Measuring system and measuring method

US10648792B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10648792-B2
Application numberUS-201715713787-A
CountryUS
Kind codeB2
Filing dateSep 25, 2017
Priority dateSep 30, 2016
Publication dateMay 12, 2020
Grant dateMay 12, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A measuring system having a measuring tool which includes a probe body and an optical marker, a camera for recording image data of the measuring tool, and an evaluation and control unit which is configured to evaluate the image data recorded by the camera and use the data to determine spatial position coordinates of the optical marker. The evaluation and control unit is also configured to calculate the deformation of the measuring tool due to external mechanical loading acting on the measuring tool, and to determine spatial position coordinates of the probe body based on the spatial position coordinates of the optical marker and the calculated deformation.

First claim

Opening claim text (preview).

What is claimed is: 1. Measuring system comprising: a measuring tool that comprises a probe body and an optical marker; a camera for recording image data of the measuring tool; and an evaluation and control unit that is configured to evaluate the image data captured by the camera and to determine spatial position coordinates of the optical marker based on the image data, wherein: the evaluation and control unit is configured to calculate a deformation of the measuring tool due to external mechanical loading acting on the measuring tool, and to determine spatial position coordinates of the probe body based on the spatial position coordinates of the optical marker and the calculated deformation, the evaluation and control unit is configured to calculate the deformation of the measuring tool based on a mechanical substitute model, in which the measuring tool is modelled as a mechanical system that comprises at least two rigid bodies and a first elastic node that connects the two rigid bodies to one another, the deformation is modelled in the mechanical substitute model as a translation and/or rotation of the two rigid bodies in relation to one another and is calculated using the following equation: {right arrow over (u)}=N*{right arrow over (b)}, where {right arrow over (u)} is a deformation vector which describes the deformation of the measuring tool in vector notation, where {right arrow over (b)} describes the external mechanical loading in vector notation, where N is a compliance matrix that describes compliance properties of the first elastic node as a result of the external mechanical loading, and the spatial position coordinates of the probe body are calculated uisng the following equation: p → = p → s + M s * ( p N ⁢ ⁢ 1 → + f ⁡ ( u → , t N ⁢ ⁢ 1 → ) ) with ⁢ ⁢ u → = ( v 0 ⁢ ⁢ x v 0 ⁢ ⁢ y v 0 ⁢ ⁢ z δ rx δ ry δ rz ) , ⁢ where f ⁡ ( u → , t N ⁢ ⁢ 1 → ) = R z ⁡ ( δ rz ) * R y ⁡ ( δ

Assignees

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Classifications

  • Marker · CPC title

  • G01B5/008Primary

    using coordinate measuring machines · CPC title

  • using feature-based methods · CPC title

  • for measuring two or more coordinates · CPC title

  • G01B11/007Primary

    feeler heads therefor · CPC title

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What does patent US10648792B2 cover?
A measuring system having a measuring tool which includes a probe body and an optical marker, a camera for recording image data of the measuring tool, and an evaluation and control unit which is configured to evaluate the image data recorded by the camera and use the data to determine spatial position coordinates of the optical marker. The evaluation and control unit is also configured to calcu…
Who is the assignee on this patent?
Zeiss Carl Industrielle Messtechnik Gmbh
What technology area does this patent fall under?
Primary CPC classification G01B5/008. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue May 12 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 2 related publications on this page (citations in our corpus or others sharing the same primary CPC).