Spectrophotometer

US10866140B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10866140-B2
Application numberUS-201716604995-A
CountryUS
Kind codeB2
Filing dateApr 20, 2017
Priority dateApr 20, 2017
Publication dateDec 15, 2020
Grant dateDec 15, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

Provided is a spectrophotometer having a positional relationship between the spectroscope and a PDA that is set to have a distance between a reflection position of light reflected on a light receiving surface of a corresponding one of PDs constituting the PDA, being configured to receive at least light having a wavelength of from 200 nm to 300 nm, and an incident position at which light reflected at the reflection position is incident on a light receiving surface of the PDA after being re-reflected on the protective plate, the distance being equal to or less than a width dimension of any one of the PDs constituting the PDA.

First claim

Opening claim text (preview).

The invention claimed is: 1. A spectrophotometer serving as a liquid chromatograph detector, comprising: a light source; a flow cell in which a sample flows, the flow cell being disposed in an optical path of light from the light source; a spectrometer for dispersing light which passed through the flow cell for each wavelength component; a photodiode array provided with a plurality of photodiodes for detecting the amount of incident light, the plurality of photodiodes are aligned in one direction, the photodiode array being disposed to allow light for each of the wavelength components dispersed by the spectroscope to be incident on a light receiving surface of the corresponding one of the photodiodes; and an optically transparent protective plate protecting a light receiving surface of the photodiode array, a positional relationship between the spectroscope and the photodiode array is set so that a distance between a reflection position of light reflected on the light receiving surfaces of the photodiodes which receive at least lights whose wavelength are from 200 nm to 300 nm, and an incident position at which lights reflected at the reflection position are incident on the light receiving surface of the photodiode array after being re-reflected on the protective plate is equal to or less than a width dimension of any one of the photodiodes constituting the photodiode array, or is equal to or less than minimum spectrum resolution of the spectrophotometer. 2. The spectrophotometer according to claim 1 , wherein the positional relationship between the spectroscope and the photodiode array is set so that an optical axis of light whose wavelength is a predetermined wavelength of from 200 nm to 300 nm among light dispersed by the spectroscope is orthogonal to the one direction. 3. The spectrophotometer according to claim 2 , wherein the predetermined wavelength is about 250 nm. 4. The spectrophotometer according to claim 1 , wherein the positional relationship between the spectroscope and the photodiode array is set so that an optical axis of light dispersed by the spectroscope is inclined from a direction orthogonal to the one direction in a plane of the light receiving surface of the photodiode array to allow light reflected on the light receiving surface of the photodiode array to deviate from the spectroscope. 5. The spectrophotometer according to claim 1 , wherein an anti-reflection coating for reducing a reflectance is applied to at least one of the light receiving surfaces of each of the photodiodes, a surface of the protective plate close to the photodiodes, and a surface of the protective plate opposite to the photodiodes. 6. The spectrophotometer according to claim 1 , further comprising: an inlet slit provided in an optical path of light incident on the spectrometer, wherein a positional relationship between the inlet slit and the spectroscope is set so that light from the spectroscope reflected on the inlet slit deviates from the spectroscope. 7. A spectrophotometer serving as a liquid chromatograph detector, comprising: a light source; a flow cell in which a sample flows, the flow cell being disposed in an optical path of light from the light source; a spectrometer for dispersing light which passed through the flow cell for each wavelength component; a photodiode array provided with a plurality of photodiodes for detecting the amount of incident light, the plurality of photodiodes are aligned in one direction, the photodiode array being disposed to allow light for each of the wavelength components dispersed by the spectroscope to be incident on a light receiving surface of the corresponding one of the photodiodes; and an optically transparent protective plate protecting a light receiving surface of the photodiode array, a positional relationship between the spectroscope and the photodiode array is set so that an optical axis of light whose wavelength is a predetermined wavelength of from 200 nm to 300 nm among light dispersed by the spectroscope is orthogonal to the one direction and an effect of stray light caused by light re-reflected by the protective plate within the wavelength range of from 200 nm to 300 nm is minimized. 8. The spectrophotometer according to claim 7 , further comprising: an inlet slit provided in an optical path of light incident on the spectrometer, wherein a positional relationship between the inlet slit and the spectroscope is set so that light from the spectroscope reflected on the inlet slit deviates from the spectroscope.

Assignees

Inventors

Classifications

  • using diffraction elements, e.g. grating (gratings per se G02B) · CPC title

  • Constructional arrangements for removing stray light · CPC title

  • Systems in which incident light is modified in accordance with the properties of the material investigated (where the material investigated is optically excited causing a change in wavelength of the incident light G01N21/63) · CPC title

  • Reflectance · CPC title

  • G01J3/42Primary

    Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry (beam switching arrangements G01J3/08) · CPC title

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What does patent US10866140B2 cover?
Provided is a spectrophotometer having a positional relationship between the spectroscope and a PDA that is set to have a distance between a reflection position of light reflected on a light receiving surface of a corresponding one of PDs constituting the PDA, being configured to receive at least light having a wavelength of from 200 nm to 300 nm, and an incident position at which light reflect…
Who is the assignee on this patent?
Shimadzu Corp
What technology area does this patent fall under?
Primary CPC classification G01J3/42. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 15 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 3 related publications on this page (citations in our corpus or others sharing the same primary CPC).