Additive processing apparatus and method

US10675854B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10675854-B2
Application numberUS-201514598322-A
CountryUS
Kind codeB2
Filing dateJan 16, 2015
Priority dateJan 16, 2015
Publication dateJun 9, 2020
Grant dateJun 9, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An additive processing apparatus includes a chamber and an irradiation device that together are operable to additively fabricate an article from a powder layer-by-layer in a work space in the chamber. A gas recirculation loop is connected at a first end thereof to an outlet of the chamber and at a second end thereof to an inlet of the chamber. The gas recirculation loop includes at least one purification device that is configured to remove impurities from a cover gas and generate a clean cover gas.

First claim

Opening claim text (preview).

What is claimed is: 1. An additive processing apparatus comprising: a chamber and an irradiation device together operable to additively fabricate an article from a powder layer-by-layer in a work space in the chamber; a gas recirculation loop connected at a first end thereof to an outlet of the chamber and at a second end thereof to an inlet of the chamber, the gas recirculation loop including at least one purification device configured to remove impurities from a cover gas and to generate a clean cover gas, wherein the gas recirculation loop includes a heat exchanger downstream of the at least one purification device with respect to flow from the first end to the second end a cover gas source connected to the chamber for providing new cover gas; and a controller configured to meter an amount of new cover gas with respect to an amount of clean cover gas circulated into the chamber from the gas recirculation loop. 2. The apparatus as recited in claim 1 , wherein the at least one purification device includes a gas scrubber. 3. The apparatus as recited in claim 2 , wherein the at least one purification device includes a particle filter. 4. The apparatus as recited in claim 3 , wherein the particle filter is upstream of the gas scrubber with respect to flow from the first end to the second end. 5. The apparatus as recited in claim 4 , further comprising an additional particle filter downstream of the gas scrubber with respect to flow from the first end to the second end. 6. The apparatus as recited in claim 2 , wherein the gas scrubber includes a bed of granules. 7. The apparatus as recited in claim 2 , wherein the gas scrubber includes at least one of activated carbon, magnesium, titanium, and copper. 8. The apparatus as recited in claim 2 , wherein the gas scrubber includes a molecular sieve. 9. The apparatus as recited in claim 1 , wherein the gas recirculation loop splits into first and second passages including, respectively, first and second purification devices, and the first and second passages combine in the gas recirculation loop downstream of the first and second purification devices with respect to flow from the first end to the second end. 10. The apparatus as recited in claim 1 , wherein the gas recirculation loop includes at least one sensor downstream of the at least one purification device with respect to flow from the first end to the second end, the at least one sensor configured to detect a characteristic representative of impurity level of the clean cover gas. 11. An additive processing apparatus comprising: a chamber and an irradiation device together operable to additively fabricate an article from a powder layer-by-layer in a work space in the chamber, the chamber including a vent valve; a gas recirculation loop connected at a first end thereof to an outlet of the chamber and at a second end thereof to an inlet of the chamber and, to purify a cover gas received from the chamber and generate a clean cover gas circulated into the chamber, the gas recirculation loop including, in flow serial order from the first end to the second end, a particle filter configured to remove solid impurities from the cover gas, a gas scrubber configured to remove gaseous impurities from the cover gas, a heat exchanger operable to cool the cover gas, and a recirculation loop metering valve; a cover gas source and a cover gas metering valve, the cover gas source being connected through the cover gas metering valve to the chamber for providing new cover gas; and a controller connected with the vent valve, the recirculation loop metering valve, and the cover gas metering valve, the controller configured to operate the vent valve to vent the cover gas from the chamber through the vent valve and operate the cover gas metering valve and the recirculation loop metering valve to meter an amount of new cover gas provided into the chamber as make-up gas for the cover gas that is vented from the vent valve with respect to an amount of clean cover gas circulated into the chamber from the gas recirculation loop. 12. The apparatus as recited in claim 1 , wherein the at least one purification device includes, in serial flow order, a particle filter and a gas scrubber. 13. The apparatus as recited in claim 1 , further comprising a metering valve in the gas recirculation loop and a controller in communication with the metering valve and configured to regulate an amount of clean cover gas from the gas recirculation loop into the chamber. 14. The apparatus as recited in claim 11 , wherein the particle filter is upstream of the gas scrubber with respect to flow from the first end to the second end. 15. The apparatus as recited in claim 14 , further comprising an additional particle filter downstream of the gas scrubber with respect to flow from the first end to the second end. 16. The apparatus as recited in claim 14 , wherein the gas scrubber includes at least one of activated carbon, magnesium, titanium, and copper. 17. The apparatus as recited in claim 14 , wherein the gas recirculation loop includes at least one sensor configured to detect a characteristic representative of impurity level of the clean cover gas. 18. An additive processing method for fabricating an article using the additive processing apparatus as recited in claim 1 , including circulating the cover gas with impurities from the chamber into the gas recirculation loop, removing the impurities from the cover gas in the gas recirculation loop using the purification device to generate the clean cover gas, circulating the clean cover gas into the chamber during the additive fabrication, and metering the amount of new cover gas with respect to the amount of clean cover gas circulated into the chamber from the gas recirculation loop using the controller.

Assignees

Inventors

Classifications

  • Operations & Transport · mapped topic

  • Treatment under specific atmosphere · CPC title

  • B01D47/00Primary

    Separating dispersed particles from gases, air or vapours by liquid as separating agent (B01D45/10 takes precedence; fractionating columns or parts thereof B01D3/16) · CPC title

  • Operations & Transport · mapped topic

  • Operations & Transport · mapped topic

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What does patent US10675854B2 cover?
An additive processing apparatus includes a chamber and an irradiation device that together are operable to additively fabricate an article from a powder layer-by-layer in a work space in the chamber. A gas recirculation loop is connected at a first end thereof to an outlet of the chamber and at a second end thereof to an inlet of the chamber. The gas recirculation loop includes at least one pu…
Who is the assignee on this patent?
United Technologies Corp, Raytheon Tech Corp
What technology area does this patent fall under?
Primary CPC classification B01D47/00. Mapped technology areas include Operations & Transport.
When was this patent published?
Publication date Tue Jun 09 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).