Scanning microscope

US10663707B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10663707-B2
Application numberUS-201515536675-A
CountryUS
Kind codeB2
Filing dateDec 21, 2015
Priority dateDec 19, 2014
Publication dateMay 26, 2020
Grant dateMay 26, 2020

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  5. First independent claim

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Abstract

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A scanning microscope includes an objective and a scanning element that is adjustable for a time-variable deflection to guide a focused illumination beam across the sample in a scanning movement. A detection beam is guided across sensor elements of an image sensor in a movement which corresponds to the scanning movement of the focused illumination beam. A dispersive element of a predetermined dispersive effect arranged upstream of the image sensor spatially separates different spectral components of the detection beam from one another on the image sensor. A controller detects the time-variable adjustment of the scanning element, assigns the spatially separated spectral components of the detection beam to the sensor elements of the image sensor based on the detected time-variable adjustment, while taking into account the predetermined dispersive effect of the dispersive element, and individually reads out the sensor elements assigned to the spectral components.

First claim

Opening claim text (preview).

The invention claimed is: 1. A method for forming an image of a sample by scanning microscopy, the method comprising: focusing, by an objective, an illumination beam onto the sample, adjusting a scanning element arranged upstream of the objective for a time-variable deflection of the illumination beam to guide the focused illumination beam across the sample in a scanning movement, focusing, by the objective onto an image sensor, a detection beam which emanates from the sample illuminated by the focused illumination beam, the image sensor having a plurality of sensor elements which are individually readable by a controller, guiding the detection beam across the sensor elements in a movement which corresponds to the scanning movement of the focused illumination beam, spatially separating different spectral components of the detection beam on the image sensor from one another using a dispersive element of a predetermined dispersive effect which is arranged upstream of the image sensor, detecting, by the controller, the time-variable adjustment of the scanning element for a spectrally resolved detection of the detection beam, assigning the spatially separated spectral components of the detection beam to the sensor elements of the image sensor based on the detected time-variable adjustment, while taking into account the predetermined dispersive effect of the dispersive element, and reading out respective spectral components from the sensor elements assigned to the respective spectral components. 2. The method according to claim 1 , wherein the dispersive element is arranged in a plane which is optically conjugate with a plane in which the sample is arranged. 3. The method according to claim 2 , wherein the plane in which the dispersive element is arranged is optically equivalent to a plane in which the scanning element is arranged. 4. The method according to claim 1 , wherein the scanning element is configured to guide the illumination beam across the sample in a first scanning direction. 5. The method according to claim 4 , wherein the scanning element is further configured to guide the illumination beam across the sample in a second scanning direction which is perpendicular to the first scanning direction, the movement of the illumination beam in the first scanning direction being faster than in the second scanning direction. 6. The method according to claim 4 , wherein the dispersive effect of the dispersive element is predetermined such that the spectral components of the detection beam on the image sensor are spatially separated from one another in a direction which is perpendicular to a direction in which the detection beam is guided across the image sensor while the illumination beam is guided across the sample in the first scanning direction. 7. The method according to claim 1 , further comprising a detection optics is arranged between the dispersive element and the image sensor and configured to focus the entire detection beam, which has been split spectrally by the dispersive element, onto the image sensor during each adjustment of the scanning element. 8. The method according to claim 7 , wherein the detection optics is a lens, the dispersive element being arranged in the focal plane of the lens. 9. The method according to claim 7 , wherein the detection optics is configured to focus the spectrally split detection beam onto the image sensor along a predetermined line during each adjustment of the scanning element. 10. The method according to claim 9 , wherein the detection optics comprises a crossed arrangement of three cylindrical lenses including a middle cylindrical lens and two other cylindrical lenses, the middle cylindrical lens having an effectively refractive intersection which is located in a first plane and the two other cylindrical lenses having effectively refractive intersections located in a second plane which is perpendicular to the first plane. 11. The method according to claim 1 , wherein the controller is configured to select at least one of the spectral components and read out only the sensor elements which are assigned to the at least one selected spectral component. 12. The method according to claim 1 , wherein the image sensor is a surface sensor or a line sensor. 13. The method according to claim 1 , wherein the dispersive element is a prism or a grating. 14. The method according to claim 1 , wherein the scanning microscope is configured for the spectrally resolved detection of the detection beam in a non-descanned method. 15. A scanning microscope comprising: an objective configured to focus an illumination beam onto a sample; a scanning element which is arranged upstream of the objective and is adjustable for a time-variable deflection of the illumination beam to guide the focused illumination beam across the sample in a scanning movement; an image sensor onto which the objective is configured to image a detection beam which emanates from the sample illuminated by the focused illumination beam, the image sensor having a plurality of sensor elements across which the detection beam is guidable in a movement which corresponds to the scanning movement of the focused illumination beam, a dispersive element of a predetermined dispersive effect arranged upstream of the image sensor and configured to spatially separate different spectral components of the detection beam from one another on the image sensor; and a controller configured to detect the time-variable adjustment of the scanning element for a spectrally resolved detection of the detection beam, assign the spatially separated spectral components of the detection beam to the sensor elements of the image sensor based on the detected time-variable adjustment, while taking into account the predetermined dispersive effect of the dispersive element, and individually read out the sensor elements assigned to the spectral components. 16. A scanning microscope, comprising: an objective configured to focus an illumination beam onto a sample; a scanning element which is arranged upstream of the objective and is adjustable for a time-variable deflection of the illumination beam to guide the focused illumination beam across the sample in a scanning movement; an image sensor onto which the objective is configured to image a detection beam which emanates from the sample illuminated by the focused illumination beam, the image sensor having a plurality of sensor elements across which the detection beam is guidable in a movement which corresponds to the scanning movement of the focused illumination beam, a dispersive element of a predetermined dispersive effect arranged upstream of the image sensor and configured to spatially separate different spectral components of the detection beam from one another on the image sensor; and a controller configured to detect the time-variable adjustment of the scanning element for a spectrally resolved detection of the detection beam, assign the spatially separated spectral components of the detection beam to the sensor elements of the image sensor based on the detected time-variable adjustment, while taking into account the predetermined dispersive effect of the dispersive element, and individually read out the sensor elements assigned to the spectral components, wherein the scanning element is configured to guide the illumination beam across the sample in a first scanning direction, and wherein the scanning element is further configured to guide the illumination beam across the sample in a second scanning direction which is perpendicular to the first scanning direction, the movement of t

Assignees

Inventors

Classifications

  • arrangements using fluorescence or luminescence · CPC title

  • Optical details, e.g. image relay to the camera or image sensor (G02B21/364 takes precedence; illumination details G02B21/06 and subgroups) · CPC title

  • time-scale detection, e.g. strobed, ultra-fast, heterodyne detection · CPC title

  • multi-spectral or wavelength-selective arrangements, e.g. wavelength fan-out, chromatic profiling (G02B21/0076 takes precedence) · CPC title

  • moving apertures, e.g. Nipkow disks, rotating lens arrays · CPC title

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What does patent US10663707B2 cover?
A scanning microscope includes an objective and a scanning element that is adjustable for a time-variable deflection to guide a focused illumination beam across the sample in a scanning movement. A detection beam is guided across sensor elements of an image sensor in a movement which corresponds to the scanning movement of the focused illumination beam. A dispersive element of a predetermined d…
Who is the assignee on this patent?
Leica Microsystems
What technology area does this patent fall under?
Primary CPC classification G02B21/0064. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 26 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 7 related publications on this page (citations in our corpus or others sharing the same primary CPC).