Imaging System with Ancillary Image Detector for Sample Location
US-2017276924-A1 · Sep 28, 2017 · US
US10634614B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10634614-B2 |
| Application number | US-201816110333-A |
| Country | US |
| Kind code | B2 |
| Filing date | Aug 23, 2018 |
| Priority date | Sep 1, 2017 |
| Publication date | Apr 28, 2020 |
| Grant date | Apr 28, 2020 |
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Devices and methods are disclosed for the substantially uniform epi-illumination of samples such as western blots using high power lasers. The uniformity of illumination is provided by particular configurations of optical diffusers, spatial or temporal laser modalities, or numbers of lasers. The increased excitation light produced by the high power lasers can enhance fluorescence emission signal strength and reduce required imaging exposure times.
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What is claimed is: 1. An epi-illuminator for a sample, the epi-illuminator comprising: a planar platform having a sample side configured to support the sample, wherein the sample side has an area within the range from 10 cm 2 to 500 cm 2 ; an excitation light source comprising a laser and an optical diffuser, wherein the excitation light source is configured to illuminate the area of the planar platform sample side with substantially uniform intensity without a collimation lens, wherein the optical diffuser is mounted above the planar platform and positioned between the laser and the planar platform along an optical path of the laser, and wherein the laser has a power within the range from 5 W to 500 W; and a sensor configured to detect fluorescence emission light emitting from the sample, wherein the fluorescence emission light has a fluorescence emission wavelength, and wherein the excitation light does not comprise excitation light having the fluorescence emission wavelength. 2. The epi-illuminator of claim 1 , wherein the optical diffuser is a holographic diffuser having a diffusing half angle within the range from 3 degrees to 70 degrees. 3. The epi-illuminator of claim 1 , wherein the optical diffuser is a ground glass diffuser or an engineered microlens array. 4. The epi-illuminator of claim 1 , wherein the laser has a power within the range from 10 W to 80 W. 5. The epi-illuminator of claim 1 , wherein the laser is a semiconductor vertical-cavity surface-emitting laser (VCSEL) array or an edge emitting semiconductor laser array. 6. The epi-illuminator of claim 1 , wherein the laser has two or more spatial or longitudinal modes. 7. The epi-illuminator of claim 1 , wherein the excitation light has a wavelength within the range from 640 nm to 850 nm. 8. The epi-illuminator of claim 1 , wherein the excitation light source comprises two or more lasers or laser arrays, and wherein each of the two or more lasers or laser arrays has a power within the range from 5 W to 500 W. 9. An epi-illuminator for a sample, the epi-illuminator comprising: a planar platform having a sample side configured to support the sample, wherein the sample side has an area within the range from 10 cm 2 to 500 cm 2 ; an excitation light source mounted above the planar platform, wherein the excitation light source is configured to illuminate the area of the planar platform sample side with substantially uniform light intensity without a collimation lens, wherein the excitation light source comprises five or more lasers, and wherein the excitation light source has a total power of greater than 5 W; and a sensor configured to detect fluorescence emission light emitting from the sample, wherein the fluorescence emission light has a fluorescence emission wavelength, and wherein the excitation light does not comprise excitation light having the fluorescence emission wavelength. 10. The epi-illuminator of claim 9 , wherein the excitation light source comprises ten or more lasers. 11. The epi-illuminator of claim 9 , wherein the excitation light source comprises 100 or more lasers, and wherein each of the 100 or more lasers has a power of less than 100 mW. 12. The epi-illuminator of claim 9 , wherein the excitation light source is a semiconductor VCSEL array or wherein each of the lasers is an edge emitting semiconductor laser. 13. The epi-illuminator of claim 9 , wherein each of the lasers has a power within the range from 5 W to 50 W. 14. The epi-illuminator of claim 9 , wherein each of the lasers has two or more spatial or longitudinal modes. 15. The epi-illuminator of claim 9 , wherein the excitation light has a wavelength within the range from 640 nm to 850 nm. 16. A method for imaging a sample, the method comprising: providing an epi-illuminator comprising: a planar platform having a sample side configured to support the sample, wherein the sample side has an area within the range from 10 cm 2 to 500 cm 2 ; an excitation light source comprising a laser and an optical diffuser, wherein the excitation light source is configured to illuminate the area of the planar platform sample side with substantially uniform intensity without a collimation lens, wherein the optical diffuser is mounted above the planar platform and positioned between the laser and the planar platform along an optical path of the laser, and wherein the laser has a power within the range from 5 W to 500 W; and a sensor configured to detect fluorescence emission light emitting from the sample, wherein the fluorescence emission light has a fluorescence emission wavelength, and wherein the excitation light does not comprise excitation light having the fluorescence emission wavelength; placing the sample on the planar platform; illuminating the sample with light produced by the excitation light source; and detecting, using the sensor, fluorescence emission light emitting from the sample. 17. The method of claim 16 , wherein the optical diffuser is a holographic diffuser having a diffusing half angle within the range from 3 degrees to 70 degrees. 18. The method of claim 16 , wherein the laser has a power within the range from 10 W to 80 W.
the surface having a regular structure · CPC title
adapted for ultraviolet illumination {; Fluorescence microscopes (G02B21/0076 takes precedence)} · CPC title
Optics · CPC title
Spatial resolved fluorescence measurements; Imaging · CPC title
the surface having an irregular structure (G02B5/0226 takes precedence) · CPC title
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