Method for determining a temperature without contact, and infrared measuring system

Patent metadata

Field	Value
Publication number	US-10816404-B2
Application number	US-201716314359-A
Country	US
Kind code	B2
Filing date	Jun 14, 2017
Priority date	Jun 30, 2016
Publication date	Oct 27, 2020
Grant date	Oct 27, 2020

Abstract

A method for contactlessly establishing a temperature of a surface includes determining the temperature measurement values of the plurality of blind pixels and determining temperature measurement values of the plurality of measurement pixels. The method further includes determining a temperature measurement value and a temperature measurement values by subtracting the temperature measurement value of the first blind pixel of the plurality of blind pixels from a temperature measurement value of a second blind pixel of the plurality of blind. The method further includes correcting the temperature measurement values by pixel-associated temperature drift components in each case, wherein the temperature drift components are determined using the temperature measurement value and/or the temperature measurement value.

First claim

The invention claimed is:

1. A method for contactlessly establishing a temperature of a surface with an infrared measurement system comprising:
an infrared detector array with a detector array substrate;
at least one reference pixel, which is connected to the detector array substrate with a first thermal conductivity and which provides a reference signal for establishing temperature measurement values;
a plurality of measurement pixels, which are each connected to the detector array substrate with a second thermal conductivity, wherein the measurement pixels are sensitive to infrared radiation and each provide a measurement signal, wherein a temperature measurement value, which is dependent on an intensity of the incident infrared radiation, is established in each case from the difference between the measurement signal and the reference signal;
a plurality of blind pixels, which are each connected to the detector array substrate with a third thermal conductivity and which each provide a measurement signal, wherein a temperature measurement value is established in each case from the difference between the measurement signal and the reference signal;
the method comprising:
determining the temperature measurement values of a plurality of blind pixels;
determining the temperature measurement values of a plurality of measurement pixels;
the at least one reference pixel and the blind pixels are substantially insensitive to infrared radiation, wherein the first thermal conductivity and the third thermal conductivity are each greater than the second thermal conductivity;
temperature measurement values which are independent of the reference signal of the at least one reference pixel are determined by virtue of a temperature measurement value of a first measurement pixel and a temperature measurement value of a first blind pixel being subtracted from one another, wherein the temperature measurement value and the temperature measurement value are established using a reference signal of the same reference pixel;
temperature measurement values which are independent of the reference signal of the at least one reference pixel are determined by virtue of a temperature measurement value of a first blind pixel and a temperature measurement value of a second blind pixel being subtracted from one another, wherein the temperature measurement value and the temperature measurement value are established using a reference signal of the same reference pixel; and
temperature measurement values are corrected by pixel-associated temperature drift components in each case, wherein the temperature drift components are determined using temperature measurement values.

2. The method as claimed in claim 1 , characterized in that wherein a temperature drift behavior m BP of the blind pixels is determined from the temperature measurement values T BP of the blind pixels for the purposes of determining the temperature drift components T drift .

3. The method as claimed in claim 2 , wherein the temperature drift behavior of the blind pixels is determined as a constant of proportionality between initial measurement deviations of the blind pixels and temperature measurement values of the blind pixels for the purposes of determining the temperature drift components.

4. The method as claimed in claim 3 , wherein the temperature drift behavior of the blind pixels is determined as a constant of proportionality between sensitivities of the initial measurement deviations in relation to the influences of aging of the blind pixels and temperature measurement values of the blind pixels for the purposes of determining the temperature drift components.

5. The method as claimed in claim 2 , wherein a mathematical relationship is established between the temperature drift behavior of measurement pixels and a temperature drift behavior of blind pixels for the purposes of determining the temperature drift components and the temperature drift behavior of measurement pixels is determined from the mathematical relationship.

6. The method as claimed in claim 5 , wherein the temperature drift behavior of the measurement pixels is set equal to the temperature drift behavior of the blind pixels.

7. The method as claimed in claim 1 , wherein an incidence of infrared radiation onto the infrared detector array is suppressed at least intermittently by means of a closure mechanism of the infrared measurement system, during which time the temperature measurement values are determined.

8. The method as claimed in claim 7 , wherein a temperature drift behavior of the measurement pixels is determined from temperature measurement values for the purposes of determining the temperature drift components.

9. The method as claimed in claim 8 , wherein the temperature drift behavior of the measurement pixels is determined as a constant of proportionality between initial measurement deviations of the measurement pixels and temperature measurement values for the purposes of determining the temperature drift components.

10. The method as claimed in claim 8 , wherein the temperature drift behavior of the measurement pixels is determined as a constant of proportionality between sensitivities of the initial measurement deviations in relation to the influences of aging of the measurement pixels and temperature measurement values for the purposes of determining the temperature drift components.

11. The method as claimed in claim 5 , wherein the temperature drift components are determined from the temperature drift behavior of measurement pixels.

12. The method as claimed in claim 11 , wherein the temperature drift components are determined from the temperature drift behavior of the measurement pixels by virtue of the temperature drift components of the respective measurement pixels being calculated in the form of a function as a product of temperature drift behavior and initial measurement deviations of the respective measurement pixels.

13. The method as claimed in claim 11 , wherein the temperature drift components are determined from the temperature drift behavior of the measurement pixels by virtue of the temperature drift components of the respective measurement pixels being calculated in the form of a function as a product of the temperature drift behavior and the sensitivities of the initial measurement deviations in relation to the influences of aging of the respective measurement pixels.

14. The method as claimed in claim 1 , wherein the temperature drift components are determined repeatedly at time intervals, in particular regularly, preferably continuously or virtually continuously.

15. The method as claimed in claim 1 , wherein, in a further method step, an incidence of infrared radiation onto the infrared detector array is suppressed by means of a closure mechanism of the infrared measurement system and the temperature measurement values are each corrected by a pixel-dependent deviation from a mean value of all temperature measurement values measured in the case of a suppressed incidence of infrared radiation.

16. An infrared measurement system for contactlessly establishing a temperature distribution on a surface comprising:
an evaluation apparatus;
at least one infrared detector array with a detector array substrate
at least one reference pixel, which is connected to the detector array substrate with a first thermal conductivity and which provides a reference signal for establishing temperature measurement values;
a plurality of measurement pixels, which are each connected to the detector array substrate with a second thermal conductivity, wherein the measurement pixels

Assignees

• Bosch Gmbh Robert

Inventors

• Frank Michael
• Senz Volkmar
• Badeja Michael
• Rumberg Axel
• Krueger Michael
• Dittmer Helge

Classifications

• G01J5/0804

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• G01J5/0245

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• G01J5/023

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• G01J5/024

  Special manufacturing steps or sacrificial layers or layer structures · CPC title

• G01J5/10

  using electric radiation detectors · CPC title