Quality inspection system and method of operation

US10663292B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10663292-B2
Application numberUS-201916527828-A
CountryUS
Kind codeB2
Filing dateJul 31, 2019
Priority dateSep 24, 2018
Publication dateMay 26, 2020
Grant dateMay 26, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

An inspection system for measuring an object is provided. The inspection system includes an entryway sized to receive the object. At least two non-contact coordinate measurement devices are positioned with a field of view being at least partially within or adjacent to the entryway, each of the at least two non-contact coordinate measurement devices being operable to measure 3D coordinates for a plurality of points on the object as one of the object or the entryway move from a first position to a final position. A pose measurement device is operable to determine the six-degree of freedom (6DOF) pose of the object. One or more processors are provided that register the 3D coordinates for the plurality of points from each of the at least two non-contact coordinate measurement devices based at least in part on the 6DOF pose of the object.

First claim

Opening claim text (preview).

What is claimed is: 1. A method of inspecting an object, the method comprising: detecting the object entering an entryway; initiating operation of at least two non-contact coordinate measurement devices, the at least two non-contact coordinate measurement devices being positioned with a field of view at least partially within or adjacent the entryway; acquiring 3D coordinates of the object with each of the at least two non-contact coordinate measurement devices; measuring a six-degree of freedom (6DOF) pose of the object with a pose measurement device; and registering the 3D coordinates acquired by each of the at least two non-contact coordinate measurement devices based at least in part on the measured 6DOF pose. 2. The method of claim 1 , further comprising measuring the speed of the object when the measuring the 6DOF pose. 3. The method of claim 2 , further comprising determining the 6DOF pose based on the measured speed and a time measurement. 4. The method of claim 1 , further comprising moving the object from a first position to a second position while acquiring the 3D coordinates. 5. The method of claim 1 , further comprising moving the entryway from a first position to a second position while acquiring the 3D coordinates. 6. The method of claim 4 , further comprising determining the position and orientation of the object in the second position with the pose measurement device. 7. The method of claim 1 , further comprising determining the location of an anomaly on the surface of the object based at least in part on the 3D coordinates of a plurality of points on the surface of the object. 8. The method of claim 7 , further comprising emitting visible light with at least one projector onto the object based on the location of the anomaly. 9. The method of claim 1 , further comprising moving the pose measurement device from an initial position and follow a path when the object is in a second position. 10. The method of claim 9 , further comprising measuring 3D coordinates for a second plurality of points with the pose measurement device while the pose measurement device moves along the path. 11. The method of claim 6 , wherein the determination of the position and orientation of the object includes comparing the 3D coordinates of the second plurality of points with an electronic model of the environment in which the object is located. 12. The method of claim 2 , wherein the measurement of the speed of the object includes acquiring a plurality of images of the object as the object moves. 13. The method of claim 12 , wherein at least one of the at least two non-contact coordinate measurement devices is located beneath a surface upon which the object is moved. 14. The method of claim 13 , further comprising measuring 3D coordinates with the at least one of the at least two non-contact coordinate measurement devices by projecting light through a gap in the surface. 15. The method of claim 1 , wherein the object is an aircraft. 16. The method of claim 1 , wherein the entryway is defined by a first frame and a second frame, the second frame being movably coupled to the first frame, each of the at least two non-contact coordinate measurement devices being coupled to a different portion of the second frame. 17. The method of claim 16 , wherein the acquiring of the 3D coordinates is performed when the second frame is moved. 18. The method of claim 17 , wherein the pose measurement device includes a camera operably coupled to at least one of the at least two non-contact coordinate measurement devices. 19. The method of claim 18 , wherein the at least two non-contact coordinate measurement devices are area scanners.

Assignees

Inventors

Classifications

  • using an image reference approach · CPC title

  • Vehicle exterior or interior · CPC title

  • using electromagnetic waves other than radio waves · CPC title

  • Range image; Depth image; 3D point clouds · CPC title

  • for mapping or imaging · CPC title

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What does patent US10663292B2 cover?
An inspection system for measuring an object is provided. The inspection system includes an entryway sized to receive the object. At least two non-contact coordinate measurement devices are positioned with a field of view being at least partially within or adjacent to the entryway, each of the at least two non-contact coordinate measurement devices being operable to measure 3D coordinates for a…
Who is the assignee on this patent?
Faro Tech Inc
What technology area does this patent fall under?
Primary CPC classification G01B11/2522. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 26 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).