Measurement system and temperature and/or shape change sensor using brillouin scattering analysis

US10697807B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10697807-B2
Application numberUS-201615762355-A
CountryUS
Kind codeB2
Filing dateSep 21, 2016
Priority dateSep 22, 2015
Publication dateJun 30, 2020
Grant dateJun 30, 2020

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A measurement system for performing measurement by Brillouin scattering analysis, the system comprising a laser emitter device ( 10 ) configured to emit an incident wave (ν 0 ) and a reference wave (ν 0 −νB), the incident wave presenting an incident frequency (ν 0 ) and the reference wave presenting a reference frequency (ν 0 −νB), the reference frequency (ν 0 −νB) being shifted from the incident frequency (ν 0 ) by a predetermined value (νB). The system is configured to: project the incident wave (ν 0 ) into the optical fiber ( 25 ); receive in return a backscattered wave (ν 0 −νS); generate a composite wave (ν 0 -S, 0 -B) combining the backscattered wave (ν 0 −νS) and the reference wave (S 0 −νB); and determine at least one property relating to the fiber by analyzing a Brillouin spectrum of the composite wave (ν 0 -S, 0 -B). Advantageously, the incident wave and the reference wave come from a dual-frequency vertical-cavity surface-emitting laser source ( 12 ) forming part of the laser emitter device.

First claim

Opening claim text (preview).

The invention claimed is: 1. A measurement system that performs measurement by Brillouin scattering analysis, the system comprising: a laser emitter device configured to emit an incident wave and a reference wave, the incident wave presenting an incident frequency and the reference wave presenting a reference frequency, the reference frequency being shifted from the incident frequency by a predetermined value; and a first optical mixer; the system being configured to be connected to at least a first end of an optical fiber: to project the incident wave into said first end of the fiber, with the first optical mixer being placed on a path of the incident wave between the laser emitter device and the first end of the optical fiber; to receive in return a backscattered wave at the first end of the fiber; to generate a composite wave combining at least the backscattered wave and the reference wave; the measurement system further including: an optical detector arranged on a path of the composite wave so as to collect the composite wave, and a frequency analyzer configured to determine at least one property relating to the fiber by analyzing a Brillouin spectrum of the composite wave; the system further including a dual-frequency vertical-cavity surface-emitting laser source forming part of the laser emitter device and configured to emit the incident wave and the reference wave. 2. A measurement system according to claim 1 , wherein the wavelength of the incident wave lies in the range 1.3 μm to 1.8 μm. 3. A measurement system according to claim 1 , wherein the first optical mixer is an optical circulator or an optical fiber coupler. 4. A measurement system according to claim 1 , configured to project a wave solely into the first end of the fiber. 5. A measurement system according to claim 1 , configured to project a wave into the fiber only at the first end thereof, and further including a second optical mixer configured to receive as input respectively the composite wave and the reference wave, and to deliver as output a signal constituted by superposing those two waves. 6. A measurement system according to claim 1 , configured to project a wave solely into the first end of the fiber, and further comprising a polarization controller or polarization scrambler interposed between the laser emitter device and the first optical mixer. 7. A measurement system according to claim 1 , further configured also to project a wave into the second end of the fiber. 8. A measurement system according to claim 7 , further comprising two polarization controllers interposed respectively on the path of the incident wave between the laser emitter device and the first optical mixer, and on the path of the reference wave between the laser emitter device and the second end of the fiber. 9. A sensor for sensing at least one of a temperature and a deformation, the sensor comprising at least one measurement system according to claim 1 , and at least one optical fiber to which said system is connected, said at least one property determined by the system comprising at least one of a temperature and a deformation of a portion of the fiber. 10. A method of using the sensor according to claim 9 comprising measuring a temperature or a deformation of a structure on or in which the optical fiber is arranged.

Assignees

Inventors

Classifications

  • using Brillouin scattering · CPC title

  • in a single cavity · CPC title

  • the material being an optical fibre · CPC title

  • using changes in transmittance, scattering or luminescence in optical fibres · CPC title

  • Optical pumping · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10697807B2 cover?
A measurement system for performing measurement by Brillouin scattering analysis, the system comprising a laser emitter device ( 10 ) configured to emit an incident wave (ν 0 ) and a reference wave (ν 0 −νB), the incident wave presenting an incident frequency (ν 0 ) and the reference wave presenting a reference frequency (ν 0 −νB), the reference frequency (ν 0 −νB) being shifted from the incide…
Who is the assignee on this patent?
Institut Francais Des Sciences Et Technologies Des Transp De Lamenagement Et Des Reseaux, Centre Nat Rech Scient
What technology area does this patent fall under?
Primary CPC classification G01D5/35364. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 30 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).