Self-test apparatuses having distributed self-test controller circuits and controller circuitry to control self-test execution based on self-test properties and method thereof

Patent metadata

Field	Value
Publication number	US-10816595-B2
Application number	US-201816165411-A
Country	US
Kind code	B2
Filing date	Oct 19, 2018
Priority date	Oct 19, 2018
Publication date	Oct 27, 2020
Grant date	Oct 27, 2020

Abstract

A self-test apparatus for use in an electronic system includes an inter-chip communication bus, a plurality of circuit devices, circuitry including memory, and test controller circuitry. The plurality of circuit devices each has a distributed self-test controller circuit and analog, mixed signal or digital circuit elements. The distributed self-test controller circuits are integrated communicatively via the inter-chip communication bus and negotiate a self-test protocol with each other. The circuitry including memory stores self-test properties of the circuit elements, the self-test properties corresponding to an identifier of each of the circuit elements and a manner or protocol in which the circuit elements are tested. The test controller circuitry collects the self-test properties of the circuit elements and controls execution of the self-test according to the negotiated self-test protocol and the self-test properties.

First claim

What is claimed is:

1. A self-test apparatus for use in an automotive electronic system, comprising:
an inter-chip communication bus;
a plurality of circuit devices each having a distributed self-test controller circuit and analog, mixed signal or digital circuit elements, the distributed self-test controller circuits being integrated communicatively via the inter-chip communication bus and configured and arranged to negotiate a self-test protocol with each other and to communicate with the circuit elements;
circuitry including memory configured to store self-test properties of the circuit elements, the self-test properties corresponding to an identifier (ID) of each of the circuit elements and a manner or protocol in which the circuit elements are tested; and
test controller circuitry configured and arranged to collect the self-test properties of the circuit elements and to control execution of the self-test according to the negotiated self-test protocol and the self-test properties, wherein the negotiated self-test protocol is initiated at different points of time of operating the automotive electronic system.

2. The self-test apparatus of claim 1 , wherein the circuit elements includes at least one of logic, a processor, a communication interface, an analog circuit, and controller circuitry, and the distributed self-test controller circuits are configured and arranged to identify and control testing resources used to test the circuit elements associated with the circuit devices during the execution of the self-test, and to monitor results of the self-test.

3. The self-test apparatus of claim 1 , wherein the circuitry including the memory and the test controller circuitry include the distributed self-test controller circuits of the plurality of circuit devices, each distributed self-test controller circuit being configured and arranged to collect and store self-test properties of circuit elements associated with the respective circuit device that the distributed self-test controller circuit forms part of.

4. The self-test apparatus of claim 1 , wherein the test controller circuitry is one of the distributed self-test controller circuits which is assigned as a primary distributed self-test controller circuit during the negotiation of the self-test protocol.

5. The self-test apparatus of claim 4 , wherein the test controller circuitry, which is assigned as the primary distributed self-test controller circuit, is further configured and arranged to execute the self-test according to the negotiated self-test protocol using the self-test properties of the circuit elements at both a board-level and a device-level of the automotive electronic system.

6. The self-test apparatus of claim 1 , wherein the elements include test objects and test instruments configured and arranged to store the self-test properties, and at least a portion of circuit elements are connected to at least one of a common voltage or current forcing bus and a common voltage or current sensing bus.

7. A self-test apparatus, comprising:
a plurality of distributed self-test controller circuits in respective circuit devices integrated communicatively and arranged to negotiate a self-test protocol with each other and to communicate with a plurality of analog, mixed signal (AMS) or digital circuit elements;
circuitry including memory configured to store self-test properties for each of the circuit elements corresponding to, respectively, each of the plurality of distributed self-test controller circuits and circuit devices, wherein the self-test properties correspond to an identifier (ID) of each of the circuit elements and a manner or protocol in which the circuit elements are tested by one or more of the distributed self-test controller circuits and a test controller circuitry; and
the test controller circuitry configured and arranged to collect the self-test properties of the plurality of circuit elements from each of the circuit devices and to control execution of the self-test according to the negotiated self-test protocol and the self-test properties, wherein the self-test protocol is initiated at different points of time and during a normal operation mode of the self-test apparatus.

8. The self-test apparatus of claim 7 , wherein the respective circuit devices each include a subset of the circuit elements and at least a portion of circuit elements are connected to at least one of a common voltage or current forcing bus and a common voltage or current sensing bus.

9. The self-test apparatus of claim 7 , wherein the self-test apparatus is configured and arranged to operate in a test configuration mode during which the self-test properties, including the IDs, of one or more of the circuit elements are assigned.

10. The self-test apparatus of claim 7 , wherein the circuitry including the memory configured and arranged to store the self-test properties includes a circuit on the test controller circuitry, the test controller circuitry being one of the respective distributed self-test controller circuits.

11. The self-test apparatus of claim 7 , wherein the circuitry including the memory configured and arranged to store the self-test properties includes the plurality of distributed self-test controller circuits, each respective distributed self-test controller circuit being configured and arranged to store self-test properties of respective circuit elements in one of the respective circuit devices, to store application status information, to communicate the self-test properties and application status information to the test controller circuitry via an inter-chip communication bus.

12. The self-test apparatus of claim 11 , wherein the circuitry including the memory configured and arranged to store the self-test properties includes a circuit on the test controller circuitry, the test controller circuitry being one of the respective circuit devices.

13. The self-test apparatus of claim 12 , wherein circuit on the test controller circuitry includes the distributed self-test controller circuit of the respective circuit device.

14. The self-test apparatus of claim 7 , wherein the circuit elements include test objects and test instruments configured and arranged to provide the self-test properties to the respective self-test controller circuit of the circuit devices that are associated with the circuit elements.

15. The self-test apparatus of claim 7 , wherein the plurality of distributed self-test controller circuits are configured and arranged to control testing resources used to test the respective circuit elements during the execution of the self-test, and to analyze results of the self-test.

16. A method involving a self-test apparatus, the method comprising:
negotiating a self-test protocol between a plurality of distributed self-test controller circuits in respective circuit devices integrated communicatively;
communicating self-test properties for each of a plurality of analog, mixed signal or digital circuit elements corresponding to, respectively, each of the plurality of distributed self-test controller circuits and circuit devices, wherein the self-test properties correspond to an identifier (ID) of each of the circuit elements and a manner or protocol in which the circuit elements are tested by one or more of the distributed self-test controller circuits and a test controller circuitry; and
collecting, by the test controller circuitry, the self-test properties of the circuit elements from each of the circuit devices and controlling execution of the self-test according to the negotiated self-test protocol and the self-test properties, wherein t

Assignees

• Nxp Usa Inc

Inventors

• Jin Xiankun
• Schat Jan-Peter
• Chen Tao
• Ma Lei

Classifications

• G01R31/2884 Primary

  using dedicated test connectors, test elements or test circuits on the IC under test (G01R31/2855 takes precedence) · CPC title

• G01R31/3187

  Built-in tests · CPC title

• G01R31/31907 Primary

  Modular tester, e.g. controlling and coordinating instruments in a bus based architecture · CPC title