Magnetic tape having characterized magnetic layer

US10854229B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10854229-B2
Application numberUS-201816038847-A
CountryUS
Kind codeB2
Filing dateJul 18, 2018
Priority dateJul 19, 2017
Publication dateDec 1, 2020
Grant dateDec 1, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

Official abstract text for this publication.

Provided is a magnetic tape in which an Ra measured regarding a surface of a magnetic layer is equal to or smaller than 1.8 nm, Int(110)/Int(114) of a hexagonal ferrite crystal structure obtained by an XRD analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, full widths at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer before and after performing a vacuum heating with respect to the magnetic tape are greater than 0 nm and equal to or smaller than 10.0 nm, and a difference between the spacings measured by optical interferometry regarding the surface of the back coating layer before and after performing the vacuum heating is greater than 0 nm and equal to or smaller than 8.0 nm.

First claim

Opening claim text (preview).

What is claimed is: 1. A magnetic tape comprising: a non-magnetic support; a magnetic layer including ferromagnetic powder, non-magnetic powder, and a binding agent on one surface side of the non-magnetic support; and a back coating layer including non-magnetic powder and a binding agent on the other surface side of the non-magnetic support, wherein the ferromagnetic powder is ferromagnetic hexagonal ferrite powder, a center line average surface roughness Ra measured regarding a surface of the magnetic layer is equal to or smaller than 1.8 nm, an intensity ratio Int(110)/Int(114) of a peak intensity Int(110) of a diffraction peak of a (110) plane with respect to a peak intensity Int(114) of a diffraction peak of a (114) plane of a hexagonal ferrite crystal structure obtained by an X-ray diffraction analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, the back coating layer includes fatty acid ester, a full width at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer before performing a vacuum heating with respect to the magnetic tape is greater than 0 nm and equal to or smaller than 10.0 nm, a full width at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer after performing the vacuum heating with respect to the magnetic tape is greater than 0 nm and equal to or smaller than 10.0 nm, and a difference S after −S before between a spacing S after measured by optical interferometry regarding the surface of the back coating layer after performing the vacuum heating with respect to the magnetic tape and a spacing S before measured by optical interferometry regarding the surface of the back coating layer before performing the vacuum heating with respect to the magnetic tape is greater than 0 nm and equal to or smaller than 8.0 nm. 2. The magnetic tape according to claim 1 , wherein the center line average surface roughness Ra measured regarding the surface of the magnetic layer is 1.2 nm to 1.8 nm. 3. The magnetic tape according to claim 1 , wherein the vertical squareness ratio is 0.65 to 0.90. 4. The magnetic tape according to claim 1 , wherein the full width at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer before performing the vacuum heating with respect to the magnetic tape is greater than 0 nm and equal to or smaller than 8.5 nm. 5. The magnetic tape according to claim 1 , wherein the full width at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer after performing the vacuum heating with respect to the magnetic tape is greater than 0 nm and equal to or smaller than 8.5 nm. 6. The magnetic tape according to claim 1 , wherein the difference S after −S before is greater than 0 nm and equal to or smaller than 6.0 nm. 7. The magnetic tape according to claim 1 , wherein the center line average surface roughness Ra measured regarding the surface of the magnetic layer is 1.2 nm to 1.8 nm, the vertical squareness ratio is 0.65 to 0.90, the full width at half maximum of spacing distribution measured by optical interferometry regarding the surface of the back coating layer before performing the vacuum heating with respect to the magnetic tape is greater than 0 nm and equal to or smaller than 8.5 nm, and the difference S after −S before is greater than 0 nm and equal to or smaller than 6.0 nm. 8. The magnetic tape according to claim 1 , wherein the non-magnetic powder included in the back coating layer is one or more kinds of non-magnetic powder selected from the group consisting of inorganic powder and carbon black. 9. The magnetic tape according to claim 8 , wherein a content of the inorganic powder in the back coating layer is greater than 50.0 parts by mass and equal to or smaller than 100.0 parts by mass with respect to 100.0 parts by mass of a total amount of the non-magnetic powder included in the back coating layer. 10. The magnetic tape according to claim 1 , further comprising: a non-magnetic layer including non-magnetic powder and a binding agent between the non-magnetic support and the magnetic layer.

Assignees

Inventors

Classifications

  • characterised by the surface treatment or coating of magnetic particles · CPC title

  • specially adapted for achieving a specific property, e.g. average roughness [Ra] · CPC title

  • on a base layer · CPC title

  • non-magnetic abrasive particles · CPC title

  • G11B5/78Primary

    Tape carriers · CPC title

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What does patent US10854229B2 cover?
Provided is a magnetic tape in which an Ra measured regarding a surface of a magnetic layer is equal to or smaller than 1.8 nm, Int(110)/Int(114) of a hexagonal ferrite crystal structure obtained by an XRD analysis of the magnetic layer by using an In-Plane method is 0.5 to 4.0, a vertical squareness ratio of the magnetic tape is 0.65 to 1.00, full widths at half maximum of spacing distribution…
Who is the assignee on this patent?
Fujifilm Corp
What technology area does this patent fall under?
Primary CPC classification G11B5/78. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Dec 01 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 12 related publications on this page (citations in our corpus or others sharing the same primary CPC).