Position-measuring device and system having a plurality of position-measuring devices
US-9200893-B2 · Dec 1, 2015 · US
US10831035B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10831035-B2 |
| Application number | US-201514919188-A |
| Country | US |
| Kind code | B2 |
| Filing date | Oct 21, 2015 |
| Priority date | Oct 23, 2014 |
| Publication date | Nov 10, 2020 |
| Grant date | Nov 10, 2020 |
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An optical encoder 10 comprising: a light source 11; a splitter 12 splits a light from the light source 11, a light receiving unit 16; a scale 13 is arranged on a light path and movable in a measurement direction, a grating being arranged on a main surface of the scale; and an offset diffraction grating 14 includes a plurality of diffraction gratings arranged in the optical path from the splitter 12 to the light receiving unit 16, the plurality of diffraction gratings diffracting the split lights with different phases, wherein, the plurality of diffraction gratings 13 in the offset diffraction grating 14 are arranged in one plane parallel to the main surface of the scale and are offset each other in an offset direction orthogonal to the measurement direction, the light receiving unit 16 includes a plurality of light-receiving elements 16-11 to 16-23 arranged in the offset direction.
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What is claimed is: 1. An optical encoder comprising: a light source; a splitter that splits a light from the light source, a light receiving unit; a scale that is arranged on a light path and movable in a measurement direction, a grating being arranged on a main surface of the scale; and an offset diffraction grating that includes a plurality of diffraction grating patterns arranged in the optical path from the splitter to the light receiving unit, each of the plurality of diffraction grating patterns comprising a plurality of diffraction gratings diffracting the split lights with different phases, wherein, the plurality of diffraction gratings in the offset diffraction grating patterns are arranged in one plane parallel to the main surface of the scale, and the plurality of diffraction grating patterns are offset each other in an offset direction orthogonal to the measurement direction, and the light receiving unit includes a plurality of light-receiving elements arranged in the offset direction. 2. The optical encoder according to claim 1 , wherein the splitter is a first non-polarization beam splitter, and the optical encoder comprises a second non-polarization beam splitter that is arranged in an optical path from the scale to the light receiving unit. 3. The optical encoder according to claim 2 , wherein the offset diffraction grating is arranged in an optical path from the scale to the second non-polarization beam splitter. 4. The optical encoder according to claim 2 , wherein the offset diffraction grating is arranged in an optical path from the first non-polarization beam splitter to the scale. 5. The optical encoder according to claim 1 , wherein the splitter is an index grating. 6. The optical encoder according to claim 5 , wherein the offset diffraction grating is arranged in an optical path from the scale to a site of the index grating that emits a light to the light receiving unit. 7. The optical encoder according to claim 5 , wherein the offset diffraction grating is arranged in an optical path from a site of the index grating on which the light from the light source is incident to the scale. 8. The optical encoder according to claim 5 , wherein the scale reflects a light. 9. The optical encoder according to claim 1 , wherein the light receiving unit includes a plurality of rows in which the plurality of the light receiving elements are arranged in the offset direction; and the plurality of diffraction gratings in the offset diffraction grating are offset each other in the offset direction parallel to the main surface of the scale.
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