Analysis system, analysis method, and storage medium in which analysis program is stored

Patent metadata

Field	Value
Publication number	US-10690499-B2
Application number	US-201816139646-A
Country	US
Kind code	B2
Filing date	Sep 24, 2018
Priority date	Sep 29, 2017
Publication date	Jun 23, 2020
Grant date	Jun 23, 2020

Abstract

An analysis system for analyzing inclination of column members includes a laser scanner, a server, and an information terminal. The server includes a data acquisition unit configured to acquire three-dimensional point cloud data of the column members generated by the laser scanner, a surface detector configured to detect surfaces of the column members based on the three-dimensional point cloud data, and an inclination analyzer configured to analyze inclination of the column members by calculating inclination of the surfaces detected by the surface detector.

First claim

What is claimed is:

1. An analysis system for analyzing inclination of a structure, the analysis system comprising:
a measuring device configured to receive and emit a measurement light beam from and to the structure horizontally all around the measuring device and in a certain range in a vertical direction, the measuring device configured to scan the measurement light beam and generate three-dimensional point cloud data of the structure;
a data acquisition unit configured to acquire the three-dimensional point cloud data of the structure;
a surface detector configured to detect a surface of the structure based on the three-dimensional point cloud data; and
an inclination analyzer configured to analyze inclination of the structure by calculating inclination of the surface detected by the surface detector.

2. The analysis system of claim 1 , further comprising:
a measurement controller configured to control a measurement range of the measuring device.

3. The analysis system of claim 2 , wherein the measurement controller acquires positional information including an installation position of the structure and limits the measurement range of the measuring device to a certain range including the structure based on the positional information.

4. The analysis system of claim 3 , wherein the measurement controller acquires the positional information including the installation position of the structure by causing the measuring device to perform a simplified scan for acquiring the installation position of the structure.

5. The analysis system of claim 1 , further comprising:
a display unit configured to display information relating to the inclination of the structure analyzed by the inclination analyzer.

6. The analysis system of claim 5 , wherein the display unit represents the information relating to the inclination of the structure by a vector generated from the three-dimensional point cloud data and extending from the surface of the structure.

7. An analysis method for analyzing inclination of a structure, the analysis method comprising:
receiving and emitting a measurement light beam from and to the structure horizontally all around a measuring device and in a certain range in a vertical direction to scan the measurement light beam, thereby acquiring three-dimensional point cloud data of the structure;
detecting a surface of the structure based on the three-dimensional point cloud data; and
analyzing inclination of the structure by calculating inclination of the surface detected at the detecting.

8. A non-transitory storage medium in which an analysis program for analyzing inclination of a structure is stored, the analysis program causing a computer to execute:
receiving and emitting a measurement light beam from and to the structure horizontally all around a measuring device and in a certain range in a vertical direction to scan the measurement light beam, thereby acquiring three-dimensional point cloud data of the structure;
detecting a surface of the structure based on the three-dimensional point cloud data; and
analyzing inclination of the structure by calculating inclination of the surface detected at the detecting.

9. The analysis system of claim 1 , wherein the measuring device comprises a horizontally rotatable and vertically swingable structure.

Assignees

• Topcon Corp

Inventors

• Sasaki Daisuke
• Onishi Koji
• Takanashi Masaki
• Takahashi Kiyoyasu
• Akiyama Shugo

Classifications

• G01C15/105 Primary

  Optical plumbing · CPC title

• G06T15/005

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• G01C15/10 Primary

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• A61B5/107

  Measuring physical dimensions, e.g. size of the entire body or parts thereof · CPC title

• G06T2207/10028

  Range image; Depth image; 3D point clouds · CPC title