Analyzing apparatus

Patent metadata

Field	Value
Publication number	US-10763094-B2
Application number	US-201415539413-A
Country	US
Kind code	B2
Filing date	Dec 25, 2014
Priority date	Dec 25, 2014
Publication date	Sep 1, 2020
Grant date	Sep 1, 2020

Abstract

For every acquisition of a set of mass spectrum data, a mass calibrator (determines the amount of mass discrepancy using the appearance position of a peak originating from an internal standard substance having a known m/z value, and performs a process for correcting the mass discrepancy. A mass calibration information collector (collects the amount of mass discrepancy or mass correction quantity for each set of mass spectrum data. After the completion of the measurement, a three-dimensional display information creator creates a three-dimensional graph showing the large number of collected mass correction quantities plotted in a three-dimensional space in which the retention time in a primary column and the retention time in a secondary column in a comprehensive two-dimensional LC unit are represented by two mutually orthogonal axes while the mass correction quantity is represented by the axis orthogonal to those two axes.

First claim

The invention claimed is:

1. An analyzing device configured to obtain, for one sample, signal intensity values as analysis data by performing an analysis on each of micro areas on an N-dimensional space which is either a virtual space or a real space (where N is an integer equal to or greater than two), comprising:
a) an error information collector configured to collect, during an execution of an analysis at each of the micro areas, an error quantity for each micro area related to an analysis or correction information for each micro area for correcting the error quantity; and
b) a graph creator configured to create a graph showing a distribution of the error quantity based on the error quantity or correction information at each micro area collected by the error information collector, within an N+1 dimensional space formed by adding an axis representing the error quantity or correction information to N axes forming the N-dimensional space, and configured to display the graph on a screen of a display unit.

2. The analyzing device according to claim 1 , wherein: the analysis data at each micro area are data obtained by a comprehensive two-dimensional gas chromatograph or comprehensive two-dimensional liquid chromatograph using a mass spectrometer as a detector; two axes of a two-dimensional space with N having a value of 2 both represent retention times; and a third axis represents a discrepancy in mass-to-charge ratio or correction information for correcting the discrepancy.

3. The analyzing device according to claim 1 , wherein: the analysis data at each micro area are data obtained by a comprehensive two-dimensional gas chromatograph or comprehensive two-dimensional liquid chromatograph using a mass spectrometer as a detector; two axes of a two-dimensional space with N having a value of 2 both represent retention times; and a third axis represents a discrepancy in retention time or correction information for correcting the discrepancy.

4. The analyzing device according to claim 1 , wherein: the analysis data at each micro area are data obtained by an imaging mass spectrometer; two axes of a two-dimensional space with N having a value of 2 are position information in different directions on a sample; and a third axis represent a discrepancy in mass-to-charge ratio or correction information for correcting the discrepancy.

5. An analyzing device configured to obtain, for a sample, signal intensity values as data by performing an analysis on each of micro areas on an N-dimensional space which is either a virtual space or a real space (where N is an integer equal to or greater than two), comprising:
a) a difference information acquirer configured to calculate, for a plurality of samples or for a plurality of components in one sample, difference information for each of the micro areas, the difference information showing a difference in the signal intensity value obtained by the analysis at each of the micro areas or a difference in a physical quantity or statistical quantity obtained from the signal intensity values by a predetermined computation; and
b) a graph creator configured to create a graph showing a distribution of the difference in the signal intensity value or the difference in the physical quantity or statistical quantity based on the difference information calculated for each micro area by the difference information acquirer, within an N+1 dimensional space formed by adding an axis representing the difference information to N axes forming the N-dimensional space, and configured to display the graph on a screen of a display unit.

Assignees

• Shimadzu Corp

Inventors

• Yamaguchi Shinichi
• Umemura Yoshikatsu
• Ikegami Masahiro
• Tanaka Koji

Classifications

• G01N30/8658

  Optimising operation parameters · CPC title

• H01J49/0004

  Imaging particle spectrometry · CPC title

• G01N30/8651

  Recording, data aquisition, archiving and storage · CPC title

• H01J49/0036 Primary

  Step by step routines describing the handling of the data generated during a measurement · CPC title

• G01N30/72

  Mass spectrometers {(mass spectrometers per se H01J49/00)} · CPC title