Imaging devices for use with additive manufacturing systems and methods of monitoring and inspecting additive manufacturing components

Patent metadata

Field	Value
Publication number	US-10773336-B2
Application number	US-201815867112-A
Country	US
Kind code	B2
Filing date	Jan 10, 2018
Priority date	Jan 11, 2017
Publication date	Sep 15, 2020
Grant date	Sep 15, 2020

Abstract

An additive manufacturing system includes at least one imaging device configured to direct electromagnetic radiation towards a build layer of a component positioned within a powder bed of the additive manufacturing system. The additive manufacturing system also includes at least one detector configured to detect the electromagnetic radiation that reflects from the build layer.

First claim

What is claimed is:

1. An additive manufacturing system comprising:
at least one imaging device configured to direct electromagnetic radiation towards a build layer of a component positioned within a powder bed of the additive manufacturing system; and
a plurality of detectors configured to detect the electromagnetic radiation that reflects from the build layer, wherein each detector of said plurality of detectors is positioned at a different stationary location within said additive manufacturing system and at different angles in relation to the build layer.

2. The additive manufacturing system in accordance with claim 1 , wherein said at least one imaging device comprises at least one x-ray device and said plurality of detectors are configured to detect backscatter x-rays.

3. The additive manufacturing system in accordance with claim 1 , wherein said at least one imaging device and said plurality of detectors are positioned above the build layer and the powder bed.

4. A method of monitoring a component manufactured in an additive manufacturing system, said method comprising:
directing electromagnetic radiation from at least one imaging device towards a build layer of the component positioned within a powder bed of the additive manufacturing system; and
detecting by a plurality of detectors the electromagnetic radiation reflecting from the build layer, wherein each detector of the plurality of detectors is positioned at a different stationary location within the additive manufacturing system and at different angles in relation to the build layer.

5. The method in accordance with claim 4 further comprising identifying a feature within the build layer through a reflection angle of the electromagnetic radiation.

6. The method in accordance with claim 5 , wherein the feature within the build layer includes at least one of a void defined within the build layer, a crack defined within the build layer, and a porosity of the build layer.

7. The method in accordance with claim 5 further comprising determining at least one of a size and a depth of the feature within the build layer.

8. An imaging device for an additive manufacturing system, said imaging device comprising a flash infrared camera and a flash lamp, said flash infrared camera configured to image infrared radiation from a build layer of a component positioned within a powder bed of the additive manufacturing system, said flash lamp configured to direct light energy towards the build layer, wherein emitted infrared radiation identifies an internal insulating feature defined within the build layer.

9. The imaging device in accordance with claim 8 , wherein the internal insulating feature includes at least one of an air pocket defined within the build layer, a void defined within the build layer, and a crack defined within the build layer.

10. A method of monitoring a component manufactured in an additive manufacturing system, said method comprising:
directing light energy from a flash lamp towards a build layer of the component positioned within a powder bed of the additive manufacturing system; and
detecting, using a flash infrared camera infrared radiation emitted by the build layer.

11. The method in accordance with claim 10 further comprising identifying an internal insulating feature within the build layer through the emitted infrared radiation.

12. The method in accordance with claim 11 , wherein the internal insulating feature includes at least one of an air pocket defined within the build layer, a void defined within the build layer, and a crack defined within the build layer.

13. A x-ray system for use with additively manufactured components, said x-ray system comprising:
at least one imaging device configured to direct electromagnetic radiation towards the component, said at least one imaging device individually positionable about the component; and
at least one detector configured to detect the electromagnetic radiation directed from said at least one imaging device, said at least one detector individually positionable about the component and corresponding to a position of said at least one imaging device such that a localized predetermined area of the component is imaged.

14. The x-ray system in accordance with claim 13 , wherein said x-ray system is modular.

15. The x-ray system in accordance with claim 13 , wherein said x-ray system is coupled to an additive manufacturing system.

16. A method of inspecting a component manufactured in an additive manufacturing system, said method comprising:
positioning a x-ray system adjacent to the component such that a localized predetermined area of the component is imaged, wherein the x-ray system includes at least one imaging device and at least one detector;
individually positioning the at least one imaging device adjacent the component;
individually positioning the at least one detector adjacent the component, the at least one detector corresponding to the at least one imaging device;
directing electromagnetic radiation from the at least one imaging device towards the component; and
detecting by the at least one detector the electromagnetic radiation from the at least one imaging device.

17. The method in accordance with claim 16 further comprising positioning at least one of the at least one imaging device and the at least one detector inside of said component.

18. The method in accordance with claim 16 further comprising identifying a feature within the component, wherein the feature includes at least one of a void defined within the component, a crack defined within the component, and a porosity of the component.

19. The additive manufacturing system in accordance with claim 1 , wherein said plurality of detectors comprises a plurality of digital x-ray panels.

20. The x-ray system in accordance with claim 13 , wherein said at least one imaging device comprises a plurality of imaging devices, wherein said x-ray system further comprises a positioner coupled to each imaging device of said plurality of imaging devices, and wherein said positioner individually positions each imaging device about the component.

21. The method in accordance with claim 16 , wherein the at least one imaging device includes a plurality of imaging devices, wherein the x-ray system further includes a positioner coupled to each imaging device of the plurality of imaging devices, and wherein individually positioning the plurality of imaging devices adjacent the component comprises individually positioning each imaging device about the component using the positioner.

22. The imaging device in accordance with claim 8 , wherein said flash lamp is configured to direct light energy towards the build layer for up to a millisecond.

23. The method in accordance with claim 11 , wherein directing light energy from a flash lamp towards a build layer of the component positioned within a powder bed of the additive manufacturing system comprises directing light energy from a flash lamp towards a build layer of the component positioned within a powder bed of the additive manufacturing system for up to a millisecond.

Assignees

• Gen Electric

Inventors

• Harding Kevin George
• Ross William Robert
• Knight Bryon Edward
• Nalladega Venkata Vijayaraghava
• Bueno Clifford

Classifications

• B22F12/90

  Means for process control, e.g. cameras or sensors · CPC title

• B22F12/49

  Scanners · CPC title

• B22F12/45

  Two or more · CPC title

• B22F12/44

  characterised by the configuration of the radiation means · CPC title

• B22F10/38

  to achieve specific product aspects, e.g. surface smoothness, density, porosity or hollow structures · CPC title