Digital microscopy systems, methods and computer program products

Patent metadata

Field	Value
Publication number	US-10831013-B2
Application number	US-201414914329-A
Country	US
Kind code	B2
Filing date	Aug 26, 2014
Priority date	Aug 26, 2013
Publication date	Nov 10, 2020
Grant date	Nov 10, 2020

Abstract

Methods, systems and computer program products relating to digital microscopy are disclosed. A digital microscopy method may comprise capturing a plurality of overlapping images of a sample, wherein the capturing of at least one of the plurality of images is performed while the sample and a focal plane are in relative motion along an optical axis at a speed greater than zero; and processing the plurality of images using a reference criterion to determine a reference relative arrangement of the focal plane and the sample along the optical axis.

First claim

The invention claimed is:

1. A digital microscopy method for use with a microscope and a sample, comprising:
for a given microscope focusing field, receiving an estimated relative arrangement between a focal plane of the microscope and the sample, the estimated relative arrangement being an estimate of an optimum relative arrangement between the focal plane of the microscope and the sample at which to acquire investigative microscopic images of the sample; and
determining an optimum relative arrangement between the focal plane of the microscope and the sample at which to acquire investigative microscopic images of the sample, by:
capturing a plurality of overlapping images of the sample at the given microscope focusing field, while a relative arrangement between the sample and the focal plane of the microscope varies, the capturing of the plurality of overlapping images being performed by varying a rate of image capture by an imaging sensor of the microscope, as the relative arrangement between the sample and the focal plane varies, such as:
to provide an increased image capture density when a current relative arrangement between the focal plane of the microscope and the sample, along the optical axis, is closer to the estimated relative arrangement, and
to capture images, but to provide a decreased image capture density when the current relative arrangement between of the microscope the focal plane and the sample, along the optical axis, is farther from the estimated relative arrangement; and

analyzing the plurality of images.

2. The method of claim 1 , wherein varying the rate of image capture comprises increasing a rate of image capture to provide an increased rate when the current relative arrangement between the focal plane and the sample is a relative arrangement selected from the group consisting of: a relative arrangement corresponding to the estimated relative arrangement, and a relative arrangement in proximity to the estimated relative arrangement.

3. The method of claim 1 , wherein varying the rate of image capture comprises decreasing a rate of image capture to provide a decreased rate when the current relative arrangement between the focal plane and the sample corresponds to a relative arrangement other than the estimated relative arrangement.

4. The method of claim 1 , wherein varying the rate of image capture comprises increasing a rate between image capture before the current relative arrangement of the focal plane and the sample corresponds to the estimated relative arrangement and decreasing a rate of image capture after the current relative arrangement between the focal plane and the sample corresponds to the estimated relative arrangement.

5. The method of claim 1 , wherein varying the rate of image capture comprises increasing a rate between image capture as the current relative arrangement of the focal plane and the sample grows closer to the estimated relative arrangement and decreasing a rate of image capture as the current relative arrangement between the focal plane and the sample moves away from the estimated relative arrangement.

6. The method of claim 1 , wherein at least one of said plurality of images is captured while a speed of the relative motion is greater than 10 μm/s.

7. The method of claim 1 , wherein relative motion is implemented at least partly by modifying a focal length of a digital microscope that is used to perform the image capturing.

8. The method of claim 1 , wherein relative motion is implemented at least partly by moving a sample holder.

9. The method of claim 1 , wherein relative motion is implemented at least partly by moving an optical module or a part thereof.

10. The method of claim 1 , wherein determining the optimum relative arrangement between the focal plane and the sample along the optical axis to be used for one or more investigative images of the sample comprises identifying a relative arrangement between the focal plane and the sample along the optical axis at which there is a drop in image contrast relative to another relative arrangement between the focal plane and the sample along the optical axis.

11. The method of claim 1 , further comprising, based upon determining the optimum relative arrangement between the focal plane and the sample along the optical axis to be used for one or more investigative images of the sample, capturing at least one investigative image of the sample when a relative arrangement of the focal plane and the sample along the optical axis corresponds to the determined optimum relative arrangement.

12. The method according to claim 1 , wherein receiving the estimated relative arrangement between a focal plane of the microscope and the sample comprises receiving an estimated relative arrangement between a focal plane of the microscope and the sample based upon a relative arrangement between the focal plane of the microscope and the sample that has been determined for a microscope focusing field disposed in a vicinity of the given microscope focusing field.

13. The method according to claim 12 , wherein receiving the estimated relative arrangement between a focal plane of the microscope and the sample comprises receiving an estimated relative arrangement between a focal plane of the microscope and the sample based upon a relative arrangement between the focal plane of the microscope and the sample that has been determined for a microscope focusing field that is adjacent to the given microscope focusing field.

14. The method according to claim 12 , wherein receiving the estimated relative arrangement between a focal plane of the microscope and the sample comprises receiving an estimated relative arrangement between a focal plane of the microscope and the sample based upon a relative arrangement between the focal plane of the microscope and the sample that has been determined for a microscope focusing field that overlaps with the given microscope focusing field.

15. The method according to claim 11 , wherein capturing the at least one investigative image of the sample when the relative arrangement between the focal plane and the sample along the optical axis corresponds to the determined optimum relative arrangement comprises capturing at least one investigative image from an investigative imaging field that is larger than the given microscope focusing field, when the relative arrangement between the focal plane and the sample along the optical axis corresponds to the determined optimum relative arrangement.

16. A digital microscope system that includes a microscope, and is for use with a sample, comprising:
an imaging module configured:
for a given microscope focusing field, to receive an estimated relative arrangement between a focal plane of the microscope and the sample, the estimated relative arrangement being an estimate of an optimum relative arrangement between the focal plane of the microscope and the sample at which to acquire investigative microscopic images of the sample,
to capture a plurality of overlapping images of the sample at the given microscope focusing field, while a relative arrangement between the sample and the focal plane of the microscope varies, the capturing of the plurality of overlapping images being performed by varying a rate of image capture by an imaging sensor of the microscope, as the relative arrangement between the sample and the focal plane varies, such as:
to provide an increased image capture density when a current relative arrangement between the focal plane of the microscope and the sample, along the optical axis, is closer to the estimated relative arrangement, and
to capture

Assignees

• S D Sight Diagnostics Ltd

Inventors

• Yorav Raphael Noam
• Greenfield Yuval
• Pollak Joseph Joel
• Bilu Yonatan

Classifications

• G02B21/244

  using image analysis techniques · CPC title

• G02B7/38

  measured at different points on the optical axis {, e.g. focussing on two or more planes and comparing image data} · CPC title

• G02B21/26

  Stages; Adjusting means therefor · CPC title

• G02B21/367 Primary

  providing an output produced by processing a plurality of individual source images, e.g. image tiling, montage, composite images, depth sectioning, image comparison · CPC title

• G02B21/241

  Devices for focusing (focusing in general G02B7/28) · CPC title