Sample holder for an X-ray fluorescence spectrometer, and sample holder manufacturing jig and method of producing a sample for an X-ray fluorescence spectrometer

Patent metadata

Field	Value
Publication number	US-10775324-B2
Application number	US-201816328178-A
Country	US
Kind code	B2
Filing date	Mar 9, 2018
Priority date	May 31, 2017
Publication date	Sep 15, 2020
Grant date	Sep 15, 2020

Abstract

Provided is a sample holder for an X-ray fluorescence spectrometer, which enables measurement of a liquid sample that is in a small amount and cannot be dropped and dried, when the measurement is performed with a tube-above optics X-ray fluorescence spectrometer. The sample holder for an X-ray fluorescence spectrometer includes: a first substrate including: a support substrate having a hole in which a liquid sample is placed; a first polymer film, which is bonded to a surface of the support substrate on an X-ray incident side so as to cover the hole; and an adhesive layer, which is provided on a back surface of the surface of the support substrate to which the first polymer film is bonded; and a second substrate including: a fixed substrate having a hole at a position corresponding to the hole of the support substrate; and a second polymer film, which is bonded to a surface of the fixed substrate on the X-ray incident side, the second substrate being bonded to the first substrate with the adhesive layer.

First claim

What is claimed is:

1. A sample holder for an X-ray fluorescence spectrometer, comprising:
a first substrate including:
a support substrate having a first hole in which a liquid sample is placed;
a first polymer film, which is bonded to a surface of the support substrate on an X-ray incident side so as to cover the first hole; and
an adhesive layer, which is provided on a back surface of the surface of the support substrate to which the first polymer film is bonded; and

a second substrate including:
a fixed substrate having a second hole at a position corresponding to the first hole of the support substrate; and
a second polymer film, which is bonded to a surface of the fixed substrate on the X-ray incident side so as to cover the second hole,

the second substrate being bonded to the first substrate with the adhesive layer.

2. The sample holder for an X-ray fluorescence spectrometer according to claim 1 , wherein the fixed substrate has flexibility.

3. The sample holder for an X-ray fluorescence spectrometer according to claim 2 , wherein the fixed substrate is thinner than the support substrate.

4. The sample holder for an X-ray fluorescence spectrometer according to claim 1 , wherein the adhesive layer configured to bond the first substrate and the second substrate to each other is formed of a laminate including a bonding agent, a third polymer film, and the bonding agent.

5. The sample holder for an X-ray fluorescence spectrometer according to claim 4 , wherein the third polymer film is made of a foam.

6. The sample holder for an X-ray fluorescence spectrometer according to claim 1 , wherein the X-ray fluorescence spectrometer comprises a tube-above optics X-ray fluorescence spectrometer.

7. The sample holder for an X-ray fluorescence spectrometer according to claim 1 , wherein the support substrate and the fixed substrate have different colors.

8. The sample holder for an X-ray fluorescence spectrometer according to claim 1 , wherein the first polymer film and the second polymer film are each made of one or more of a polypropylene, a polyester, and a polyimide.

9. A sample holder manufacturing jig, which is configured to manufacture the sample holder for an X-ray fluorescence spectrometer of claim 1 ,
the sample holder manufacturing jig comprising:
a flat plate portion, which has an outer shape in plan view conforming to a part of an outer shape of the first substrate, and on which the first substrate is mounted; and
a guide portion, which is configured to fix the first substrate, and is arranged so as to extend along an edge of a part corresponding to the outer shape and stand with respect to a surface of the flat plate portion on which the first substrate is mounted.

10. The sample holder manufacturing jig according to claim 9 , wherein the flat plate portion includes an indicator for indicating an outer edge of the first hole of the support substrate.

11. The sample holder manufacturing jig according to claim 9 , wherein the sample holder manufacturing jig is made of polyethylene terephthalate.

12. A method of producing a sample for an X-ray fluorescence spectrometer, comprising:
dropping a liquid sample onto a recessed portion defined by a first hole and a first polymer film of a first substrate, the recessed portion being a part of the first substrate, and the first substrate including a support substrate having the first hole, the first polymer film that is bonded to a surface of the support substrate on an X-ray incident side so as to cover the first hole, and an adhesive layer which is provided on a back surface of the surface of the support substrate to which the first polymer film is bonded; and
bonding a second substrate to the first substrate with the adhesive layer, the second substrate including a fixed substrate having a second hole at a position corresponding to the hole of the support substrate and a second polymer film that is bonded to a surface of the fixed substrate on the X-ray incident side so as to cover the second hole.

13. The method of producing a sample for an X-ray fluorescence spectrometer according to claim 12 , further comprising mounting the first substrate on a sample holder manufacturing jig,
the sample holder manufacturing jig including:
a flat plate portion, which has an outer shape in plan view conforming to a part of an outer shape of the first substrate, and on which the first substrate is mounted; and
a guide portion, which is configured to fix the first substrate, and is arranged so as to extend along an edge of a part corresponding to the outer shape and stand with respect to a surface of the flat plate portion on which the first substrate is mounted.

Assignees

• Rigaku Denki Co Ltd

Inventors

• Matsuda Wataru
• Inoue Minoru

Classifications

• G01N23/20025 Primary

  Sample holders or supports therefor · CPC title

• G01N2223/639

  material in a container · CPC title

• G01N2223/076

  X-ray fluorescence · CPC title

• G01N2223/637

  liquid · CPC title

• G01N23/223 Primary

  by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence · CPC title