Solid-state image sensing apparatus, control method, and electronic device
US-10250836-B2 · Apr 2, 2019 · US
US10630930B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10630930-B2 |
| Application number | US-201916439567-A |
| Country | US |
| Kind code | B2 |
| Filing date | Jun 12, 2019 |
| Priority date | Dec 15, 2014 |
| Publication date | Apr 21, 2020 |
| Grant date | Apr 21, 2020 |
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The present disclosure relates to a solid-state image sensing apparatus, a control method, and an electronic device capable of reducing a settling time of a vertical signal line at the time of a read operation of pixels. A column processing unit A/D converts pixel signals of a plurality of pixels. A vertical signal line feeds the pixel signals output from the pixels to the A/D converter. A pull-up circuit increases a potential of the vertical signal line at the time of starting a read operation of the pixels. For example, the present disclosure can be applied to a CMOS (Complementary Metal-Oxide Semiconductor) image sensor that performs an interleaving operation or the like.
Opening claim text (preview).
The invention claimed is: 1. An imaging device comprising: a first pixel including a first photoelectric converter and a first plurality of transistors; a first signal line coupled to the first pixel; a first current source coupled to the first signal line; and a first transistor and a second transistor connected in series between the first signal line and a fixed potential, wherein the first transistor receives a control signal and functions as a switch and wherein the second transistor receives a predetermined potential and functions as a comparator to increase a potential of the first signal line when the potential of the first signal line is less than the predetermined potential. 2. The imaging device comprising according to claim 1 , further comprising: a second pixel including a second photoelectric converter and a second plurality of transistors; a third signal line coupled to the second pixel; a fourth signal line coupled to the third signal line; a second current source coupled to the fourth signal line; a second comparator coupled to the third signal line; a third transistor and a fourth transistor between the second signal line and the fixed potential. 3. The imaging device comprising according to claim 2 , further comprising a fifth transistor coupled to the second signal line and the fourth signal line. 4. The imaging device comprising according to claim 2 , wherein the third transistor and the fourth transistor are connected in series.
involving a correlated sampling function, e.g. correlated double sampling [CDS] or triple sampling · CPC title
Electricity · mapped topic
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