Distance measuring device, water level measurement system, and distance measurement method

US10725165B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10725165-B2
Application numberUS-201815913979-A
CountryUS
Kind codeB2
Filing dateMar 7, 2018
Priority dateMar 13, 2017
Publication dateJul 28, 2020
Grant dateJul 28, 2020

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Abstract

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A distance measuring device includes one or more processors configured to: detect a wave formed by synthesizing a frequency-swept electromagnetic wave transmitted to an object with a wave reflected on the object; measure, based on the synthesized wave, a distance to the object; calculate a displacement-caused inclination, caused by the displacement of the object, of a power spectrum of the synthesized wave; and measure the distance based on a signal in which the displacement-caused inclination has been removed from the power spectrum.

First claim

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What is claimed is: 1. A distance measuring device comprising: one or more processors configured to: transmit a frequency swept electromagnetic wave to an object; detect a reflected wave reflected on a surface of the object; obtain a synthesized wave by synthesizing the frequency swept electromagnetic wave and the reflected wave for calculating, based on the synthesized wave, a distance to the object; calculate a power spectrum inclination of the synthesized electromagnetic wave caused the displacement of the object; and calculate the distance based on removing the displacement-caused inclination from the power spectrum. 2. The distance measuring device according to claim 1 , wherein the one or more processors is configured to calculate a regression line, corresponding to the displacement-caused inclination, of the power spectrum of the synthesized wave. 3. The distance measuring device according to claim 1 , further comprising: an orthogonal wave detector configured to separate the synthesized wave into real-part data and imaginary-part data, wherein the one or more processors is configured to calculate a real-part inclination corresponding to the real-part data and an imaginary-part inclination corresponding to the imaginary-part data. 4. The distance measuring device according to claim 1 , wherein the one or more processors are configured to calculate, based on Equation A provided below, a displacement component (V), corresponding to the displacement-caused inclination, of the power spectrum in a real-part region of the synthesized wave and calculate, based on Equation B provided below, a displacement component (V), corresponding to the displacement-caused inclination, of the power spectrum in an imaginary-part region of the synthesized wave, while V = 2 ⁢ A 2 ⁢ sin ⁡ ( 4 ⁢ ⁢ π ⁢ ⁢ fd 0 c - ϕ ) · 4 ⁢ ⁢ π ⁢ ⁢ f 0 ⁢ B c ⁢ t , and Equation ⁢ ⁢ A V = 2 ⁢ A 2 ⁢ cos ⁡ ( 4 ⁢ ⁢ π ⁢ ⁢ fd 0 c - ϕ ) · 4 ⁢ ⁢ π ⁢ ⁢ f 0 ⁢ B c ⁢ t , Equation ⁢ ⁢ B where (A) is an amplitude level of the transmitted wave, (f) is the frequency of the transmitted wave, (d 0 ) is a central value of the distance, (c) is the speed of light, (ϕ) is the amount of a change in the phase due to the reflection, (f 0 ) is a central frequency of the transmitted wave, (B) is a velocity coefficient that gives the displacement Δd of the obje

Assignees

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Classifications

  • G01F23/284Primary

    Electromagnetic waves · CPC title

  • containing circuits handling parameters other than liquid level · CPC title

  • G01S13/34Primary

    using transmission of continuous, frequency-modulated waves while heterodyning the received signal, or a signal derived therefrom, with a locally-generated signal related to the contemporaneously transmitted signal · CPC title

  • Antenna boresight · CPC title

  • Radar or analogous systems specially adapted for specific applications (electromagnetic prospecting or detecting of objects, e.g. near-field detection, G01V3/00) · CPC title

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What does patent US10725165B2 cover?
A distance measuring device includes one or more processors configured to: detect a wave formed by synthesizing a frequency-swept electromagnetic wave transmitted to an object with a wave reflected on the object; measure, based on the synthesized wave, a distance to the object; calculate a displacement-caused inclination, caused by the displacement of the object, of a power spectrum of the synt…
Who is the assignee on this patent?
Fujitsu Ltd
What technology area does this patent fall under?
Primary CPC classification G01F23/284. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jul 28 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).