Magnetoresistive effect devices having enhanced magnetic anisotropy
US-9564581-B1 · Feb 7, 2017 · US
US10629801B2 · US · B2
| Field | Value |
|---|---|
| Publication number | US-10629801-B2 |
| Application number | US-201815943048-A |
| Country | US |
| Kind code | B2 |
| Filing date | Apr 2, 2018 |
| Priority date | May 31, 2017 |
| Publication date | Apr 21, 2020 |
| Grant date | Apr 21, 2020 |
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A laminated structure includes a ferromagnetic layer, a multiferroic layer provided on one surface of the ferromagnetic layer, and a ferroelectric layer which is provided on the multiferroic layer opposite to the ferromagnetic layer and has a permittivity greater than that of the multiferroic layer.
Opening claim text (preview).
What is claimed is: 1. A laminated structure comprising: a ferromagnetic layer; a multiferroic layer provided on one surface of the ferromagnetic layer; and a ferroelectric layer provided on the multiferroic layer opposite to the ferromagnetic layer, wherein the ferroelectric layer has a permittivity greater than a permittivity of the multiferroic layer. 2. The laminated structure according to claim 1 , wherein a sum of thicknesses of the multiferroic layer and the ferroelectric layer is 10 nm or more and 1000 nm or less. 3. The laminated structure according to claim 1 , wherein the thickness of the multiferroic layer is 5 nm or more and 500 nm or less. 4. The laminated structure according to claim 1 , wherein the thickness of the ferroelectric layer is 5 nm or more and 500 nm or less. 5. The laminated structure according to claim 1 , wherein the ferroelectric layer has a relative permittivity of 10 or more. 6. The laminated structure according to claim 1 , wherein the ferroelectric layer is La x Sr 1-x MnO 3 (0≤x≤1), Ba x Sr 1-x TiO 3 (0≤x≤1), or PbZr x Ti 1-x O 3 (0≤x≤1). 7. The laminated structure according to claim 1 , wherein the ferromagnetic layer is a half-metal. 8. The laminated structure according to claim 1 , wherein the ferromagnetic layer includes a Heusler alloy represented by a composition formula of X 2 YZ, where X is a transition metal element or a noble metal element of the Co, Fe, Ni or Cu group on the periodic table, Y is a transition metal of the Mn, V, Cr or Ti group or an element type of X, and Z is a typical element of groups III to V. 9. The laminated structure according to claim 1 , wherein the multiferroic layer includes any one selected from the group consisting of BiFeO 3 , BiMnO 3 , GaFeO 3 , AlFeO 3 , (Ga, Al)FeO 3 , YMnO 3 , CuFeO 2 , Cr 2 O 3 , Ni 3 Bi 7 O 13 I, LiMnPO 4 , Y 3 Fe 5 O 12 , TbPO 4 , and LiCoPO 4 . 10. A spin modulation element comprising: the laminated structure according to claim 1 ; and a nonmagnetic layer and a second ferromagnetic layer sequentially laminated on the ferromagnetic layer of the laminated structure. 11. The laminated structure according to claim 1 , further comprising an electrode provided on the ferroelectric layer opposite to the multiferroic layer. 12. The spin modulation element according to claim 10 , further comprising an electrode provided on the ferroelectric layer opposite to the multiferroic layer.
Half-metallic, e.g. epitaxial CrO2 or NiMnSb films · CPC title
the spacer being semiconducting or insulating, e.g. for spin tunnel junction [STJ] · CPC title
anisotropic magnetoresistance sensors · CPC title
Perovskites · CPC title
Electricity · mapped topic
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