Electronic component handler and electronic component tester

Patent metadata

Field	Value
Publication number	US-10679335-B2
Application number	US-201816048967-A
Country	US
Kind code	B2
Filing date	Jul 30, 2018
Priority date	Jul 31, 2017
Publication date	Jun 9, 2020
Grant date	Jun 9, 2020

Abstract

An electronic component handler includes a region where an electronic component placement unit on which an electronic component is placed is capable of being disposed. A laser light source emits light toward the electronic component placement unit placed in the region. A capturing unit is capable of capturing an image of the electronic component and irradiated with the light. A processor determines the presence or absence of the electronic component in the electronic component placement unit based on the image. In the image, the processor sets a first candidate region and a second candidate region from an electronic component placement region which is a region where the electronic component is placed, determines a selected region by comparing the first candidate region and the second candidate region to each other, and performs the determination based on the selected region.

First claim

What is claimed is:

1. An electronic component handler comprising:
a region where an electronic component placement unit on which an electronic component is placed is capable of being disposed;
a transport unit which transports the electronic component to the electronic component placement unit;
a laser light source which emits light toward the electronic component placement unit placed in the region;
a capturing unit which is capable of capturing an image of the electronic component, the electronic component being placed on the electronic component placement unit and irradiated with the light; and
a processor which determines the presence or absence of the electronic component in the electronic component placement unit based on the image, wherein, in the image, the processor sets a first candidate region and a second candidate region from an electronic component placement region which is a region where the electronic component is placed, determines a selected region by comparing the first candidate region and the second candidate region, and performs the determination based on the selected region,
wherein the processor compares luminance distributions of the candidate regions when comparing the candidate regions, and
wherein the processor compares evaluation functions of the luminance histograms of the candidate regions when comparing the luminance distractions of the candidate regions.

2. The electronic component handler according to claim 1 ,
wherein the processor sets a plurality of the candidate regions having different areas around a predetermined reference point.

3. The electronic component handler according to claim 1 ,
wherein the processor sets a plurality of the candidate regions having different positions of predetermined reference points that serve as the center.

4. The electronic component handler according to claim 1 ,
wherein the electronic component placement unit has a recess portion in which the electronic component is accommodated, and
wherein the processor sets a plurality of the candidate regions in the recess portion in the image.

5. The electronic component handler according to claim 4 ,
wherein the capturing unit performs the capturing in a state where the electronic component is accommodated in the recess portion.

6. An electronic component tester comprising:
a region where an electronic component placement unit on which an electronic component is placed is capable of being disposed;
a transport unit which transports the electronic component to the electronic component placement unit;
a laser light source which emits light toward the electronic component placement unit placed in the region;
a capturing unit which is capable of capturing an image of the electronic component, the electronic component being placed on the electronic component placement unit and irradiated with the light; and
a processor which determines the presence or absence of the electronic component in the electronic component placement unit based on the image,
wherein, in the image, the processor sets a first candidate region and a second candidate region from an electronic component placement region which is a region where the electronic component is placed, determines a selected region by comparing the first candidate region and the second candidate region, and performs the determination based on the selected region,
wherein the electronic component placement unit is a test unit that tests the electronic component,
wherein the processor compares luminance distributions of the candidate regions when comparing the first candidate region and the second candidate region, and
wherein the processor compares evaluation functions of the luminance histograms of the candidate regions when comparing the luminance distributions of the first candidate region and the second candidate region.

Assignees

• Seiko Epson Corp

Inventors

• Ishida Hirokazu
• Kimura Yuya
• Takahashi Tatsunori

Classifications

• G06T7/0008 Primary

  checking presence/absence · CPC title

• G01R31/2893 Primary

  Handling, conveying or loading, e.g. belts, boats, vacuum fingers (G01R31/2867 takes precedence; handling semiconductor devices or wafers during manufacture or treatment H10P72/00) · CPC title

• G06T2207/30148

  Semiconductor; IC; Wafer · CPC title

• G01V8/10 Primary

  Detecting, e.g. by using light barriers (by reflection from the object G01S17/00) · CPC title