Slide screw tuners with offset tuning probes and method

US10686239B1 · US · B1

Patent metadata
FieldValue
Publication numberUS-10686239-B1
Application numberUS-201916569897-A
CountryUS
Kind codeB1
Filing dateSep 13, 2019
Priority dateJul 18, 2018
Publication dateJun 16, 2020
Grant dateJun 16, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A passive slide screw load pull tuner structure can be used on-wafer, in millimeter-wave frequencies from 25 to 110 GHz and above. It uses special tuning probe brackets and a short slabline mounted below the tuner housing, which holds the control gear. The tuner is mounted under an angle matching the angle of the wafer-probe, is connected directly of the wafer-probe and ensures optimum tuning range.

First claim

Opening claim text (preview).

What I claim as my invention is: 1. A load pull tuner with merely to improve the grammatical form and externally mounted slabline, comprising a) a tuner body, b) a slabline, mounted externally to the tuner body, and having a center conductor, a test and an idle port, c) at least one, parallel to the slabline sliding, mobile carriage, said at least one carriage having a perpendicular to the slabline movable axis holding metallic tuning probe(s), which are insertable into a slot of the slabline; wherein the tuning probe(s) is/are attached at the perpendicular to the slabline movable axis using extension brackets, and wherein, at initialization, the tuning probe(s) is/are positioned adjacent to each-other next to the test port, and wherein, the total length of the slabline is approximately one half of a wavelength at the lowest frequency of operation plus the total width of the probe(s) in parallel to the slabline length direction. 2. The tuner of claim 1 , wherein the test port of the slabline is the test port of the tuner and can be connected directly to a wafer probe.

Assignees

Inventors

Classifications

  • Toothed-gear drive; Worm drive · CPC title

  • of microwave or radiofrequency circuits (of attenuation, gain, e.g. using network analyzers G01R27/28) · CPC title

  • for measuring gain factor thereof · CPC title

  • in which an automatic frequency control circuit is brought in action after the scanning action has been stopped · CPC title

  • Driving or adjusting arrangements; combined with other driving or adjusting arrangements, e.g. of gain control · CPC title

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What does patent US10686239B1 cover?
A passive slide screw load pull tuner structure can be used on-wafer, in millimeter-wave frequencies from 25 to 110 GHz and above. It uses special tuning probe brackets and a short slabline mounted below the tuner housing, which holds the control gear. The tuner is mounted under an angle matching the angle of the wafer-probe, is connected directly of the wafer-probe and ensures optimum tuning r…
Who is the assignee on this patent?
Tsironis Christos
What technology area does this patent fall under?
Primary CPC classification H04L25/0204. Mapped technology areas include Electricity.
When was this patent published?
Publication date Tue Jun 16 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B1). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).