Imaging mass spectrometer

Patent metadata

Field	Value
Publication number	US-10629425-B2
Application number	US-201615776585-A
Country	US
Kind code	B2
Filing date	Nov 16, 2016
Priority date	Nov 16, 2015
Publication date	Apr 21, 2020
Grant date	Apr 21, 2020

Abstract

A time-of-flight mass spectrometer is disclosed comprising ion optics that map an array of ions at an ion source array ( 71 ) to a corresponding array of positions on a position sensitive ion detector ( 79 ). The ion optics include at least one gridless ion mirror ( 76 ) for reflecting ions, which may compensate for various aberrations and allows the spectrometer to have relatively high mass and spatial resolutions.

First claim

The invention claimed is:

1. A time-of-flight mass spectrometer comprising:
an ion source array for supplying or generating ions at an array of positions;
a position sensitive ion detector having an array of separate detection regions configured such that ions received at different ones of the detection regions are determined as having originated from different positions in said array of positions; and
ion optics arranged and configured to guide ions from the ion source array to the position sensitive detector so as to map ions from the array of positions on the ion source array to an array of positions on the position sensitive detector;
wherein the ion optics includes at least two ion mirrors for reflecting ions, at least one of which is a gridless ion mirror; wherein said two ion mirrors are spaced apart from each other in a first dimension (X-dimension) and are each elongated in a second dimension (Z-dimension) or along a longitudinal axis that is orthogonal to the first dimension; and wherein the spectrometer is configured such that the ions drift in the second dimension (Z-dimension) or along the longitudinal axis towards the detector as they are reflected between the mirrors;
further comprising an ion introduction mechanism for introducing packets of ions into the space between the mirrors such that they travel along a trajectory that is arranged at an angle to the first and second dimensions such that the ions repeatedly oscillate in the first dimension (X-dimension) between the mirrors as they drift through said space in the second dimension (Z-dimension).

2. The spectrometer of claim 1 , wherein the step of mapping ions from the array of positions on the ion source array to the array of positions on the position sensitive detector comprises mapping ions from a 2D array of positions on the ion source array to a corresponding 2D array of positions on the position sensitive detector.

3. The spectrometer of claim 1 , wherein said ion optics, including the at least two ion mirrors, are arranged and configured such that the ions are reflected by each of the mirrors and between the mirrors a plurality of times before reaching the detector.

4. The spectrometer of claim 1 , wherein the ion introduction mechanism comprises an orthogonal ion accelerator for orthogonally accelerating ions into one of the ion mirrors.

5. The spectrometer of claim 1 , wherein the ion optics comprise one or more ion optical lens through which the ions pass, in use, for focusing ions in a plane defined by the first and second dimensions (X-Z plane).

6. The spectrometer of claim 1 , wherein the ion source array comprises a target plate and an ionizing device for generating at least one primary ion beam, at least one laser beam, or at least one electron beam for ionizing one or more analytical samples located on the target plate at said array of positions.

7. The spectrometer of claim 6 , wherein the ionizing device is configured to direct one of the primary ion beams, laser beams or electron beams at each position in said array of positions at the ion source array; or
wherein said at least one primary ion beam, at least one laser beam or at least one electron beam is continuously scanned or stepped between different positions of said array of positions on the target plate; or
wherein each position of the different positions of said array of positions on the target plate comprises an area, and wherein said at least one primary ion beam, at least one laser beam or at least one electron beam is continuously scanned or stepped across different portions of said area.

8. The spectrometer of claim 1 , wherein the ion source array comprises a single ion source for generating ions and an ion divider for dividing or guiding the ions generated by the ion source to the array of positions on the ion source array.

9. The spectrometer of claim 1 , further comprising an electrostatic sector for guiding ions from the ion source array downstream towards the ion mirrors; and/or comprising an electrostatic sector for guiding ions from the ion mirrors downstream towards the detector.

10. The spectrometer of claim 1 , further comprising an array of quadrupoles, ion guides or ion traps configured so that ions generated or supplied at different positions, in said array of positions on the ion source array, are transmitted into different quadrupoles, ion guides or ion traps in said array of quadrupoles, ion guides or ion traps.

11. The spectrometer of claim 10 , wherein the spectrometer is configured to apply electrical potentials at the exits of the quadrupoles, ion guides or ion traps so as to trap and release ions from the quadrupoles, ion guides or ion traps in a pulsed manner downstream towards the detector.

12. The spectrometer of claim 1 , wherein the ion source array comprises an ion source and an ion guide configured to receive ions from the ion source and to guide ions received from the ion source at different times to different positions in said array of positions at the ion source.

13. The spectrometer of claim 12 , wherein an ion separator is provided between the ion source and ion guide for separating ions according to a physicochemical property such that ions having different values of said physicochemical property are guided to different positions in said array of positions at the ion source.

14. The spectrometer of claim 1 , further comprising a fragmentation or reaction device downstream of the ion source array for fragmenting the ions to produce fragment ions or for reacting the ions with reagent ions or molecules so as to form product ions; and wherein said detector or another detector is provided to detect the fragment or product ions.

15. The spectrometer of claim 14 , wherein the spectrometer is configured to repeatedly switch the fragmentation or reaction device between a first fragmentation or reaction mode that provides a high level of fragmentation or reaction and a second fragmentation or reaction mode that provides a lower level or no fragmentation or reaction, during a single experimental run; and/or
wherein the spectrometer is configured to repeatedly switch between a first mode in which ions are fragmented or reacted in the fragmentation or reaction device and a second mode in which ions bypass the fragmentation or reaction device, during a single experimental run.

16. A time-of-flight mass spectrometer comprising:
an ion source array for supplying or generating ions at an array of positions;
a position sensitive ion detector having an array of separate detection regions configured such that ions received at different ones of the detection regions are determined as having originated from different positions in said array of positions; and
ion optics arranged and configured to guide ions from the ion source array to the position sensitive detector so as to map ions from the array of positions on the ion source array to an array of positions on the position sensitive detector;
wherein the ion optics include a gridless ion mirror for reflecting ions and an electrostatic or magnetic sector for receiving ions and guiding the ions into the gridless ion mirror; wherein the gridless ion mirror and the electrostatic or magnetic sector are configured such that the ions are transmitted from the electrostatic or magnetic sector into the ion mirror a plurality of times such that the ions are reflected by said ion mirror a plurality of times.

17. A method of time-of-flight mass spectrometry comprising:
providing a time-of-flight mass spectrometer as claimed in claim 16 ;
supplying or generating ions at an

Assignees

• Micromass Ltd
• Leco Corp

Inventors

• Hoyes John Brian
• Verenchikov Anatoly
• Yavor Mikhail
• Richardson Keith
• Wildgoose Jason

Classifications

• H01J49/0409

  Sample holders or containers (containers for retaining a material to be analyzed, B01L3/50, for DNA, C12Q1/6834, for biological materials, G01N33/543) · CPC title

• H01J49/0004

  Imaging particle spectrometry · CPC title

• H01J49/009

  Spectrometers having multiple channels, parallel analysis · CPC title

• H01J49/405 Primary

  characterised by the reflectron, e.g. curved field, electrode shapes · CPC title

• H01J49/322

  with a magnetic sector of 90 degrees, e.g. Mattauch-Herzog type · CPC title