Multi-function electronic device testing

Patent metadata

Field	Value
Publication number	US-10656206-B1
Application number	US-201715595312-A
Country	US
Kind code	B1
Filing date	May 15, 2017
Priority date	May 15, 2017
Publication date	May 19, 2020
Grant date	May 19, 2020

Abstract

A multi-function test machine includes a table assembly, a robotic arm, one or more stimulators, one or more sensors, and a computing device for testing electronic devices. The multi-function tester may also include a camera test assembly and a universal device holder. The multi-function tester is capable of testing multiple systems of an electronic device concurrently, thus obviating the need for multiple test stations and operators.

First claim

What is claimed is:

1. A multi-function tester comprising:
a table assembly comprising:
a fixture to hold an electronic device;
a first antenna to communicate with a wireless radio of the electronic device;

a robotic arm coupled to the table assembly, the robotic arm comprising:
at least one stimulator to stimulate an input of the electronic device; and
at least one sensor to receive an output from the electronic device, the at least one sensor comprising at least one of:
a still camera,
a video camera,
a light sensor,
a microphone,
an inertial sensor,
an optical sensor,
a laser scanner, or
a second antenna;

a camera test assembly that supports a chart at a position aligned with a camera of the electronic device, the chart including an image that is within a field of view of the camera of the electronic device, wherein image data captured by the camera of the electronic device depicts the image and is used to test a functionality of the electronic device;
an adjustable stand;
a relay lens coupled to the adjustable stand, the relay lens disposed within an optical path between the camera of the electronic device and the chart, wherein the relay lens is adjustable between the camera of the electronic device and the chart via the adjustable stand; and
a computing device communicatively coupled to the table assembly, the robotic arm, and the camera test assembly, the computing device comprising:
one or more processors;
a communication interface to communicate with the electronic device; and
memory storing a test procedure for the electronic device that, when executed by the one or more processors, causes the multi-function tester to concurrently test at least two of:
the wireless radio of the electronic device;
the camera of the electronic device based at least in part on the image data captured by the camera of the electronic device;
the input of the electronic device; or
the output of the electronic device.

2. The multi-function tester of claim 1 , further comprising an L-shaped bracket coupling the robotic arm to the table assembly, such that the robotic arm is disposed above a top of the table assembly, and wherein:
the at least one stimulator of the robotic arm comprises one or more of:
an electromagnet probe;
a touch screen probe;
a button press probe;
a speaker;
a light source; or
another antenna; and

the at least one sensor of the robotic arm comprises one or more of:
a microphone;
a camera; or
the another antenna.

3. The multi-function tester of claim 1 , wherein:
the camera test assembly further comprises a chart holder to hold the chart; and
the adjustable stand is configured to move the chart holder to position the chart at the position aligned with the camera of the electronic device.

4. The multi-function tester of claim 1 , wherein the table assembly further comprises:
a stationary frame having a substantially planar top surface;
a movable frame that is movable in at least one axis substantially parallel to the substantially planar top surface of the stationary frame; and
a rotatable plate coupled to, and movable with, the movable frame, wherein:
the fixture is mounted to the rotatable plate; and
the rotatable plate is rotatable about an axis parallel to the substantially planar top surface of the stationary frame to rotate the fixture and the electronic device 180 degrees.

5. The multi-function tester of claim 4 , wherein the rotatable plate includes one or more holes through which the camera of the electronic device captures the image data depicting the image.

6. A device comprising:
a table assembly configured to hold an electronic device;
one or more stimulators to stimulate one or more inputs of the electronic device;
one or more sensors to receive one or more outputs of the electronic device;
a communication interface to communicate with the electronic device;
a camera test assembly including:
a chart aligned with a camera of the electronic device; and
a relay lens interposed in an optical path between the chart and the camera of the electronic device, wherein the relay lens is configured to move via an adjustable stand;

one or more processors; and
memory storing instructions that, when executed by the one or more processors, cause the one or more processors to perform operations comprising concurrently testing the camera of the electronic device and multiple systems of the electronic device using at least one of the one or more stimulators or at least one of the one or more sensors.

7. The device of claim 6 , wherein:
the one or more stimulators comprises at least one of:
an electromagnet probe;
a touch screen probe;
a button press probe;
a loudspeaker;
a light source; or
an antenna; and

the one or more sensors comprises at least one of:
a microphone;
a camera;
a light sensor; or
an antenna.

8. The device of claim 6 , wherein the chart includes an image to test a functionality of the camera of the electronic device.

9. The device of claim 6 , wherein:
the camera test assembly further includes a chart holder to hold the chart; and
the adjustable stand is configured to move the chart holder to align the chart with the camera of the electronic device.

10. The device of claim 6 , wherein the table assembly includes:
a stationary frame having a substantially planar top surface;
a movable frame that is movable in at least one axis substantially parallel to the substantially planar top surface; and
a rotatable plate coupled to, and movable with, the movable frame, wherein the rotatable plate is rotatable about an axis parallel to the substantially planar top surface to rotate the electronic device 180 degrees.

11. The device of claim 6 , further comprising a robotic arm coupled to the table assembly, and wherein the robotic arm includes at least one of:
the one or more stimulators; or
the one or more sensors.

12. The device of claim 6 , wherein concurrently testing the multiple systems comprises concurrently testing at least two of:
a wireless radio of the electronic device;
a touch screen or a touch sensor of the electronic device;
a physical button of the electronic device;
an inertial sensor of the electronic device;
a magnetic sensor of the electronic device;
a light sensor of the electronic device;
a loudspeaker of the electronic device;
a microphone of the electronic device; or
a display of the electronic device.

13. The device of claim 6 , wherein the memory stores instructions that, when executed by the one or more processors, cause the one or more processors to perform operations comprising determining a test procedure for the electronic device based at least in part on a device type of the electronic device, and
wherein concurrently testing the camera of the electronic device and the multiple systems of the electronic device is based at least in part on the test procedure.

14. A system comprising:
a table assembly to hold an electronic device;
at least one stimulator to stimulate an input of the electronic device;
at least one sensor to receive an output of the electronic device;
a camera test assembly including:
a chart at a position aligned with a camera of the electronic device;
an adjustable stand; and
a relay lens coupled to the adjustable stand and configured to be positioned within an optical path between the camera of the electronic device and the chart; and

a computing device comprising:
one or more processors;
a communication interface to communicate with the electronic device; and
memory storing instructions that, when executed by the on

Assignees

• Amazon Tech Inc

Inventors

• Patil Prashanth Basavaraj
• De La Cruz San-Ching

Classifications

• G01R31/01 Primary

  Subjecting similar articles in turn to test, e.g. "go/no-go" tests in mass production; Testing objects at points as they pass through a testing station (testing of cables continuously passing the testing apparatus G01R31/59; testing dielectric strength or breakdown voltage G01R31/12) · CPC title

• G01R31/31908

  Tester set-up, e.g. configuring the tester to the device under test [DUT], down loading test patterns · CPC title

• G01R31/31905 Primary

  Interface with the device under test [DUT], e.g. arrangements between the test head and the DUT, mechanical aspects, fixture · CPC title

• G01R31/2834

  Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736) · CPC title