Attenuated total reflection crystal fabricated from diamond material

Patent metadata

Field	Value
Publication number	US-10852234-B2
Application number	US-201716306623-A
Country	US
Kind code	B2
Filing date	Jul 3, 2017
Priority date	Jul 4, 2016
Publication date	Dec 1, 2020
Grant date	Dec 1, 2020

Abstract

An attenuated total reflection (ATR) crystal (10) for ATR spectroscopy of a sample to be analysed. The ATR crystal is formed of a diamond material and configured to have an inlet surface (12) for an infrared analysis beam, an outlet surface (14) for the infrared analysis beam, and a working surface (16) for contacting the sample to be analysed. The ATR crystal (10) is in the form of a chamfered cylinder comprising two flat chamfered side walls forming the inlet and outlet surfaces (12, 14), and an end surface of the chamfered cylinder forming the working surface (16). The analysis beam can be directed through the inlet surface (12) to an inner side of the working surface (16) in contact with the sample to be analysed and internally reflected at the inner side of the working surface (16) in contact with the sample to be analysed such that the analysis beam passes out of the ATR crystal through the outlet surface (14). The working surface (16) is convexly curved.

First claim

The invention claimed is:

1. An attenuated total reflection (ATR) crystal for ATR spectroscopy of a sample to be analysed,
the ATR crystal being formed of a diamond material, and
configured to have an inlet surface for an infrared analysis beam, an outlet surface for the infrared analysis beam, and a working surface for contacting the sample to be analysed, wherein the ATR crystal is in the form of a chamfered cylinder comprising two flat chamfered side walls forming the inlet and outlet surfaces, and an end surface of the chamfered cylinder forming the working surface;
the inlet surface, the outlet surface and the working surface being configured such that in use the analysis beam can be directed through the inlet surface to an inner side of the working surface in contact with the sample to be analysed and internally reflected at the inner side of the working surface in contact with the sample to be analysed such that the analysis beam passes out of the ATR crystal through the outlet surface, and
characterized in that the working surface is convexly curved, wherein the convexly curved working surface defines a segment having a depth in a range 2 to 100 μm.

2. An ATR crystal according to claim 1 , wherein the working surface is spherically symmetric.

3. An ATR crystal according to claim 1 , further comprising a secondary chamfer surrounding the working surface.

4. An ATR crystal according to claim 1 , wherein the inlet surface, the outlet surface, and/or the working surface have a surface roughness R a less than 30 nm.

5. An ATR spectrometer comprising an infrared beam source, an ATR crystal according to claim 1 , and a detector.

Assignees

• Element Six Tech Ltd

Inventors

• Dodson Joseph

Classifications

• G01N21/552 Primary

  Attenuated total reflection · CPC title

• G01J2003/425

  Reflectance · CPC title

• G01J3/42

  Absorption spectrometry; Double beam spectrometry; Flicker spectrometry; Reflection spectrometry (beam switching arrangements G01J3/08) · CPC title

• G01N21/35

  using infrared light (G01N21/39 takes precedence) · CPC title