2H to 1T phase based transition metal dichalcogenide sensor for optical and electronic detection of strong electron donor chemical vapors

Patent metadata

Field	Value
Publication number	US-10801987-B2
Application number	US-201715652491-A
Country	US
Kind code	B2
Filing date	Jul 18, 2017
Priority date	Jul 19, 2016
Publication date	Oct 13, 2020
Grant date	Oct 13, 2020

Abstract

Optical and electronic detection of chemicals, and particularly strong electron-donors, by 2H to 1T phase-based transition metal dichalcogenide (TMD) films, detection apparatus incorporating the TMD films, methods for forming the detection apparatus, and detection systems and methods based on the TMD films are provided. The detection apparatus includes a 2H phase TMD film that transitions to the 1T phase under exposure to strong electron donors. After exposure, the phase state can be determined to assess whether all or a portion of the TMD has undergone a transition from the 2H phase to the 1T phase. Following detection, TMD films in the 1T phase can be converted back to the 2H phase, resulting in a reusable chemical sensor that is selective for strong electron donors.

First claim

What is claimed:

1. A method for detecting whether an unknown chemical vapor comprises a strong electron donor, comprising:
providing at least one sensor comprising a transition metal chalcogenide thin film comprising at least one region having a 2H phase;
exposing the at least one sensor to an unknown chemical vapor;
evaluating the transition metal chalcogenide thin film comprising at least one region having a 2H phase to determine whether the phase of the at least one region is 2H or 1T; and
detecting that the unknown chemical vapor comprises a strong electron donor if the phase of the at least one region of the transition metal chalcogenide thin film has changed from 2H to 1T.

2. The method of claim 1 , wherein the transition metal chalcogenide thin film is evaluated using Raman spectroscopy, photoluminescence spectroscopy, or electronic resistance measurement.

3. The method of claim 1 , wherein the strong electron donor is selected from the group consisting of TEA (triethylamine), TPA (tripropylamine), BuAm (butylamine), ammonia, arsines, acetone, acetonitrile, pyridine, DMMP (dimethyl methylphosphonate), TATP (triacetone triperoxide), DMSO (dimethylsulfoxide), VE (O-ethyl-S-[2-(diethylamino)ethyl]ethylphosphonothioate), VG (O,O-diethyl-S-[2-(diethylamino)ethyl]phosphorothioate), VM (O-ethyl-S-[2-(diethylamino)ethyl]methylphosphonothioate), VX (O-ethyl S-(2-diisopropylaminoethyl) methylphosphonothioate), TNT (2-methyl-1,3,5-trinitrobenzene), TEX (4,10-dinitro-2,6, 8,12-tetraoxa-4,10-diazatetracyclo[5.5.0.0 5,9 .0 3,11 ]-dodecane), HMX (octahydro-1,3,5,7-tetranitro-1,3,5,7-tetrazocine), CL-20 (2,4,6,8,10,12-Hexanitro-2,4,6,8,10,12-hexaazatetracyclo[5.5.0.0 3, 11 .0 5,9 ]dodecane), and RDX (1,3,5-trinitro-1,3,5-triazinane).

4. The method of claim 1 , further comprising transmitting a signal indicating that a strong electron donor is detected.

5. The method of claim 1 , further comprising annealing the at least one region of the transition metal chalcogenide thin film after the phase has changed from 2H to 1T, thereby returning the at least one region of the transition metal chalcogenide thin film to the 2H phase.

6. The method of claim 5 , wherein the annealing is carried out by a heating element provided in the sensor, a handheld heater, or an oven.

Assignees

• Us Gov Sec Navy

Inventors

• Friedman Adam L
• Perkins F Keith
• Culbertson James C
• Hanbicki Aubrey T
• Campbell Paul M

Classifications

• C01B19/04 Primary

  Binary compounds {including binary selenium-tellurium compounds (C01B19/004, C01B19/005, C01B19/007 take precedence)} · CPC title

• G01N27/125

  Composition of the body, e.g. the composition of its sensitive layer · CPC title

• G01N21/77

  by observing the effect on a chemical indicator · CPC title

• G01N21/783

  for analysing gases · CPC title

• C07C211/05

  Mono-, di- or tri-ethylamine · CPC title