Magnetic memory device
US-2018269386-A1 · Sep 20, 2018 · US
US10644228B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10644228-B2 |
| Application number | US-201816178082-A |
| Country | US |
| Kind code | B2 |
| Filing date | Nov 1, 2018 |
| Priority date | Nov 14, 2017 |
| Publication date | May 5, 2020 |
| Grant date | May 5, 2020 |
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Provided is a spin-orbit-torque magnetization rotational element that suppresses re-adhesion of impurities during preparation and allows a write current to easily flow. The spin-orbit-torque magnetization rotational element includes a spin-orbit torque wiring that extends in a first direction, and a first ferromagnetic layer that is located on a side of one surface of the spin-orbit torque wiring. A side surface of the spin-orbit torque wiring and a side surface of the first ferromagnetic layer form a continuous inclined surface in any side surface.
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The invention claimed is: 1. A spin-orbit-torque magnetization rotational element, comprising: a spin-orbit torque wiring that extends in a first direction; and a first ferromagnetic layer that is located on a side of one surface of the spin-orbit torque wiring, wherein a side surface of the spin-orbit torque wiring and a side surface of the first ferromagnetic layer form a continuous inclined surface in any side surface, and an inclination angle of a first inclined surface including a first side surface of the spin-orbit torque wiring and a first side surface of the first ferromagnetic layer in the first direction with respect to a lamination direction is greater than an inclination angle of a second inclined surface including a second side surface of the spin-orbit torque wiring and a second side surface of the first ferromagnetic layer, which intersect the first direction, with respect to the lamination direction. 2. The spin-orbit-torque magnetization rotational element according to claim 1 , wherein an inclination angle of a first inclined surface including the first side surface of the spin-orbit torque wiring and the first side surface of the first ferromagnetic layer in the first direction with respect to the lamination direction is 45° or greater. 3. The spin-orbit-torque magnetization rotational element according to claim 2 , further comprising: two via wirings extending from a surface of the spin-orbit torque wiring which is opposite to the first ferromagnetic layer, wherein the two via wirings are located at positions at which the first ferromagnetic layer is sandwiched when viewed from the lamination direction, and partially overlap the first ferromagnetic layer. 4. The spin-orbit-torque magnetization rotational element according to claim 2 , further comprising: an underlayer between the spin-orbit torque wiring and the first ferromagnetic layer, wherein side surfaces of the spin-orbit torque wiring, the first ferromagnetic layer, and the underlayer form a continuous inclined surface in any side surface. 5. The spin-orbit-torque magnetization rotational element according to claim 1 , further comprising: two via wirings extending from a surface of the spin-orbit torque wiring which is opposite to the first ferromagnetic layer, wherein the two via wirings are located at positions at which the first ferromagnetic layer is sandwiched when viewed from the lamination direction, and partially overlap the first ferromagnetic layer. 6. The spin-orbit-torque magnetization rotational element according to claim 5 , further comprising: an underlayer between the spin-orbit torque wiring and the first ferromagnetic layer, wherein side surfaces of the spin-orbit torque wiring, the first ferromagnetic layer, and the underlayer form a continuous inclined surface in any side surface. 7. The spin-orbit-torque magnetization rotational element according to claim 1 , further comprising: an underlayer between the spin-orbit torque wiring and the first ferromagnetic layer, wherein side surfaces of the spin-orbit torque wiring, the first ferromagnetic layer, and the underlayer form a continuous inclined surface in any side surface. 8. A spin-orbit-torque magnetization rotational element, comprising: a spin-orbit torque wiring that extends in a first direction; a first ferromagnetic layer that is located on a side of one surface of the spin-orbit torque wiring, and an underlayer between the spin-orbit torque wiring and the first ferromagnetic layer, wherein a side surface of the spin-orbit torque wiring and a side surface of the first ferromagnetic layer form a continuous inclined surface in any side surface, and wherein the underlayer is amorphous. 9. A spin-orbit-torque magnetization rotational element, comprising: a spin-orbit torque wiring that extends in a first direction; a first ferromagnetic layer that is located on a side of one surface of the spin-orbit torque wiring, and a magnetization control layer between the spin-orbit torque wiring and the first ferromagnetic layer, wherein a side surface of the spin-orbit torque wiring and a side surface of the first ferromagnetic layer form a continuous inclined surface in any side surface, side surfaces of the spin-orbit torque wiring, the first ferromagnetic layer, and the magnetization control layer form a continuous inclined surface in any side surface, and a crystal structure of the magnetization control layer is tetragonal.
the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ] · CPC title
Writing or programming circuits or methods · CPC title
using Hall-effect devices · CPC title
Cell access · CPC title
details concerning the memory cell structure, e.g. the layers of the ferromagnetic memory cell · CPC title
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