System and method of acquiring images using an X-ray imaging system

Patent metadata

Field	Value
Publication number	US-10677939-B2
Application number	US-201514927244-A
Country	US
Kind code	B2
Filing date	Oct 29, 2015
Priority date	Oct 29, 2015
Publication date	Jun 9, 2020
Grant date	Jun 9, 2020

Abstract

Improvement of the dynamic range of a radiation detector is described. In one embodiment, one or more non-destructive readout operations are performed during a radiation exposure event to acquire data used to improve the dynamic range of the detector. In one implementation, one or more non-destructive readouts of pixels are performed prior to saturation of the pixels during an X-ray exposure so as to obtain non-saturated measurements at the pixels. In an additional implementation, non-destructive readouts of pixels are performed between exposure events so as to obtain an estimate of electronic noise during a multi-exposure examination.

First claim

The invention claimed is:

1. An imaging method, comprising
exposing an object to X-rays during an exposure time interval, wherein the x-rays pass through and around the object and impact a detector comprising a plurality of pixels configured to accumulate charge when exposed to X-rays;
during the exposure time interval, at least one of a controller or a processing component sends instructions to readout circuitry to perform one or more non-destructive readout operations on a set of the plurality pixels comprising some or all of the plurality of pixels thereby producing read out pixels; wherein each non-destructive readout operation measures a charge at each read out pixel at the time of the non-destructive readout operation; and wherein each non-destructive readout operation does not reset the overall charge at the read out pixel;
processing data from the readout operations in the processing component or in a second processing component to estimate charge accumulation information for a subset of read out pixels that saturate over the exposure time interval; and
generating an image using the estimated charge accumulation information for the subset of pixels.

2. The imaging method of claim 1 , wherein the object undergoing imaging is a tissue sample of that is not uniformly thick across an imaging area.

3. The imaging method of claim 2 , wherein the tissue sample comprises compressed breast tissue.

4. The imaging method of claim 1 , wherein the set of the plurality of pixels comprise amplification and charge buffering circuitry within each respective pixel.

5. The imaging method of claim 1 , wherein the set of the plurality of pixels are part of a complementary metal-oxide semiconductor (CMOS) radiation detector.

6. The imaging method of claim 1 , further comprising: estimating the X-ray exposure rate based on the charges measured by the one or more non-destructive readout operations.

7. The imaging method of claim 1 , wherein the set of the plurality of pixels readout using the one or more non-destructive readout operations comprise a sparse image array of an overall detector.

8. The imaging method of claim 1 , wherein the one or more non-destructive readout operations are performed at a frame rate greater than 100 frames per second.

9. The method of claim 1 wherein the estimation of charge accumulation information is performed during the exposure time interval.

10. The method of claim 1 wherein the image using the estimated charge accumulation information for the subset of pixels is generated by image summation or by pixel value estimation.

11. The method of claim 10 wherein the estimation of charge accumulation information is performed during the exposure time interval.

Assignees

• Gen Electric

Inventors

• Jacob Biju
• Lai Hao
• Klausz Remy Andre
• Tkaczyk John Eric

Classifications

• G01T1/2018 Primary

  Scintillation-photodiode combinations · CPC title

• H04N5/35554

  Electricity · mapped topic

• H04N5/361

  Electricity · mapped topic

• G01T1/24

  with semiconductor detectors · CPC title

• H04N5/32

  Transforming X-rays (cameras or camera modules for generating image signals from X-rays H04N23/30; circuitry of SSIS for transforming X-rays into image signals H04N25/30) · CPC title