High isolation contactor with test pin and housing for integrated circuit testing

Patent metadata

Field	Value
Publication number	US-10686269-B2
Application number	US-201816140853-A
Country	US
Kind code	B2
Filing date	Sep 25, 2018
Priority date	Sep 25, 2017
Publication date	Jun 16, 2020
Grant date	Jun 16, 2020

Abstract

A test socket (14) for a testing an integrated circuit (12) with controlled impedance while maintaining the structural integrity of the test pins (20). The pin (20) can have a sidewall with a thick portion 32 and a thinner portion (30) along the length of the pin. The pin can have projections (42) which provide a standoff from the slot (40). The sidewalls themselves can have projections or lands (60, 61) which extend into the slot and provide stability for the pin (20).

First claim

The invention claimed is:

1. An apparatus for electrically connecting a lead of an integrated circuit ( 12 ) device to be tested to a corresponding terminal of a load board ( 24 ) at a test site, comprising:
a. a housing ( 14 ) having upper and lower surfaces, a first surface approachable by an integrated circuit device under test ( 12 ) to be tested and a second surface proximate the load board;
b. a slot extending through said housing from the first surface to the second surface, said slot including parallel spaced apart opposing first and second inner walls thereby defining a space between said first and second inner walls;
c. a contact pin ( 20 ) having first and second sidewalls and being slideably receivable in said slot ( 40 ), said pin having a first end engagable by the lead and a second end in engagement with the terminal, said pin filling only a portion of said slot thereby leaving a gap between said pin sidewalls and said slot inner walls;
d. a first projection ( 61 , 60 , 47 , 42 , 43 , 34 ) filling a portion of said gap adjacent said first inner wall and a second projection filling a portion of said gap adjacent said second inner wall; said projections providing longitudinal stability for said pin as it is engaged by the device under test and allowing air to provide a dielectric around said projections in said gap.

2. The apparatus of claim 1 wherein said projections extend from said pin toward said inner wall.

3. The apparatus of claim 1 wherein housing includes tubular elastomeric resilient element and wherein said pin includes an arcuate recess for receiving a portion of said resilient element and wherein said projection extends from said pin sidewalls and encompasses at least a portion of said resilient element.

4. The apparatus of claim 1 wherein said projections are a plurality of lands spaced across the pin sidewall.

5. The apparatus of claim 4 wherein said lands are asymmetrically placed on said first side wall relative to said second sidewall.

6. The apparatus of claim 1 wherein said projections are a plurality of lands spaced across the pin inner wall of said slots.

7. The apparatus of claim 1 wherein said projections extend from one or both of said inner walls of said slot toward said pin.

8. The apparatus of claim 1 wherein said pin includes a top and bottom ends and wherein said projections extend adjacent said top and bottom ends.

9. The apparatus of claim 1 wherein said pin includes a top and bottom ends and wherein said projections extend between said top and bottom ends along a curved path.

10. The apparatus of claim 1 wherein said pin includes a top and bottom ends and wherein said projections extend between said top and bottom ends along a curved path and including a land portion partially surrounding said resilient member.

11. The apparatus of claim 1 wherein said pin includes a top and bottom ends and wherein said projections extend between said top and bottom ends along a diagonal path.

12. The apparatus of claim 1 wherein said housing ( 14 ) includes a top surface having said slots ( 40 ) and wherein said surface adjacent said slots is recessed ( 31 ) thereby exposing a portion of said pins to air.

13. The apparatus of claim 1 wherein said contact pin includes an upper portion of predetermined thickness and a lower portion of thickness greater than said predetermined thickness and wherein said slot had upper and lower spaced apart sidewalls, said upper sidewalls being spaced to just accommodate said upper portion of said pin portion and said lower sidewalls being spaced apart to just accommodate said lower pin portion, so that said pin may slide within said sidewalls.

14. An apparatus for electrically connecting a lead of an integrated circuit ( 12 ) device to be tested to a corresponding terminal of a load board ( 24 ) at a test site, comprising:
a. a housing ( 14 ) having upper and lower surfaces, a first surface approachable by an integrated circuit device under test ( 12 ) to be tested and a second surface proximate the load board;
b. a slot extending through said housing from the first surface to the second surface, said slot including parallel spaced apart opposing first and second inner walls thereby defining a space between said first and second inner walls;
c. a contact pin ( 20 ) having first and second sidewalls and being slideably receivable in said slot ( 40 ), said pin having a first end engagable by the lead and a second end in engagement with the terminal, said pin filling only a portion of said slot thereby leaving a gap between said pin sidewalls and said slot inner walls;
d. a first projection ( 61 , 60 , 47 , 43 , 42 , 34 ) filling a portion of said gap extending from said first inner wall and a second projection filling a portion of said gap extending from said second inner wall; said projections providing longitudinal stability for said pin as it is engaged by the device under test and allowing air to provide a dielectric around said projections in said gap.

15. The apparatus of claim 14 wherein said projections are lands having planar distal surfaces.

16. The apparatus of claim 14 wherein said projections are conical having planar distal surfaces.

17. The apparatus of claim 14 wherein said projections are spherical.

18. The apparatus of claim 17 wherein housing includes tubular elastomeric resilient element and wherein said pin includes an arcuate recess for receiving a portion of said resilient element and wherein said projection extends from said pin sidewalls and encompasses at least a portion of said resilient element; and further including a stabilizer projection.

19. The apparatus of claim 14 wherein said projections are cylindrical and having planar distal surfaces.

20. An apparatus for electrically connecting a lead of an integrated circuit ( 12 ) device to be tested to a corresponding terminal of a load board ( 24 ) at a test site, comprising:
a. a housing ( 14 ) having upper and lower surfaces, a first surface approachable by an integrated circuit device under test ( 12 ) to be tested and a second surface proximate the load board;
b. a slot extending through said housing from the first surface to the second surface, said slot including parallel spaced apart opposing first and second inner walls thereby defining a space between said first and second inner walls;
c. a contact pin ( 20 ) having first and second sidewalls and being slideably receivable in said slot ( 40 ), said pin having a first end engagable by the lead and a second end in engagement with the terminal, said pin filling only a portion of said slot thereby leaving a gap between said pin sidewalls and said slot inner walls;
d. a first projection ( 61 , 60 , 47 , 43 , 42 , 34 ) filling a portion of said gap extending from said first and second pin sidewalls and filling a portion of said gap extending from said second inner wall; said projections providing longitudinal stability for said pin as it is engaged by the device under test and allowing air to provide a dielectric around said projections in said gap.

21. A method of making an integrated circuit test contactor for testing a device under test, the housing having upper and lower surfaces, a first surface approachable by an integrated circuit device under test ( 12 ) to be tested and a second surface proximate the load board; a slot extending through said housing from the first surface to the second surface, said slot including parallel spaced apart opposing first and second inner wal

Assignees

• Johnstech Int Corp

Inventors

• Sherry Jeffrey
• Andres Michael

Classifications

• H01R13/2407

  characterized by the resilient means · CPC title

• H01R2201/20

  for testing or measuring purposes · CPC title

• G01R1/0466

  concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding · CPC title

• H01R12/82

  connected with low or zero insertion force · CPC title

• G01R31/2886

  Features relating to contacting the IC under test, e.g. probe heads; chucks (G01R31/2865 takes precedence, test connections, e.g. test sockets, or probes per se, G01R1/04 or G01R1/06) · CPC title