Electrical meter probe contact verification system

US10634732B2 · US · B2

Patent metadata
FieldValue
Publication numberUS-10634732-B2
Application numberUS-201715675456-A
CountryUS
Kind codeB2
Filing dateAug 11, 2017
Priority dateAug 11, 2017
Publication dateApr 28, 2020
Grant dateApr 28, 2020

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  1. Title

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  2. Abstract

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  3. Assignees and inventors

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  4. Key dates

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  5. First independent claim

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  6. CPC / IPC classifications

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  7. Citations and related patents

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Abstract

Official abstract text for this publication.

A system and method verifies continuity with and measures voltage across a circuit under test (in some instances simultaneously) using two or more test probes. Two or more probe continuity circuits measure continuity through the test probes by injecting a test current through and measuring a processed test current received at each of the plurality of test probes. The probe continuity circuits measure the respective processed test current rendered by the test current flowing through the test circuit at each test probe. A voltmeter measures the potential difference across the test probes.

First claim

Opening claim text (preview).

What is claimed is: 1. A system that verifies continuity with a circuit and a plurality of test probes while measuring a potential difference across a plurality of voltmeter probes, a plurality of test probes, and a plurality of nodes comprising: a plurality of probe continuity circuits coupled to different nodes between a test probe and a voltmeter probe; a power source coupled to a momentary switch that injects a test current through current limiting resistors coupled to the plurality of nodes; wherein the plurality of probe continuity circuits that simultaneously measures continuity through current flowing through the plurality of nodes; by injecting a test current through each of the plurality of test probes and measuring the test current via the plurality of voltmeter probes in response to the injection received through each test probe; and wherein a voltmeter coupled to the plurality of probe continuity circuits for measuring the potential difference across the plurality of voltmeter probes during the injecting of the test current. 2. The system of 1 where the plurality of test probes comprises a plurality of probes that each have dual contacts. 3. The system claim 2 where continuity is derived by measuring the injected test current through the dual contacts. 4. The system of claim 2 where continuity is established when the resistance between the dual contacts is one-hundred ohms or less. 5. The system of claim 1 where the injected current comprises a programmable test current. 6. The system of claim 1 where continuity is measured individually as each test probe comes into electrical contact with the circuit. 7. The system of claim 1 where each of the plurality of test probes includes a tactile stimulator that generates a vibration perceptible to a human touch when continuity is established at each test probe. 8. The system of claim 1 where the voltmeter is configured to measure a potential difference while current is injected into the circuit. 9. A machine-readable medium encoded with machine-executable instructions for monitoring a plurality of nodes via a plurality of test probes, wherein execution of the machine-executable instructions is for: Controlling a plurality of probes continuity circuits coupled to different nodes between a test probe and a voltmeter probe; Injecting a test current through current limiting resistors coupled to the plurality of nodes sourced through a power source coupled to a momentary switch; simultaneously measuring continuity through the plurality of probe continuity circuits and current flowing through the plurality of nodes by injecting a test current through each of the plurality of test probes and measuring the test current via a plurality of voltmeter probes in response to the injection received through each test probe; and measuring a potential difference across the plurality of voltmeter probes during the injecting of the test current. 10. The machine-readable medium of claim 9 where each one of the test probes in the plurality of test probes comprises a pair of dual contacts. 11. The machine-readable medium of claim 10 where continuity is derived by measuring the injected test current through the dual contacts. 12. The machine-readable medium of claim 10 where continuity is established when the resistance between the dual contacts is one-hundred ohms or less. 13. The machine-readable medium of claim 9 where the injected current comprises a programmable test current. 14. The machine-readable medium of claim 9 where continuity is measured individually as each test probe comes in contact with a circuit. 15. The machine-readable medium of claim 9 where each of the plurality of test probes includes or responds to machine-executable instructions that generates a vibration perceptible to a human touch as continuity is established at each test probe. 16. The machine-readable medium of claim 9 where the potential difference across the plurality of voltmeter probes is measured simultaneously as current is injected into a circuit.

Assignees

Inventors

Classifications

  • Spring-loaded · CPC title

  • Multiple probes · CPC title

  • Testing for short-circuits, leakage current or ground faults · CPC title

  • G01R31/50Primary

    Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections (testing of sparking plugs H01T13/58) · CPC title

  • G01R31/54Primary

    Testing for continuity · CPC title

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Frequently asked questions

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What does patent US10634732B2 cover?
A system and method verifies continuity with and measures voltage across a circuit under test (in some instances simultaneously) using two or more test probes. Two or more probe continuity circuits measure continuity through the test probes by injecting a test current through and measuring a processed test current received at each of the plurality of test probes. The probe continuity circuits m…
Who is the assignee on this patent?
Ut Battelle Llc
What technology area does this patent fall under?
Primary CPC classification G01R31/50. Mapped technology areas include Physics.
When was this patent published?
Publication date Tue Apr 28 2020 00:00:00 GMT+0000 (Coordinated Universal Time) (B2). Legal status and post-grant events are not shown on this page.
What related patents are in patentsdb?
We list 8 related publications on this page (citations in our corpus or others sharing the same primary CPC).