Method for Directed Self-Assembly and Pattern Curing
US-2016042971-A1 · Feb 11, 2016 · US
US10830756B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10830756-B2 |
| Application number | US-201816122171-A |
| Country | US |
| Kind code | B2 |
| Filing date | Sep 5, 2018 |
| Priority date | Sep 22, 2017 |
| Publication date | Nov 10, 2020 |
| Grant date | Nov 10, 2020 |
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Methods of manufacturing well-controlled nanopores using directed self-assembly and methods of manufacturing free-standing membranes using selective etching are disclosed. In one aspect, one or more nanopores are formed by directed self-assembly with block co-polymers to shrink the critical dimension of a feature which is then transferred to a thin film. In another aspect, a method includes providing a substrate having a thin film over a highly etchable layer thereof, forming one or more nanopores through the thin film over the highly etchable layer, for example, by a pore diameter reduction process, and then selectively removing a portion of the highly etchable layer under the one or more nanopores to form a thin, free-standing membrane.
Opening claim text (preview).
What is claimed is: 1. A method for forming a substrate, comprising: providing a substrate having a thin film over a highly etchable layer thereof; forming one or more nanopores through the thin film over the highly etchable layer using a pore diameter reduction process; and selectively removing a portion of the highly etchable layer under the one or more nanopores to form a thin, free-standing membrane, wherein the pore diameter reduction process comprises: forming at least one first feature in the thin film; depositing a block co-polymer in the first feature, the block co-polymer comprising at least a first domain and a second domain; and etching the second domain. 2. A method for forming a substrate, comprising: providing a substrate having a thin film over a highly etchable layer thereof; forming one or more nanopores through the thin film over the highly etchable layer using a pore diameter reduction process; and selectively removing a portion of the highly etchable layer under the one or more nanopores to form a thin, free-standing membrane, wherein the pore diameter reduction process comprises: forming at least one first feature in the thin film; depositing a dielectric material over the at least one first feature; and etching a portion of the dielectric material over the at least one first feature. 3. The method of claim 2 , wherein the method further comprises: repeating the depositing the dielectric material and the etching the portion of the dielectric material until at least one nanopore is formed. 4. A method for forming a substrate, comprising: providing a substrate having a thin film over a highly etchable layer thereof; forming one or more nanopores through the thin film over the highly etchable layer using a pore diameter reduction process; and selectively removing a portion of the highly etchable layer under the one or more nanopores to form a thin, free-standing membrane, wherein the pore diameter reduction process comprises: forming at least one first feature in the thin film; oxidizing the substrate to form a dielectric material over the substrate to fill the at least one opening, the dielectric material having at least one seam formed therein; and exploiting the at least one seam to form at least one nanopore. 5. A method for forming a substrate, comprising: providing a substrate having a thin film over a highly etchable layer thereof; forming one or more nanopores through the thin film over the highly etchable layer using a pore diameter reduction process; selectively removing a portion of the highly etchable layer under the one or more nanopores to form a thin, free-standing membrane; depositing one or more additional layers over the thin film; and depositing a positive electrode and a negative electrode over the thin film. 6. A substrate, comprising: a first silicon layer; a dielectric layer disposed over the first silicon layer; a second silicon layer disposed over a portion of the dielectric layer; a free-standing membrane disposed over the second silicon layer, the free-standing membrane having at least one nanopore and at least one opening formed therethrough; a first well disposed below the at least one nanopore; and a second well disposed above the at least one nanopore. 7. The substrate of claim 6 , comprising: a DNA-containing fluid in at least one of the first well and the second well. 8. The substrate of claim 6 , wherein a diameter of each of the at least one nanopore is less than or equal to about 100 nanometers. 9. The substrate of claim 6 , wherein a thickness of the free-standing membrane is less than or equal to about 50 nanometers.
batch processes · CPC title
Holes · CPC title
Diaphragms, i.e. structures separating two media that can control the passage from one medium to another; Membranes, i.e. diaphragms with filtering function · CPC title
Investigating individual macromolecules, e.g. by translocation through nanopores (Coulter counters in general G01N15/12; fabrication methods for nanoscale apertures B81B1/00; sequencing of nucleic acids C12Q1/68) · CPC title
comprising flexible or deformable elements · CPC title
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