Apparatus for controlling the exposure of a selective laser sintering or laser melting apparatus

Patent metadata

Field	Value
Publication number	US-10836103-B2
Application number	US-201816007813-A
Country	US
Kind code	B2
Filing date	Jun 13, 2018
Priority date	Nov 12, 2014
Publication date	Nov 17, 2020
Grant date	Nov 17, 2020

Abstract

A method for controlling the exposure of a selective laser sintering or laser melting apparatus. The method includes providing a selective laser sintering apparatus or laser melting apparatus that uses successive solidification of layers of a powder-type construction material that can be solidified using radiation. The apparatus comprises an irradiation device for irradiating layers of the construction material that has a plurality of scanners that can separately be actuated, simultaneously irradiating the construction material, the separate detection of irradiation times of each scanner and/or the irradiation areas detected by each scanner, and storing the detected irradiation times and/or irradiation areas; comparing the irradiation times and/or irradiation areas of the scanners with each other; re-determining the surface sections of a powder layer to be irradiated by each scanner so the irradiation times for each scanner are approximated to each other and/or the irradiation areas of each scanner are aligned.

First claim

The invention claimed is:

1. An apparatus for additively manufacturing three-dimensional objects, the apparatus comprising:
a first scanner configured to direct radiation to a first region of respective ones of a plurality of sequential layers of construction material to solidify construction material in the first region;
a second scanner configured to direct radiation to a second region of the respective ones of the plurality of sequential layers of construction material to solidify construction material in the second region; and
a processor, wherein the processor is configured to allocate irradiation of the respective ones of the plurality of the sequential layers of construction material between the first region and the second region based at least in part on a first irradiation time and/or a second irradiation time such that the first irradiation time and the second irradiation time are at least approximately the same, the first region being assigned the first scanner and the first irradiation time indicative of a time required for the first scanner to irradiate the first region with respect to at least one of the plurality of sequential layers of construction material, and the second region being assigned the second scanner and the second irradiation time indicative of a time required for the second scanner to irradiate the second region with respect to at least one of the plurality of sequential layers of construction material.

2. The apparatus of claim 1 , wherein the processor is configured to allocate irradiation of the respective ones of the plurality of sequential layers of construction material between the first region and the second region based at least in part on a first surface area of the first region and/or a second surface area of the second region such that the first surface area and the second surface area are at least approximately the same size.

3. The apparatus of claim 1 , wherein the processor is configured to allocate irradiation of one or more subsequent ones of the plurality of sequential layers of construction material between the first region and the second region based at least in part on a first irradiation time and/or a second irradiation time such that the first irradiation time and the second irradiation time are aligned with one another, the first irradiation time indicative of a time required for the first scanner to irradiate the first region with respect to one or more preceding ones of the plurality of sequential layers of construction material, and the second irradiation time indicative of a time required for the second scanner to irradiate the second region with respect to one or more preceding ones of the plurality of sequential layers of construction material.

4. The apparatus of claim 1 , comprising:
an electronic detection unit configured to determine the first irradiation time and/or the second irradiation time.

5. The apparatus of claim 4 , wherein the electronic detection unit comprises a sensor element or an optical switch.

6. The apparatus of claim 4 , comprising:
an electronic comparator configured to compare the first irradiation time with the second irradiation time.

7. The apparatus of claim 4 , wherein the processor is configured to re-allocate irradiation of at least one subsequent ones of the plurality of the sequential layers of construction material between the first region and the second region based at least in part on a comparison of the first irradiation time with the second irradiation time.

8. The apparatus of claim 7 , wherein the processor is configured to re-allocate irradiation of at least one subsequent ones of the plurality of the sequential layers of construction material between the first region and the second region, such that, for the at least one subsequent ones of the plurality of the sequential layers of construction material, the first irradiation time aligns with the second irradiation time and the first region and the second region have at least approximately the same surface area.

9. The apparatus of claim 1 , wherein the first region is located in an upper scanning field and the second region is located in the lower scanning field, and wherein a border delineates the first region from the second region and/or wherein the border delineates the upper scanning field from the lower scanning field.

10. The apparatus of claim 9 , wherein the processor is configured to dynamically adjust the border after irradiating respective ones of the plurality of sequential layers of construction material such that the first irradiation time and the second irradiation time are at least approximately the same for respective ones of the plurality of sequential layers of construction material.

11. The apparatus of claim 1 , wherein the processor is configured to allocate irradiation of the respective ones of the plurality of sequential layers of construction material between the first region and the second region based at least in part on readable control data from the first scanner and/or the second scanner.

12. The apparatus of claim 11 , wherein the processor is configured to allocate irradiation of the respective ones of the plurality of sequential layers of construction material between the first region and the second region at least in part by determining a location for a border that delineates the first region from the second region.

13. The apparatus of claim 12 , wherein the processor is configured to allocate irradiation of the respective ones of the plurality of sequential layers of construction material between the first region and the second region such that a first surface area of the first region and a second surface area of the second region are at least approximately the same size.

14. The apparatus of claim 12 , wherein the processor is configured to receive an input from an operator, the input from the operator configured to determine the location of the border.

15. The apparatus of claim 11 , wherein the processor is configured to adjust the location of the border in incremental steps.

16. The apparatus of claim 15 , wherein the border comprises a straight line.

17. The apparatus of claim 15 , wherein the processor is configured to oscillate a location of the border corresponding to sequential ones of the plurality of sequential layers of construction material.

18. The apparatus of claim 1 , wherein the processor is configured to cause the first scanner and/or the second scanner to perform a pre-exposure.

Assignees

• Cl Schutzrechtsverwaltungs Gmbh
• Concept Laser Gmbh

Inventors

• Herzog Frank
• Bechmann Florian
• Lippert Markus
• Windfelder Johanna

Classifications

• B22F12/90

  Means for process control, e.g. cameras or sensors · CPC title

• B22F12/49

  Scanners · CPC title

• B22F10/366

  Scanning parameters, e.g. hatch distance or scanning strategy · CPC title

• B22F10/28

  Powder bed fusion, e.g. selective laser melting [SLM] or electron beam melting [EBM] · CPC title

• Y02P10/25

  Process efficiency · CPC title