Method and device for detecting defects in the closure of encapsulated vials

US10677582B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10677582-B2
Application numberUS-201916507660-A
CountryUS
Kind codeB2
Filing dateJul 10, 2019
Priority dateJul 30, 2018
Publication dateJun 9, 2020
Grant dateJun 9, 2020

How to read this patent

A practical reading order for non-experts. Skip the full description unless you need deep technical detail.

  1. Title

    What the patent document calls the invention.

  2. Abstract

    A short plain-language summary of the technical disclosure.

  3. Assignees and inventors

    Who owns or filed the patent and who is credited as inventor.

  4. Key dates

    Filing, priority, publication, and grant dates set the timeline.

  5. First independent claim

    The legal scope of protection — read this for what is actually claimed.

  6. CPC / IPC classifications

    Technology tags used to group this patent with similar filings.

  7. Citations and related patents

    Prior art links and similar publications in this corpus.

Abstract

Official abstract text for this publication.

A method and device detect defects in the closure of encapsulated vials. The method includes scanning a profile of the capsule and of the vial using a profilometer, thus obtaining a point cloud. From the point cloud obtained, calculating at least one of the following parameters: diameter or radius of the closure circumference of the capsule; angle of intersection between the lower skirt and the side of the capsule; length of the lower skirt; and/or a distance from the end of the lower skirt to the neck of the vial. The method determines whether any of the parameters calculated in the previous step exceeds a predetermined value. The device detecting defects in the closure of encapsulated vials includes a profilometer configured to scan a profile of the capsule and of the vial and a control device configured to execute the method.

First claim

Opening claim text (preview).

The invention claimed is: 1. Method for detecting defects in closure of encapsulated cap and vial assemblies, the method comprising the following steps: a) Scanning a profile of a capsule and of the vial using measurements of a profilometer, said profile corresponding to a generatrix of the vial which defines a head, a side and a lower skirt of said capsule, sealing a portion of the cap and a portion of the vial; forming a point cloud from the measurements of the scanning by the profilometer; b) From the point cloud formed in the previous step, calculating at least one of the following parameters: i. Diameter or radius of a closure circumference of the capsule, said closure circumference being defined by a circumference defined by a fold of the lower skirt of the capsule relative to the side of the capsule; ii. Angle of intersection between the lower skirt and the side of the capsule; iii. Length of the lower skirt of the capsule; iv. Distance from an end of the lower skirt of the capsule to a neck of the vial; c) Determining whether any parameter calculated in the previous step exceeds a predetermined limit value, said limit value indicating whether encapsulation is or is not correct. 2. Method according to claim 1 , wherein said point cloud is obtained using a laser profilometer. 3. Method according to claim 1 wherein calculation of the diameter or radius of the closure circumference of the capsule comprises the following steps: a) Calculating a regression circumference of the closure of the capsule from the point cloud of the side and lower skirt of the capsule; b) Measuring the diameter or radius of the regression circumference, estimating that said regression circumference is equal to the closure circumference of the capsule. 4. Method according to claim 1 , wherein calculation of the angle of intersection between the lower skirt and the side of the capsule comprises the following steps: a) Calculating a regression line of the side of the capsule from the point cloud; b) Calculating a regression line of the lower skirt of the capsule from the point cloud; c) Determining a point of intersection between both regression lines and an angle formed between the regression lines. 5. Method according to claim 1 , wherein calculation of the length of the lower skirt comprises the following steps: a) Determining an end point of the lower skirt; b) Determining an end point of the fold between the side and the lower skirt of the capsule; c) Measuring a distance between both points. 6. Method according to claim 1 , wherein calculation of the distance from the end of the lower skirt to the vial comprises the following steps: a) Determining an end point of the lower skirt, if not previously determined; b) Determining an end point of the neck of the vial; c) Measuring a distance between both points. 7. Device for detecting defects in the closure of encapsulated vials, comprising a profilometer configured to scan a profile of the capsule and of the vial and a control device configured to execute a method according to claim 1 . 8. Device according to claim 7 , wherein said profilometer is a laser profilometer. 9. Device according to claim 7 , wherein said profilometer is a two-dimensional profilometer. 10. Device according to claim 7 , further comprising a vial supply device. 11. Device according to claim 10 , wherein said vial supply device operates continuously. 12. Device according to claim 7 , wherein said profilometer measures the profile using two different exposure durations. 13. Device according to claim 7 , comprising means for rotating the vial on a longitudinal axis, thus obtaining the profile of the capsule and of the vial along the entire circumference of said capsule and vial. 14. Device according to claim 7 , comprising means for rotating the profilometer about a longitudinal axis of the vial, thus obtaining the profile of the capsule and of the vial along the entire circumference of said capsule and vial. 15. The method according to claim 1 , comprising measuring the profile with said profilometer using two different exposure durations. 16. The method according to claim 15 , wherein a first exposure has a duration between 20 μs and 100 μs and a second exposure has a duration between 150 μs and 500 μs. 17. The method according to claim 15 , wherein a first exposure has a duration between 30 μs and 50 μs and a second exposure has a duration between 250 μs and 350 μs.

Assignees

Inventors

Classifications

  • based on image processing techniques · CPC title

  • for measuring diameters · CPC title

  • Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges (G01N21/8806 and G01N21/93 - G01N21/95692 take precedence; optical measurement of dimensions G01B11/00; optical scanning G02B26/10; image transformation G06T3/00; computerised image enhancement G06T5/00; image processing per se for flaw detection G06T7/0002) · CPC title

  • Projection by scanning of the object · CPC title

  • Containers with closing means, e.g. caps · CPC title

Patent family

Related publications grouped by family.

External sources

Frequently asked questions

Answers are generated from the same data shown on this page.

What does patent US10677582B2 cover?
A method and device detect defects in the closure of encapsulated vials. The method includes scanning a profile of the capsule and of the vial using a profilometer, thus obtaining a point cloud. From the point cloud obtained, calculating at least one of the following parameters: diameter or radius of the closure circumference of the capsule; angle of intersection between the lower skirt and the…
Who is the assignee on this patent?
Grifols Worldwide Operations Ltd
What technology area does this patent fall under?
Primary CPC classification G01N21/9054. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Jun 09 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).