Air data probe corrosion protection
US-12071684-B2 · Aug 27, 2024 · US
US10801105B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10801105-B2 |
| Application number | US-201615775856-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 18, 2016 |
| Priority date | Nov 24, 2015 |
| Publication date | Oct 13, 2020 |
| Grant date | Oct 13, 2020 |
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The present invention is in the field of processes for the generation of thin inorganic films on substrates, in particular atomic layer deposition processes. The present invention relates to a process comprising bringing a compound of general formula (I) into the gaseous or aerosol state and depositing the compound of general formula (I) from the gaseous or aerosol state onto a solid substrate, wherein R 1 , R 2 , R 3 , and R 4 are independent of each other an alkyl group, an aryl group or a trialkylsilyl group, M is Mn, Ni or Co, X is a ligand which coordinates M, wherein at least one X is a neutrally charged ligand, m is 1, 2 or 3 and n is at least 1 wherein the molecular weight of the compound of general formula (I) is up to 1000 g/mol.
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The invention claimed is: 1. A process, comprising: bringing a compound of formula (I) into a gaseous or aerosol state: and depositing the compound of formula (I) from the gaseous or aerosol state onto a solid substrate, wherein R 1 , R 2 , R 3 , and R 4 are each independently an alkyl group, an aryl group or a trialkylsilyl group, M is Mn, Ni or Co, each X is independently a neutrally charged ligand which coordinates M, m is 1, 2 or 3 and n is at least 1, and wherein a molecular weight of the compound of formula (I) is up to 1000 g/mol. 2. The process according to claim 1 , wherein n is at least 2. 3. The process according to claim 1 , wherein X and n are selected to adjust the number of valence electrons of M to an even number. 4. The process according to claim 1 , wherein R 1 , R 2 , R 3 , and R 4 are each independently methyl or ethyl. 5. The process according to claim 1 , wherein at least one X is a trialkylphosphine. 6. The process according to claim 1 , wherein at least one X is CO. 7. The process according to claim 1 , wherein M is Co and at least one X is NO. 8. The process according to claim 1 , wherein at least one X is a neutrally charged ligand which coordinates M via at least two neutral nitrogen atoms. 9. The process according to claim 1 , wherein at least one X is a neutrally charged ligand which coordinates M via a phosphor atom. 10. The process according to claim 1 , wherein the compound of formula (I) is chemisorbed on a surface of the solid substrate. 11. The process according to claim 1 , wherein a deposited compound of formula (I) is decomposed by removal of all ligands L and X. 12. The process according to claim 11 , wherein the deposited compound of formula (I) is exposed to a reducing agent. 13. The process according to claim 11 , wherein a sequence of depositing the compound of formula (I) onto the solid substrate and decomposing the deposited compound of formula (I) is performed at least twice. 14. A process for forming a film, comprising: forming the film with a compound of formula (I): on a solid substrate, wherein R 1 , R 2 , R 3 , and R 4 are each independently an alkyl group, an aryl group or a trialkylsilyl group, M is Mn, Ni or Co, each X is independently a neutrally charged ligand which coordinates M, m is 1, 2 or 3 and n is at least 1, and wherein a molecular weight of the compound of formula (I) is up to 1000 g/mol.
characterized by the use of precursors specially adapted for ALD · CPC title
characterised by the deposition of inorganic material, other than metallic material · CPC title
from metallo-organic compounds · CPC title
Cobalt compounds · CPC title
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