ADC self-test using time base and current source

Patent metadata

Field	Value
Publication number	US-10637494-B2
Application number	US-201816176170-A
Country	US
Kind code	B2
Filing date	Oct 31, 2018
Priority date	Nov 2, 2017
Publication date	Apr 28, 2020
Grant date	Apr 28, 2020

Abstract

A constant current source, a stable time base and a capacitor are used to self-check operation of an analog-to-digital convertor (ADC) by charging the capacitor for a pre-determined amount of time to produce a voltage thereon. This voltage will be proportional to the amount of time that the capacitor was charged. Multiple points on the ADC transfer function can be verified in this self-check procedure simply by varying the amount of time for charging of the capacitor. Relative accuracy among test points may then be easily obtained. Absolute accuracy may be obtained by using an accurate clock reference for the time base, a known current source and capacitor value.

First claim

What is claimed is:

1. A method for self-testing an analog-to-digital converter (ADC) in a microcontroller comprising a processor, said method comprising the steps of:
coupling a constant current source to a discharged capacitor for a time period;
converting a voltage on the capacitor after the time period to a digital value with the ADC;
comparing by the processor the digital value from the ADC to the voltage on the capacitor represented by the equation V=I/C*t, where V is the voltage on the capacitor, I is the constant current, C is the capacitance of the capacitor and t is the time period, and
repeating said previous steps for different time periods and determine proper operation of the ADC by the processor when the digital values provided by the ADC produce a linear response.

2. The method according to claim 1 , further comprising the steps of:
a) setting the time period to a minimum time;
b) discharging the capacitor;
c) coupling the capacitor for the time period to the constant current source having a current value I;
d) converting the voltage on the capacitor to a digital value with the ADC after the time period ends;
e) storing the digital value of that time period in a memory;
f) ending the testing of the ADC when the time period is equal to or greater than a maximum time then going to step i);
g) increasing the time period to a longer time;
h) returning to step b); and
i) determining ADC accuracy by evaluating the stored digital values.

3. The method according to claim 2 , wherein the step of determining ADC linearity comprises the steps of comparing the stored digital values with the respective time periods multiplied by the current value I and divided by a capacitance C of the capacitor.

4. The method according to claim 2 , further comprising the step of evaluating the stored digital values to determine ADC linearity.

5. The method according to claim 1 , further comprising the steps of:
a) setting the time period to a maximum time;
b) discharging the capacitor;
c) coupling the capacitor for the time period to the constant current source having a current value I;
d) converting the voltage on the capacitor to a digital value with the ADC after the time period ends;
e) storing the digital value of that time period in a memory;
f) ending the testing of the ADC when the time period is less than or equal to a minimum time then going to step i);
g) decreasing the time period to a shorter time;
h) returning to step b); and
i) determining ADC accuracy by evaluating the stored digital values.

6. The method according to claim 5 , wherein the step of determining ADC accuracy comprises the steps of comparing the stored digital values with the respective time periods multiplied by the current value I and divided by a capacitance C of the capacitor.

7. The method according to claim 5 , wherein the capacitor has a value of 5 picofarad and the current source generates a current of 1 uA.

8. An apparatus to self-test an analog-to-digital converter (ADC), comprising:
a constant current source;
a capacitor;
a first switch operable to short out a charge on the capacitor;
a second switch operable to couple the constant current source to the capacitor;
an ADC having an input coupled to the capacitor; and
a control circuit having a timer;
wherein the control circuit is configured to generate a voltage on the capacitor by:
closing the first switch thereby shorting out any charge on the capacitor,
opening the first switch and closes the second switch thereby coupling the constant current source to the capacitor, and
opening the second switch after a time period determined by the timer; and

a memory for storing a digital value from an output of the ADC of a voltage on the capacitor after the second switch opens, wherein the control circuit is configured to repeat generating a voltage on the capacitor for different time periods and respective digital values from the output of the ADC are stored in the memory wherein the apparatus is further configured to determine proper operation of the ADC when the digital values provided by the ADC produce a linear response.

9. The apparatus according to claim 8 , wherein the capacitor has a value of 5 picofarad and the current source generates a current of 1 uA.

10. The apparatus according to claim 8 , wherein the second switch is a tri-state output of the constant current source.

11. The apparatus according to claim 8 , wherein the timer is programmable for generating different time periods.

12. The apparatus according to claim 8 , further comprising a high accuracy clock coupled to the timer for generating a precision time period.

13. A microcontroller comprising self-testing functionality of an analog-to-digital converter (ADC) within said microcontroller, said microcontroller comprising:
a clock;
a control circuit having a timer and coupled to the clock;
a microprocessor coupled to the control circuit;
a memory coupled to the microprocessor;
a constant current source;
a capacitor;
a first switch controlled by the control circuit and operable to short out a charge on the capacitor;
a second switch controlled by the control circuit and operable to couple the constant current source to the capacitor; and
an ADC having an input coupled to the capacitor and an output coupled to the microprocessor;
wherein the control circuit is configured to charge the capacitor by
closing the first switch thereby shorting out any charge on the capacitor,
opening the first switch and closes the second switch thereby coupling the constant current source to the capacitor, and
opening the second switch after a time period determined by the timer; and

the microprocessor is configured to store in the memory a digital representation from the ADC of a voltage on the capacitor after the second switch opens, wherein the microcontroller is configured to repeat charging the capacitor and storing digital representations of the voltage on the capacitor by the ADC and to determine proper operation of the ADC when the digital representations produce a linear response.

14. The microcontroller according to claim 13 , wherein the second switch is a tri-state output of the constant current source.

15. The microcontroller according to claim 13 , wherein the capacitor has a value of 5 picofarad and the current source generates a current of 1 uA.

16. The microcontroller according to claim 13 , wherein the timer is programmable for generating different time periods.

17. The microcontroller according to claim 13 , wherein the clock is a high accuracy clock for generating a precision time period.

Assignees

• Microchip Tech Inc

Inventors

• Bartling James E
• Bowling Stephen

Classifications

• G01R31/2834

  Automated test systems [ATE]; using microprocessors or computers (G01R31/317 takes precedence; ATE for detection of defective computer hardware G06F11/2736) · CPC title

• H03M1/12

  Analogue/digital converters ({H03M1/001 – } H03M1/10 take precedence) · CPC title

• H03M1/1009

  Calibration · CPC title

• H03M1/10

  Calibration or testing · CPC title

• H03M1/00

  Analogue/digital conversion; Digital/analogue conversion (conversion of analogue values to or from differential modulation H03M3/00) · CPC title