unit configured to receive scattered light of another of the two branches split by the splitting unit, and acquire intensity of the scattered light; and a signal processing unit configured to separate and acquire a frequency shift amount acquired from intensity of the interference signal, and strain δε and a temperature change δT from the intensity of the scattered light, wherein the interference signal acquisition unit is capable of changing a phase of the scattered light of the one of the two branches. 2. The optical fiber strain and temperature measurement apparatus according to claim 1 , wherein the signal processing unit acquires the strain δε and the temperature change δT in an optical fiber by solving following simultaneous equations (1) with two unknowns from the frequency shift amount δv and the intensity δP B /P B , a strain dependence coefficient C vε and a temperature dependence coefficient C vT of a frequency shift of Brillouin backscattering, and a strain dependence coefficient C Pε and a temperature dependence coefficient C PT of a scattering coefficient of the Brillouin backscattering in the optical fiber, the strain dependence coefficient C vε , the temperature dependence coefficient C vT , the strain dependence coefficient C Pε , and the temperature dependence coefficient C PT being obtained in advance δ ⁢ ⁢ v = ( C v ⁢ ⁢ ɛ ⁢ δɛ + C vT ⁢ δ ⁢ ⁢ T ) ⁢ ( 1 + C P ⁢ ⁢ ɛ ⁢ δɛ + C PT ⁢ δ ⁢ ⁢ T 100 ) 2 ⁢ ⁢ 100 ⁢ δ ⁢ ⁢ P B P B = C P ⁢ ⁢ ɛ ⁢ δɛ + C PT ⁢ δ ⁢ ⁢ T . ( 1 ) 3. The optical fiber strain and temperature measurement apparatus according to claim 1 , wherein the interference signal acquisition unit includes a self-delayed homodyne interferometer including an interferometer splitting unit configured to split the received scattered light into two branches of a first light path and a second light path, a delay adjustment unit provided in the first light path, and capable of changing the phase of the scattered light in accordance with an instruction from the signal processing unit

Assignees

Inventors

Classifications

  • using inelastic backscattering to detect the measured quantity, e.g. using Brillouin or Raman backscattering · CPC title

  • using other interferometers · CPC title

  • using Brillouin scattering · CPC title

  • G01K11/32Primary

    using changes in transmittance, scattering or luminescence in optical fibres · CPC title

  • Scattering spectrometry (particle sizing by light scattering G01N15/0205; optical velocimetry of particles G01P5/20, G01P5/26) · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10871406B2 cover?
A self-delayed homodyne interferometer includes light source unit, a splitting unit, an interference signal acquisition unit, a scattered light intensity acquisition unit, and a signal processing unit. The light source unit generates probe light. The splitting unit splits into two branches, Brillouin backscattered light occurring in an optical fiber to be measured with the probe light. The acqu…
Who is the assignee on this patent?
Oki Electric Ind Co Ltd
What technology area does this patent fall under?
Primary CPC classification G01D5/35364. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 22 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 4 related publications on this page (citations in our corpus or others sharing the same primary CPC).