Magnetic tape and method of manufacturing the same
US-2016093323-A1 · Mar 31, 2016 · US
US10854230B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10854230-B2 |
| Application number | US-201816038884-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jul 18, 2018 |
| Priority date | Jul 19, 2017 |
| Publication date | Dec 1, 2020 |
| Grant date | Dec 1, 2020 |
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The magnetic tape includes a magnetic layer including ferromagnetic powder, non-magnetic powder, and a binding agent and a back coating layer including non-magnetic powder and a binding agent, in which the ferromagnetic powder is ferromagnetic hexagonal ferrite powder, an Ra measured regarding a surface of the magnetic layer is equal to or smaller than 1.8 nm, an intensity ratio of a peak intensity of a diffraction peak of a (110) plane with respect to a peak intensity of a diffraction peak of a (114) plane of a hexagonal ferrite crystal structure obtained by an X-ray diffraction analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, and a logarithmic decrement acquired by a pendulum viscoelasticity test performed regarding a surface of the back coating layer is equal to or smaller than 0.060.
Opening claim text (preview).
What is claimed is: 1. A magnetic tape comprising: a non-magnetic support; a magnetic layer including ferromagnetic powder, non-magnetic powder, and a binding agent on one surface side of the non-magnetic support; and a back coating layer including non-magnetic powder and a binding agent on the other surface side of the non-magnetic support, wherein the ferromagnetic powder is ferromagnetic hexagonal ferrite powder, a center line average surface roughness Ra measured regarding a surface of the magnetic layer is equal to or smaller than 1.8 nm, an intensity ratio Int(110)/Int(114) of a peak intensity Int(110) of a diffraction peak of a (110) plane with respect to a peak intensity Int(114) of a diffraction peak of a (114) plane of a hexagonal ferrite crystal structure obtained by an X-ray diffraction analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, and a logarithmic decrement acquired by a pendulum viscoelasticity test performed regarding a surface of the back coating layer is equal to or smaller than 0.060. 2. The magnetic tape according to claim 1 , wherein the logarithmic decrement is 0.010 to 0.060,and the logarithmic decrement is determined by the following method: securing a measurement sample of the magnetic tape with the measurement surface, which is the surface on the backcoat layer side, facing upward on a substrate in a pendulum viscoelasticity tester; disposing a columnar cylinder edge which is 4 mm in diameter and equipped with a pendulum 13 g in weight on the measurement surface of the measurement sample such that the long axis direction of the columnar cylinder edge runs parallel to the longitudinal direction of the measurement sample; raising the surface temperature of the substrate on which the measurement sample has been positioned at a rate of less than or equal to 5° C./min up to 80° C.; inducing initial oscillation of the pendulum; monitoring the displacement of the pendulum while it is oscillating to obtain a displacement-time curve for a measurement interval of greater than or equal to 10 minutes; and obtaining the logarithmic decrement Δ from the following equation: Δ = ln ( A 1 A 2 ) + ln ( A 2 A 3 ) + … ln ( A n A n + 1 ) n wherein the interval from one minimum displacement to the next minimum displacement is adopted as one wave period; the number of waves contained in the displacement-time curve during one measurement interval is denoted by n, the difference between the minimum displacement and the maximum displacement of the n th wave is denoted by An, and the logarithmic decrement is calculated using the difference between the next minimum displacement and maximum displacement of the n th wave (A n+1 in the above equation). 3. The magnetic tape according to claim 1 , wherein the center line average surface roughness Ra measured regarding the surface of the magnetic layer is 1.2 nm to 1.8 nm. 4. The magnetic tape according to claim 2 , wherein the center line average surface roughness Ra measured regarding the surface of the magnetic layer is 1.2 nm to 1.8 nm. 5. The magnetic tape according to claim 1 , wherein the vertical squareness ratio of the magnetic tape is 0.65 to 0.90. 6. The magnetic tape according to claim 2 , wherein the vertical squareness ratio of the magnetic tape is 0.65 to 0.90. 7. The magnetic tape according to claim 3 , wherein the vertical squareness ratio of the magnetic tape is 0.65 to 0.90. 8. The magnetic tape according to claim 4 , wherein the vertical squareness ratio of the magnetic tape is 0.65 to 0.90. 9. The magnetic tape according to claim 1 , further comprising: a non-magnetic layer including non-magnetic powder and a binding agent between the non-magnetic support and the magnetic layer.
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