Optical measurement systems and methods with custom chromatic aberration adjustments

US10813550B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10813550-B2
Application numberUS-201916249856-A
CountryUS
Kind codeB2
Filing dateJan 16, 2019
Priority dateOct 1, 2015
Publication dateOct 27, 2020
Grant dateOct 27, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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Abstract

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An optical measurement system method for measuring a characteristic of a subject's eye use a probe beam having an infrared wavelength in the infrared spectrum to measure a refraction of the subject's eye at the infrared wavelength; capture at least two different Purkinje images at two different corresponding wavelengths from at least one surface of the lens of the subject's eye; determine from the at least two different Purkinje images a value for at least one parameter of the subject's eye; use the value of the at least one parameter to determine a customized chromatic adjustment factor for the subject's eye; and correct the measured refraction of the subject's eye at the infrared wavelength with the customized chromatic adjustment factor to determine a refraction of the subject's eye at a visible wavelength in the visible spectrum.

First claim

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We claim: 1. A method, comprising: using a probe beam having a first infrared wavelength in the infrared spectrum to measure a refraction of an eye at the first infrared wavelength; capturing a first Purkinje image from a first surface of a lens of the eye at a first visible wavelength; capturing a second Purkinje image from the first surface of the lens at a second infrared wavelength; capturing a third Purkinje image from the first surface of the lens at a third infrared wavelength different from the second infrared wavelength; determining from the first, second, and third Purkinje images a value for a radius of curvature of the first surface of the lens; using the value for the radius of curvature of the first surface of the lens to determine a customized chromatic adjustment factor for the eye; and adjusting the measured refraction of the eye at the first infrared wavelength with the customized chromatic adjustment factor to determine a refraction of the eye at a second visible wavelength in the visible spectrum. 2. The method of claim 1 , wherein the first surface of the lens is an anterior surface of the lens, and wherein the first, second, and third Purkinje images are all Purkinje III images from the anterior surface of the lens. 3. The method of claim 1 , wherein the first surface of the lens is a posterior surface of the lens, and wherein the first, second, and third Purkinje images are all Purkinje IV images from the posterior surface of the lens. 4. The method of claim 1 , further comprising: employing an optical coherence tomographer to measure a thickness of the lens; and using the measured thickness of the lens and the radius of curvature of the first surface of the lens to determine the customized chromatic adjustment factor for the eye. 5. The method of claim 1 , wherein the second infrared wavelength and the first infrared wavelength are the same as each other. 6. The method of claim 1 , wherein the second infrared wavelength is shorter than the first infrared wavelength and the third infrared wavelength is longer than the first infrared wavelength. 7. The method of claim 1 , wherein using the value for the radius of curvature of the first surface of the lens to determine the customized chromatic adjustment factor for the eye includes performing ray tracing using an eye model including the radius of curvature of the first surface of the lens, wherein the value for the radius of curvature of the first surface of the lens is employed in the ray tracing. 8. The method of claim 1 , wherein using the value for the radius of curvature of the first surface of the lens to determine the customized chromatic adjustment factor for the eye includes solving a linear equation wherein at least one variable in the linear equation corresponds to the radius of curvature of the first surface of the lens, wherein solving the linear equation includes substituting the value for the at least one variable in the linear equation. 9. A system, including: an aberrometer comprising a light source configured to generate a probe beam having a first infrared wavelength in the infrared spectrum, the aberrometer being configured to measure a refraction of an eye at the first infrared wavelength; a light pattern generator configured to generate light patterns at two different wavelengths, including a second infrared wavelength in the infrared spectrum; an image detector configured to capture two different Purkinje images at the two different wavelengths from a first surface of a lens of the eye; and at least one processor, configured to: determine from the two different Purkinje images a value for a radius of curvature of the first surface of the lens, determine a customized chromatic adjustment factor for the subject's eye based at least in part on the radius of curvature of the first surface of the lens, and correct the measured refraction of the eye at the first infrared wavelength with the customized chromatic adjustment factor to determine a refraction of the subject's eye at a first visible wavelength in the visible spectrum. 10. The system of claim 9 , wherein the first surface of the lens is an anterior surface of the lens, and wherein the two different Purkinje images are two Purkinje III images from the anterior surface of the lens. 11. The system of claim 9 , wherein the first surface of the lens is a posterior surface of the lens, and the two different Purkinje images are two Purkinje IV images from the posterior surface of the lens. 12. The system of claim 9 , further comprising an optical coherence tomographer configured to measure a thickness of the lens of the eye, wherein the processor is further configured to determine the customized chromatic adjustment factor for the eye at least In part using the measured thickness of the lens. 13. The system of claim 9 , wherein one of the two different wavelengths is the first infrared wavelength. 14. The system of claim 13 , wherein the two different wavelengths are both in the infrared spectrum. 15. A method, comprising: using a probe beam having a first infrared wavelength in the infrared spectrum to measure a refraction of an eye at the first infrared wavelength; measuring a radius of curvature of a surface of a cornea of the eye; capturing two different Purkinje III images at two different wavelengths from an anterior surface of a lens of the eye; determining a change in an index of refraction of the cornea of the eye from the first infrared wavelength to a visible wavelength based on the measured radius of curvature and the two different Purkinje III images at the two different wavelengths; determining a customized chromatic adjustment factor for the eye from the change in the index of refraction of the cornea of the eye from the first infrared wavelength to the visible wavelength; and adjusting the measured refraction of the eye at the first infrared wavelength with the customized chromatic adjustment factor to determine a refraction of the eye at the visible wavelength in the visible spectrum. 16. The method of claim 15 , further comprising: capturing two different Purkinje IV images at the two different wavelengths from a posterior surface of the lens of the eye; determining a change in an index of refraction of the lens of the eye from the first infrared wavelength to the visible wavelength based on the two different Purkinje III images and the two different Purkinje IV images at the two different wavelengths, wherein the customized chromatic adjustment factor for the eye is further determined from the change in the index of refraction of the lens of the eye from the first infrared wavelength to the visible wavelength. 17. The method of claim 15 , further comprising employing an optical coherence tomographer to measure a thickness of the lens, wherein the customized chromatic adjustment factor for the eye is further determined from the measured thickness of the lens. 18. The method of claim 15 , wherein determining the customized chromatic adjustment factor for the eye from the change in the index of refraction of the cornea of the eye from the first infrared wavelength to the visible wavelength comprises performing ray tracing using an eye model including the index of refraction of the cornea. 19. The method of claim 15 , wherein determining the customized chromatic adjustment factor for the eye from the change in the index of refraction of the cornea of the eye from the first infrared wavelength to the visible wavelength comprises solving a linear equation

Assignees

Inventors

Classifications

  • A61B3/103Primary

    for determining refraction, e.g. refractometers, skiascopes · CPC title

  • Arrangement of plural eye-testing or -examining apparatus · CPC title

  • for examining the eye lens · CPC title

  • for determining the shape or measuring the curvature of the cornea · CPC title

  • for optical coherence tomography [OCT] · CPC title

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What does patent US10813550B2 cover?
An optical measurement system method for measuring a characteristic of a subject's eye use a probe beam having an infrared wavelength in the infrared spectrum to measure a refraction of the subject's eye at the infrared wavelength; capture at least two different Purkinje images at two different corresponding wavelengths from at least one surface of the lens of the subject's eye; determine from …
Who is the assignee on this patent?
Amo Dev Llc
What technology area does this patent fall under?
Primary CPC classification A61B3/103. Mapped technology areas include Human Necessities.
When was this patent published?
Publication date Tue Oct 27 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).