Methods and apparatus for sensing current through power semiconductor devices with reduced sensitivity to temperature and process variations
US-2017201251-A1 · Jul 13, 2017 · US
US10833500B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10833500-B2 |
| Application number | US-201815966557-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 30, 2018 |
| Priority date | Apr 30, 2018 |
| Publication date | Nov 10, 2020 |
| Grant date | Nov 10, 2020 |
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A circuit for measuring temperature of an external switch is disclosed. The circuit includes a variable resistor, a switch coupled to the variable resistor in series, a fixed value resistor coupled to the variable resistor and a comparator coupled between the variable resistor and the fixed value resistor. The circuit is configured to compare voltage drop between a drain and a source of the external switch when the external switch is in ON state with voltage drop at the variable resistor and output a signal to indicate an overtemperature based on the comparing.
Opening claim text (preview).
What is claimed is: 1. A circuit for measuring temperature of an external switch, the circuit comprising: a variable resistor; a switch coupled to the variable resistor in series; a fixed value resistor coupled to the variable resistor; and a comparator coupled between the variable resistor and the fixed value resistor; wherein the circuit is configured to compare voltage drop between a drain and a source of the external switch when the external switch is in ON state with voltage drop at the variable resistor and output a signal to indicate an overtemperature based on the comparing. 2. The circuit of claim 1 , wherein the switch is configured to be turned on only when the external switch is turned on. 3. The circuit of claim 2 , wherein the switch is configured to be turned on via a drive signal that drives a gate of the external switch. 4. The circuit of claim 3 , wherein the drive signal is coupled to the switch via a delay circuit. 5. The circuit of claim 4 , wherein the delay circuit is configured to introduce a predetermined delay based on saturation characteristics of the external switch. 6. The circuit of claim 1 , wherein the comparator is configured to maintain an output until voltage difference at the comparator's inputs reverses. 7. The circuit of claim 1 , wherein the variable resistor is configured to change a temperature threshold. 8. An integrated circuit, comprising: a port for receiving a drive signal for driving the switch; a port for outputting an overtemperature signal; a port for receiving an input from a drain of the external switch; a port for receiving an input from a source of the external switch a circuit for measuring temperature of an external switch, wherein the circuit includes: a variable resistor; a switch coupled to the variable resistor in series; a fixed value resistor coupled to the variable resistor; and a comparator coupled between the variable resistor and the fixed value resistor; wherein the circuit is configured to compare voltage drop between a drain and a source of the external switch when the external switch is in ON state with voltage drop at the variable resistor and output a signal to indicate an overtemperature based on the comparing.
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