Method and circuit for detecting a loss of a bondwire in a power switch

Patent metadata

Field	Value
Publication number	US-10845428-B2
Application number	US-201815995858-A
Country	US
Kind code	B2
Filing date	Jun 1, 2018
Priority date	Jun 1, 2018
Publication date	Nov 24, 2020
Grant date	Nov 24, 2020

Abstract

A driver circuit associated with a power electronic system is disclosed. The driver circuit comprises a gate driver circuit configured to drive a switching circuit comprising a plurality of switches in parallel, each switch comprising a respective source bondwire. The driver circuit further comprises a bondwire fault detection circuit comprising a gate charge estimation circuit configured to measure a parameter of the switching circuit comprising a gate charge of the switching circuit or a parameter indicative of the gate charge associated with the switching circuit. The bondwire fault detection circuit further comprises a detection circuit configured to detect a fault associated with at least one source bondwire of the switching circuit, based on the measured parameter of the switching circuit.

First claim

What is claimed is:

1. A driver circuit, comprising:
a gate driver circuit configured to drive a switching circuit comprising a plurality of switches in parallel, each switch comprising a respective source bondwire; and
a bondwire fault detection circuit comprising:
a gate charge estimation circuit configured to measure a parameter of the switching circuit comprising a gate charge of the switching circuit or a parameter indicative of the gate charge associated with the switching circuit; and
a detection circuit configured to detect a fault associated with at least one source bondwire of the switching circuit, based on the measured parameter of the switching circuit.

2. The driver circuit of claim 1 , wherein the gate charge estimation circuit is configured to measure the parameter of the switching circuit at a plurality of switching events associated with the switching circuit.

3. The driver circuit of claim 1 , wherein the detection circuit is configured to detect the fault based on a comparison of the measured parameter of the switching circuit to a predetermined measured parameter threshold.

4. The driver circuit of claim 3 , wherein the predetermined measured parameter threshold comprises an earlier value of the measured parameter of the switching circuit measured at an earlier instant of time.

5. The driver circuit of claim 3 , wherein the gate charge estimation circuit comprises:
a current measurement circuit configured to generate a replica of a gate current at a common gate terminal of the switching circuit, and
a charge measurement circuit configured to determine a corresponding gate charge based on an integration of the generated replica of the gate current.

6. The driver circuit of claim 3 , wherein the gate charge estimation circuit comprises a time measurement circuit configured to measure a turn-on time required to turn on the switching circuit or a turn-off time required to turn off the switching circuit, wherein the turn-on time and the turn-off time are indicative of the gate charge of the switching circuit.

7. The driver circuit of claim 6 , wherein the time measurement circuit comprises a counter configured to start counting at a start time of the gate driver circuit and stop counting when the switching circuit is turned on, thereby measuring the turn-on time of the switching circuit.

8. The driver circuit of claim 3 , wherein the gate charge estimation circuit comprises:
an alternating current (AC) source circuit coupled to a common gate terminal of the switching circuit and configured to output an AC signal to the common gate terminal; and
an amplitude detector circuit configured to measure an amplitude of the AC signal at the common gate terminal, wherein the amplitude of the AC signal is indicative of the gate charge of the switching circuit.

9. The driver circuit of claim 1 , wherein the gate charge estimation circuit comprises a gate voltage comparator circuit configured to measure a voltage difference between a first gate voltage associated with a first switch of the plurality of switches and a second gate voltage associated with a second switch of the plurality of switches, during a turn-on phase or a turn-off phase of the switching circuit, wherein the measured voltage difference is indicative of the gate charge of the switching circuit.

10. A method for detecting a fault associated with a source bondwire in a switching circuit comprising a plurality of switches in parallel, each switch comprising a respective source bondwire, the method comprising:
measuring a parameter of the switching circuit comprising a gate charge of the switching circuit or a parameter indicative of the gate charge associated with the switching circuit; and
detecting a fault associated with at least one source bondwire of the switching circuit, based on the measured parameter of the switching circuit.

11. The method of claim 10 , further comprising repeating the measurement of the parameter of the switching circuit at a plurality of switching events associated with the switching circuit.

12. The method of claim 10 , wherein detecting the fault associated with the at least one source bondwire of the switching circuit comprises comparing the measured parameter of the switching circuit to a predetermined measured parameter threshold.

13. The method of claim 12 , wherein the predetermined measured parameter threshold comprises an earlier value of the measured parameter of the switching circuit measured at an earlier instant of time.

14. A bondwire fault detection circuit, comprising:
a gate charge estimation circuit configured to measure a parameter of a switching circuit comprising a plurality of switches in parallel, each switch comprising a respective source bondwire, the parameter of the switching circuit comprising a gate charge of the switching circuit or a parameter indicative of the gate charge associated with the switching circuit; and
a detection circuit configured to detect a fault associated with at least one source bondwire associated with the switching circuit, based on the measured parameter of the switching circuit.

15. The bondwire fault detection circuit of claim 14 , wherein the gate charge estimation circuit is configured to measure the parameter of the switching circuit at a plurality of switching events associated with the switching circuit.

16. The bondwire fault detection circuit of claim 14 , wherein the detection circuit is configured to detect the fault based on a comparison of the measured parameter of the switching circuit to a predetermined measured parameter threshold.

17. The bondwire fault detection circuit of claim 16 , wherein the predetermined measured parameter threshold comprises an earlier value of the measured parameter of the switching circuit measured at an earlier instant of time.

18. The bondwire fault detection circuit of claim 16 , wherein the gate charge estimation circuit comprises:
a current measurement circuit configured to measure a gate current at a common gate terminal of the switching circuit, and
a charge measurement circuit configured to determine a corresponding gate charge based on an integration of the measured gate current.

19. The bondwire fault detection circuit of claim 16 , wherein the gate charge estimation circuit comprises a time measurement circuit configured to measure a turn-on time required to turn on the switching circuit or a turn-off time required to turn off the switching circuit, wherein the turn-on time and the turn-off time are indicative of the gate charge of the switching circuit.

20. The bondwire fault detection circuit of claim 16 , wherein the gate charge estimation circuit comprises:
an alternating current (AC) source circuit coupled to a common gate terminal of the switching circuit and configured to output an AC signal to the common gate terminal; and
an amplitude detector circuit configured to measure an amplitude of the AC signal at the common gate terminal, wherein the amplitude of the AC signal is indicative of the gate charge of the switching circuit.

21. The bondwire fault detection circuit of claim 14 , wherein the gate charge estimation circuit comprises a gate voltage comparator circuit configured to measure a voltage difference between a first gate voltage associated with a first switch of the plurality of switches and a second gate voltage associated with a second switch of the plurality of switches, during a turn-on phase or a turn-off phase of the switching circuit, wherein the measured volt

Assignees

• Infineon Technologies Ag

Inventors

• Meiser Andreas
• Koeppl Benno
• Nuebling Marcus
• Zannoth Markus
• Mayer Alexander

Classifications

• G01R31/2621 Primary

  for testing field effect transistors, i.e. FET's · CPC title

• G01R31/3272

  Apparatus, systems or circuits therefor (G01R31/3275 takes precedence) · CPC title

• G01R31/26

  Testing of individual semiconductor devices (testing of photovoltaic devices H02S50/10; testing or measuring during manufacture or treatment {H10P74/00}) · CPC title

• G01R31/2637

  for testing other individual devices (G01R31/2608 - G01R31/2632, G01R31/27 take precedence) · CPC title

• G01R31/54

  Testing for continuity · CPC title