X-ray phase contrast and dark-field information extraction with electric fringe scanning and/or active pixel processing

Patent metadata

Field	Value
Publication number	US-10729397-B2
Application number	US-201615741026-A
Country	US
Kind code	B2
Filing date	Jul 20, 2016
Priority date	Jul 20, 2015
Publication date	Aug 4, 2020
Grant date	Aug 4, 2020

Abstract

Novel and advantageous systems and methods for performing X-ray imaging by extracting X-ray phase-shift and/or dark-field information through a detector that has built-in G2 functionality are provided. Grating translation can be replaced by an electrical operation in the detection procedure, thereby eliminating the need for the analyzer grating and the typical mechanical stepping process.

First claim

What is claimed is:

1. An imaging system, comprising:
an X-ray radiation source; and
a detector for detecting X-ray radiation from the radiation source, wherein the detector comprises a semiconductor material and at least one electrode attached to the semiconductor material for providing an electric field;
wherein the at least one electrode of the detector provides an electric field that steers electron-hole pairs horizontally in the semiconductor material of the detector.

2. The system according to claim 1 , further comprising a phase grating positioned between the radiation source and the detector, and a source grating positioned between the radiation source and the phase grating,
wherein the system is configured such that a subject to be imaged is positioned between the source grating and the phase grating.

3. The system according to claim 1 , wherein the detector comprises a plurality of detector pixels, each comprising the semiconductor material of the detector, and wherein each pixel comprises at least one electrode attached to the semiconductor material.

4. The system according to claim 3 , wherein each detector pixel further comprises an arithmetic unit connected to the at least one electrode,
wherein each detector pixel further comprises an amplifier connected to the at least one electrode, and
wherein each detector pixel further comprises an ADC connected to the at least one electrode.

5. The system according to claim 1 , wherein the detector further comprises an arithmetic unit connected to the at least one electrode,
wherein the detector further comprises an amplifier connected to the at least one electrode, and
wherein the detector further comprises an analog-to-digital converter (ADC) connected to the at least one electrode.

6. The system according to claim 1 , wherein the detector comprises a plurality of electrodes attached to the semiconductor material, and wherein the detector further comprises a plurality of amplifiers respectively connected to the plurality of electrodes.

7. The system according to claim 1 , wherein the at least one electrode of the detector provides a homogenous electric field in the semiconductor material of the detector.

8. The system according to claim 1 , wherein the detector comprises a plurality of electrodes, and wherein the electric field is added across 45% or less of the electrodes of the detector.

9. The system according to claim 1 , wherein each electrode present is a micro-electrode, and
wherein a length of each micro-electrode is half of a grating period of an analyzer grating whose functionality is incorporated into the detector.

10. The system according to claim 1 , wherein the detector is a photon-counting detector, such that spectral information is included in data of the detector.

11. A method of imaging using the system according to claim 1 , the method comprising:
providing X-ray radiation to a sample to be imaged using the X-ray radiation source;
collecting the X-ray radiation with the detector; and
analyzing data from the detector to obtain an image.

12. The method according to claim 11 , further comprising modulating the electric field provided by the at least one electrode attached to the semiconductor material of the detector, and
wherein modulating the electric field comprises increasing or decreasing the voltage of the electric field from a zero voltage to a positive or negative voltage.

13. The method according to claim 12 , further comprising detecting differently-shifted moiré-fringe patterns at a plurality of time intervals while the electric field is modulated, thereby resulting in a recorded intensity measure as a function of voltage, and
wherein the recorded intensity measure as a function of voltage is periodic with a period that is the same as a grating period of an analyzer grating whose functionality is incorporated into the detector.

14. The method according to claim 11 , wherein analyzing data from the detector to obtain an image comprises extracting X-ray diffraction fringes, phase-shift information, and dark-field information from the data from the detector.

15. The method according to claim 11 , wherein the detector comprises a plurality of detector pixels, and wherein analyzing data from the detector to obtain an image comprises using the recorded image intensity measure I(m,n,x v ) at a given view angle to extract transmission, differential phase shift, and dark-field signals, respectively, where I(m,n,x v ) is represented by the following Fourier series:
I ( m,n,x v )≈ a 0 ( m,n )+ a 1 ( m,n )cos( kx v +φ( m,n )), and

wherein a phase angle φ(m,n) is directly related to a local gradient of a phase shift

∂

Φ
⁡

(

m
,
n

)

∂
x

,

where Φ(m,n) represents the phase shift of a wave front.

16. The method according to claim 11 , wherein the detector is a photon-counting detector, such that spectral information is included in data of the detector.

17. An imaging system, comprising:
an X-ray radiation source; and
a detector for detecting X-ray radiation from the radiation source, wherein the detector comprises a semiconductor material and a plurality of electrodes attached to the semiconductor material for providing an electric field;
wherein the electric field is added across 45% or less of the electrodes of the detector.

18. The system according to claim 17 , wherein the detector further comprises an arithmetic unit connected to the at least one electrode,
wherein the detector further comprises an amplifier connected to the at least one electrode, and
wherein the detector further comprises an analog-to-digital converter (ADC) connected to the at least one electrode.

19. The system according to claim 17 , wherein the detector comprises a plurality of detector pixels, each comprising the semiconductor material of the detector, and wherein each pixel comprises at least one electrode attached to the semiconductor material.

20. The system according to claim 19 , wherein each detector pixel further comprises an arithmetic unit connected to the at least one electrode,
wherein each detector pixel further comprises an amplifier connected to the at least one electrode, and
wherein each detector pixel further comprises an ADC connected to the at least one electrode.

Assignees

• Rensselaer Polytech Inst
• Univ Of Central Florida
• Rensselaer Polutechnic Inst

Inventors

• Wang Ge
• Cong Wenxiang
• Shi Zaifeng
• Pang Shuo

Classifications

• A61B6/032

  Transmission computed tomography [CT] · CPC title

• A61B6/4035

  the source being combined with a filter or grating · CPC title

• A61B6/4291

  the detector being combined with a grid or grating · CPC title

• A61B6/484 Primary

  involving phase contrast X-ray imaging · CPC title