Widely tunable infrared source system and method

Patent metadata

Field	Value
Publication number	US-10686288-B2
Application number	US-201916281159-A
Country	US
Kind code	B2
Filing date	Feb 21, 2019
Priority date	Jun 20, 2012
Publication date	Jun 16, 2020
Grant date	Jun 16, 2020

Abstract

A system and method for tuning and infrared source laser in the Mid-IR wavelength range. The system and method comprising, at least, a plurality of individually tunable emitters, each emitter emitting a beam having a unique wavelength, a grating, a mirror positioned after the grating to receive at least one refracted order of light of at least one beam and to redirect the beam back towards the grating, and a micro-electro-mechanical systems device containing a plurality of adjustable micro-mirrors.

First claim

What is claimed is:

1. A beam source comprising:
a plurality of beam emitters each emitting a beam having a different wavelength;
a grating for receiving the beams from the beam emitters and splitting the beams into a plurality of orders;
a first reflector for reflecting a first one of the orders back to the beam emitters, whereby emission wavelengths of the beam emitters are stabilized; and
an array of reflectors for (i) receiving a second one of the orders from the grating and (ii) reflecting at least one of the beams within the second one of the orders for transmission as an output beam,
wherein the wavelengths emitted by the beam emitters are linearly chirped.

2. The beam source of claim 1 , wherein the grating comprises a transmissive diffraction grating.

3. The beam source of claim 1 , further comprising an optical element for converging the beams from the beam emitters toward the grating.

4. The beam source of claim 1 , further comprising an optical element for receiving the at least one of the beams reflected by the array of reflectors.

5. The beam source of claim 1 , further comprising an optical element for collimating the output beam.

6. The beam source of claim 1 , wherein the array of reflectors is at least a portion of a micro-electro-mechanical systems device.

7. The beam source of claim 1 , wherein the array of reflectors is at least a portion of a digital light processing chip.

8. The beam source of claim 1 , wherein at least one of the beam emitters comprises a quantum cascade laser source.

9. The beam source of claim 1 , wherein each of the reflectors within the array of reflectors is individually controllable.

10. The beam source of claim 1 , wherein at least one of the beam emitters has a tuning range of about 100 nm to about 500 nm.

11. The beam source of claim 1 , wherein the grating has a grating dispersion of at least 150 lines per millimeter.

12. The beam source of claim 1 , wherein the output beam is transmitted away from the plurality of beam emitters.

13. The beam source of claim 1 , wherein beams emitted by adjacent beam emitters have gain peaks different from each other by at least 0.2 micrometers.

14. The beam source of claim 1 , wherein at least one of the beams emitted by the beam emitters has a wavelength ranging from about 5.9 micrometers to about 10.1 micrometers.

15. The beam source of claim 1 , wherein the grating comprises a reflective diffraction grating.

16. The beam source of claim 1 , further comprising a beam dump for receiving one or more beams reflected by the array of reflectors.

17. The beam source of claim 1 , wherein the beam emitters are mechanically positioned such that the beams emitted thereby converge toward the grating.

18. A beam source comprising:
a plurality of beam emitters each emitting a beam having a different wavelength;
a grating for receiving the beams from the beam emitters and splitting the beams into a plurality of orders;
a first reflector for reflecting a first one of the orders back to the beam emitters, whereby emission wavelengths of the beam emitters are stabilized; and
an array of reflectors for (i) receiving a second one of the orders from the grating and (ii) reflecting at least one of the beams within the second one of the orders for transmission as an output beam,
wherein the grating comprises a reflective diffraction grating.

19. A beam source comprising:
a plurality of beam emitters each emitting a beam having a different wavelength;
a grating for receiving the beams from the beam emitters and splitting the beams into a plurality of orders;
a first reflector for reflecting a first one of the orders back to the beam emitters, whereby emission wavelengths of the beam emitters are stabilized;
an array of reflectors for (i) receiving a second one of the orders from the grating and (ii) reflecting at least one of the beams within the second one of the orders for transmission as an output beam; and
a beam dump for receiving one or more beams reflected by the array of reflectors.

20. A beam source comprising:
a plurality of beam emitters each emitting a beam having a different wavelength;
a grating for receiving the beams from the beam emitters and splitting the beams into a plurality of orders;
a first reflector for reflecting a first one of the orders back to the beam emitters, whereby emission wavelengths of the beam emitters are stabilized; and
an array of reflectors for (i) receiving a second one of the orders from the grating and (ii) reflecting at least one of the beams within the second one of the orders for transmission as an output beam,
wherein the beam emitters are mechanically positioned such that the beams emitted thereby converge toward the grating.

Assignees

• Chann Bien
• Huang Robin
• Tayebati Parviz
• Teradiode Inc

Inventors

• Chann Bien
• Huang Robin
• Tayebati Parviz

Classifications

• H01S5/02253

  using lenses · CPC title

• H01S5/02255

  using beam deflecting elements · CPC title

• H01S5/423

  having a vertical cavity · CPC title

• H01S5/4087 Primary

  emitting more than one wavelength · CPC title

• H01S5/4062

  with an external cavity or using internal filters, e.g. Talbot filters · CPC title