Measurement device and material tester

Patent metadata

Field	Value
Publication number	US-10697872-B2
Application number	US-201616061837-A
Country	US
Kind code	B2
Filing date	Feb 24, 2016
Priority date	Feb 24, 2016
Publication date	Jun 30, 2020
Grant date	Jun 30, 2020

Abstract

Once a sensor amplifier side connector of a cable unit for interconnecting a detector and a sensor amplifier is connected to the sensor amplifier, a gain resistor on the cable unit side and an instrumentation amplifier of the sensor amplifier are interconnected and the gain of the instrumentation amplifier is determined. As a result, the gain of the instrumentation amplifier is determined such that the magnitude of a signal that the sensor amplifier receives from the detector becomes a magnitude optimal for an analog circuit in the sensor amplifier.

First claim

The invention claimed is:

1. A measuring device comprising:
a detector converting a change in physical quantity generated in a measurement object into an electric signal and outputting the electric signal;
a sensor amplifier to which the output signal of the detector is input;
and
a cable unit connecting the detector and the sensor amplifier to each other,
wherein the cable unit includes a nonvolatile memory storing information on the detector and a resistor determining a gain of an instrumentation amplifier inside the sensor amplifier to a gain depending on the information on the detector.

2. The measuring device according to claim 1 , wherein the cable unit includes:
an electrical calibration circuit having a calibration bridge and a calibration resistance;
a switch switching a state of the signal input from the detector to the instrumentation amplifier; and
a switch switching a state of connection between the electrical calibration circuit and the instrumentation amplifier.

3. A material testing machine performing material testing, comprising a load mechanism giving a test force to a test piece, and the measuring device according to claim 1 .

4. The material testing machine according to claim 3 , wherein the measuring device is a measuring device including a load cell detecting the test force given to the test piece or a measuring device including a displacement meter detecting displacement generated in the test piece.

5. A material testing machine performing material testing, provided with a load mechanism giving a test force to a test piece, and provided with the measuring device according to claim 2 .

6. The material testing machine according to claim 5 , wherein the measuring device is a measuring device including a load cell detecting the test force given to the test piece or a measuring device including a displacement meter detecting displacement generated in the test piece.

Assignees

• Shimadzu Corp

Inventors

• Tsuji Hiroshi

Classifications

• G01N3/066 Primary

  with electrical indicating or recording means · CPC title

• G01N3/08 Primary

  by applying steady tensile or compressive forces (G01N3/28 takes precedence) · CPC title

• H03F2200/261

  Amplifier which being suitable for instrumentation applications · CPC title

• G01B7/16

  for measuring the deformation in a solid, e.g. by resistance strain gauge · CPC title

• G01N3/06

  Special adaptations of indicating or recording means · CPC title