Self-test method, corresponding circuit and device

Patent metadata

Field	Value
Publication number	US-10809862-B2
Application number	US-201916523302-A
Country	US
Kind code	B2
Filing date	Jul 26, 2019
Priority date	Aug 9, 2018
Publication date	Oct 20, 2020
Grant date	Oct 20, 2020

Abstract

A touchscreen resistive sensor includes a network of resistive sensor branches coupled to a number of sensor nodes arranged at touch locations of the touchscreen. A test sequence is performed by sequentially applying to each sensor node a reference voltage level, jointly coupling to a common line the other nodes, sensing a voltage value at the common line, and declaring a short circuit condition as a result of the voltage value sensed at the common line reaching a short circuit threshold. A current value level flowing at the sensor node to which the reference voltage level is applied is sensed and a malfunction of the resistive sensor branch coupled with the sensor node to which a reference voltage level is applied is generated as a result of the current value sensed at the sensor node reaching an upper threshold or lower threshold.

First claim

What is claimed is:

1. A test method for a touchscreen resistive sensor that comprises a network of resistive sensor branches coupled to a number N of sensor nodes arranged at touch locations of the touchscreen, the method comprising:
performing a test sequence by sequentially applying a reference voltage level to each sensor node in the number N of sensor nodes;
jointly coupling other nodes in the number N of sensor nodes to a common line;
sensing a voltage value at the common line to which the other nodes in the number N of sensor nodes are jointly coupled;
determining a short circuit condition of the touchscreen resistive sensor as a result of the voltage value sensed at the common line reaching a short circuit threshold;
sensing a current level flowing at the sensor node in the number N of sensor nodes to which the reference voltage level is applied; and
determining a malfunctioning of the resistive sensor branch coupled with the sensor node in the number N of sensor nodes to which the reference voltage level is applied as a result of the current level sensed at the sensor node in the number N of sensor nodes to which the reference voltage level is applied reaching an upper threshold or a lower threshold.

2. The method of claim 1 , comprising repeating the test sequence and resetting the common line to a base voltage between subsequent repetitions of the test sequence.

3. The method of claim 1 , comprising generating the short circuit threshold as a function of the reference voltage level.

4. The method of claim 3 , comprising generating the short circuit threshold proportional to the reference voltage level as a function preferably via an inverse proportionality function, of the number N of sensor nodes.

5. The method of claim 4 , comprising generating the short circuit threshold inversely proportional to the reference voltage level as a function of the number N of sensor nodes.

6. The method of claim 1 , comprising generating the upper threshold or the lower threshold as a function of the reference voltage level.

7. The method of claim 6 , comprising generating the upper threshold proportional to the reference voltage level.

8. The method of claim 6 , comprising generating the lower threshold proportional to the reference voltage level.

9. The method of claim 6 , comprising generating the upper threshold and the lower threshold proportional to the reference voltage level.

10. A circuit configured to be coupled to a touchscreen resistive sensor that comprises a network of resistive sensor branches coupled to a number N of respective sensor nodes arranged at touch locations of the touchscreen, wherein the circuit comprises:
a source of a reference voltage level;
a set of switches configured to perform a test sequence by:
i) sequentially coupling the source of the reference voltage level to the sensor nodes in the number N of sensor nodes to sequentially apply the reference voltage level thereto; and
ii) jointly coupling the nodes in the number N of sensor nodes other than the sensor node in the number N of sensor nodes to a common line to which the reference voltage level is applied;

a first comparator circuit block coupled to the common line, the first comparator circuit block configured to compare a voltage sensed at the common line with a short circuit threshold and to generate a short circuit signal indicative of a short circuit condition of the touchscreen resistive sensor as a result of the voltage sensed at the common line reaching the short circuit threshold;
a current sensor circuit block coupled to the set of switches to sense a current level flowing at the sensor node in the number N of sensor nodes to which the reference voltage level is applied; and
a second comparator circuit block coupled to the current sensor circuit block, the second comparator circuit block configured to compare an upper threshold and a lower threshold with the current level sensed at the sensor node in the number N of sensor nodes to which the reference voltage level is applied and to generate a malfunction signal indicative of malfunctioning of the resistive sensor branch coupled with the sensor node in the number N of sensor nodes to which a reference voltage level is applied as a result of the current level sensed at the sensor node in the number N of sensor nodes to which the reference voltage level is applied reaching the upper threshold or the lower threshold.

11. The circuit of claim 10 , wherein the second comparator circuit block is configured to generate a first malfunction signal as a result of the current level sensed at the sensor node reaching the upper threshold and to generate a second malfunction signal as a result of the current level sensed at the sensor node reaching the lower threshold.

12. The circuit of claim 10 , comprising a reset switch configured to couple the common line to a base voltage between subsequent repetitions of the test sequence.

13. The circuit of claim 10 , further comprising a finite state machine configured to control the set of switches in performing the test sequence.

14. The circuit of claim 13 , wherein the finite state machine is coupled to the first and the second comparator circuit blocks and is sensitive to the short circuit and malfunctioning signals.

15. The circuit of claim 14 , wherein the finite state machine is configured to identify, as a function of the short circuit and malfunctioning signals, a resistive sensor branch in the network of resistive sensor branches affected by a short circuit or malfunctioning condition as a result of the short circuit or malfunctioning signal being issued with the reference voltage level applied to the respective sensor node in the number N of sensor nodes.

16. The circuit of claim 10 , wherein the first comparator circuit block ( 303 ) comprises:
a first input coupled to the common line; and
a second input coupled to the source of a reference voltage level via a voltage divider.

17. The circuit of claim 10 , wherein the second comparator circuit block comprises a window comparator arrangement comprising:
an upper threshold input and a lower threshold input coupled to the current sensor circuit block and configured to receive a value of the current level flowing at the sensor node in the number N of sensor nodes to which the reference voltage level is applied between the upper threshold input and the lower threshold input; and
a common input node coupled to the source of a reference voltage level via a voltage divider.

18. A device, comprising:
a touchscreen resistive sensor comprising a network of resistive sensor branches coupled to a number N of respective sensor nodes arranged at touch locations of the touchscreen; and
a circuit configured to generate an error signal upon determining an error condition, the circuit having a set of switches configured to perform a test sequence by:
sequentially coupling a reference voltage to the sensor nodes in the number N of sensor nodes to sequentially apply the reference voltage thereto; and
jointly coupling to a common line to the nodes in the number N of sensor nodes other than the sensor node in the number N of sensor nodes to which the reference voltage is applied.

19. The device of claim 18 , wherein the circuit further comprises:
a first comparator circuit block coupled to the common line, the first comparator circuit block configured to compare a voltage sensed at the common line with a short circuit threshold and to generate a short circuit signal indicative of a short circuit condition o

Assignees

• St Microelectronics Srl

Inventors

• Ippolito Calogero Marco
• Recchia Angelo
• Cicero Antonio
• Lombardo Pierpaolo
• Vaiana Michele

Classifications

• G06F2203/04102

  Flexible digitiser, i.e. constructional details for allowing the whole digitising part of a device to be flexed or rolled like a sheet of paper · CPC title

• G06F3/04144

  using an array of force sensing means (position sensing using the local deformation of sensor cells G06F3/0447) · CPC title

• H03K17/9647 Primary

  using a plurality of detectors, e.g. keyboard · CPC title

• G09G3/006

  Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays (testing individual LED's G01R31/2635; testing lamps G01R31/44; testing of optical features of LCD displays G02F1/1309) · CPC title

• G06F3/045 Primary

  using resistive elements, e.g. a single continuous surface or two parallel surfaces put in contact · CPC title