Preamble defect detection and mitigation

Patent metadata

Field	Value
Publication number	US-10694007-B1
Application number	US-201916372225-A
Country	US
Kind code	B1
Filing date	Apr 1, 2019
Priority date	Nov 22, 2016
Publication date	Jun 23, 2020
Grant date	Jun 23, 2020

Abstract

Systems and methods are disclosed for detection and mitigation of defects within a preamble portion of a signal, such as a data sector preamble recorded to a data storage medium. In certain embodiments, an apparatus may comprise a circuit configured to synchronize a sampling phase for sampling a signal pattern. The circuit may sample a preamble field of the signal pattern to obtain sample values, split the sample values into a plurality of groups, determine defect groups having samples corresponding to defects in the preamble field, remove the defect groups from the plurality of groups, and synchronize the sampling phase based on the plurality of groups.

First claim

What is claimed is:

1. An apparatus comprising:
a circuit configured to:
synchronize a sampling phase for sampling a signal pattern, including:
sample a preamble field of the signal pattern to obtain sample values;
split the sample values into a plurality of groups, each group of the plurality of groups including consecutively-obtained samples;
determine defect groups from the plurality of groups having samples corresponding to defects in the preamble field;
remove the defect groups from the plurality of groups; and
synchronize the sampling phase based on the plurality of groups.

2. The apparatus of claim 1 further comprising:
synchronizing the sampling phase includes:
determine a sampling phase estimate based on the plurality of groups, the sampling phase estimate based on a sampling phase at which the sample values were obtained; and
adjust the sampling phase based on the sampling phase estimate to achieve a selected sampling phase.

3. The apparatus of claim 1 comprising the circuit further configured to:
generate a sampling phase estimate for each group, the sampling phase estimate based on a sampling phase at which sample values of the group were obtained; and
synchronize the sampling phase based on the sampling phase estimates of the plurality of groups.

4. The apparatus of claim 3 comprising the circuit further configured to:
determine a combined sampling phase estimate based on sampling phase estimates of multiple groups from the plurality of groups;
determine a phase error for each group, including:
select a selected group from the multiple groups;
determine a difference between the sampling phase estimate of the selected group and the combined sampling phase estimate; and

determine the selected group is one of the defect groups when the phase error of the selected group is greater than a threshold.

5. The apparatus of claim 3 comprising the circuit further configured to:
determine an initial sampling phase estimate, corresponding to an initial sampling phase at which a first group of samples from the plurality of groups is obtained, based on the sample values;
adjust the sampling phase by an adjustment amount relative to the initial sampling phase based on the initial sampling phase estimate, including controlling a phase interpolator to modify a clock signal;
determine a current sampling phase estimate for a current group;
remove the adjustment amount corresponding to the current group from the current sampling phase estimate to obtain an updated initial sampling phase estimate, the updated initial sampling phase estimate being the sampling phase estimate for the current group; and
determine the defect groups based on the updated initial sampling phase estimate.

6. The apparatus of claim 1 comprising the circuit further configured to:
generate an amplitude estimate for each group;
determine an amplitude error for each group, including:
select a selected group from the plurality of groups;
determine a difference between the amplitude estimate of the selected group and a selected target value; and

determine the selected group is one of the defect groups when the amplitude error of the selected group and the selected target value is greater than a threshold.

7. The apparatus of claim 6 further comprising:
the selected target value includes an average amplitude estimate based on amplitude estimates of multiple groups from the plurality of groups.

8. The apparatus of claim 1 further comprising:
the circuit includes a data channel of a data storage device, including:
a receiver configured to receive a signal pattern;
an analog front end to condition the signal pattern;
an analog to digital converter to sample the signal pattern;
a preamble error detecting circuit configured to determine the defect groups;

the signal pattern includes a signal generated by detecting a magnetic field recorded to a magnetic data storage medium using a read head;
the preamble field includes a preamble of a sector stored to the magnetic data storage medium;
the circuit further configured to:
determine a number of groups in the defective groups determined for the preamble field; and
reallocate the sector to a new location of the magnetic data storage medium when the number of groups is greater than a threshold.

9. A method comprising:
synchronizing a sampling phase for sampling a signal pattern, including:
sampling a preamble field of the signal pattern to obtain sample values;
splitting the sample values into a plurality of groups, each group of the plurality of groups including consecutively-obtained samples;
determining defect groups from the plurality of groups having samples corresponding to defects in the preamble field;
removing the defect groups from the plurality of groups; and
synchronizing the sampling phase based on the plurality of groups.

10. The method of claim 9 further comprising:
synchronizing the sampling phase includes:
determining a sampling phase estimate based on the plurality of groups, the sampling phase estimate based on a sampling phase at which the sample values were obtained; and
adjusting the sampling phase based on the sampling phase estimate to achieve a selected sampling phase.

11. The method of claim 9 further comprising:
generating a sampling phase estimate for each group, the sampling phase estimate based on a sampling phase at which sample values of the group were obtained; and
synchronizing the sampling phase based on the sampling phase estimates of the plurality of groups.

12. The method of claim 11 further comprising:
determining a combined sampling phase estimate based on sampling phase estimates of multiple groups from the plurality of groups;
determining a phase error for each group, including:
selecting a selected group from the multiple groups;
determining a difference between the sampling phase estimate of the selected group and the combined sampling phase estimate; and

determining the selected group is one of the defect groups when the phase error of the selected group is greater than a threshold.

13. The method of claim 12 further comprising:
determining a set of groups from the multiple groups having phase errors greater than the threshold; and
determining at least one defect group from the set of groups, the at least one defect group including a selected number of groups with the selected number of largest phase errors among the set of groups.

14. The method of claim 9 further comprising:
determining an initial sampling phase estimate, corresponding to an initial sampling phase at which a first group of samples from the plurality of groups is obtained, based on the sample values;
adjusting the sampling phase by an adjustment amount relative to the initial sampling phase based on the initial sampling phase estimate, including controlling a phase interpolator to modify a clock signal;
determining a current sampling phase estimate for a current group;
removing the adjustment amount corresponding to the current group from the current sampling phase estimate to obtain an updated initial sampling phase estimate; and
determine the defect groups based on the updated initial sampling phase estimate.

15. The method of claim 9 further comprising:
generating an amplitude estimate for each group;
determining an amplitude error for each group, including:
select a selected group from the plurality of groups;
determine a difference between the amplitude estimate of the selected group and a selected target value; and

determining the selected group is one of the defect

Assignees

• Seagate Technology Llc

Inventors

• Bellorado Jason Vincent
• Marrow Marcus

Classifications

• G11B20/1889

  with discs · CPC title

• G11B20/18

  Error detection or correction; Testing {, e.g. of drop-outs} · CPC title

• G11B20/10222

  clock-related aspects, e.g. phase or frequency adjustment or bit synchronisation (dedicated sync patterns in the modulation code G11B20/1403) · CPC title

• H04L7/0025

  interpolation of clock signal · CPC title

• H04L69/22 Primary

  Parsing or analysis of headers · CPC title