Methods and apparatus for spin wave-based spectrum analyzers

Patent metadata

Field	Value
Publication number	US-10613129-B2
Application number	US-201715439639-A
Country	US
Kind code	B2
Filing date	Feb 22, 2017
Priority date	Feb 22, 2016
Publication date	Apr 7, 2020
Grant date	Apr 7, 2020

Abstract

An example device includes a magnetic film, two or more spin wave generators, and one or more detectors. The magnetic film is capable of supporting spin waves. The two or more spin wave generators are operable to create a diffraction pattern of the spin waves in the magnetic film. The two or more spin wave generators generate the spin waves based on a source signal. The one or more detectors are operable to measure an amplitude of the spin waves in the diffraction pattern. The amplitude measured by a particular detector is indicative of a property of the source signal.

First claim

We claim:

1. A device comprising:
a magnetic film having a concave patterned edge, wherein the concave patterned edge forms an arc having a first radius;
an antenna disposed laterally adjacent to the concave patterned edge and substantially coplanar with the magnetic film, wherein the antenna is operable to generate a magnetic field based on a source signal that interacts with at least the concave patterned edge of the magnetic film to produce spin waves in the magnetic film; and
at least one sensor on the magnetic film positioned substantially at a particular location along a circumference of a Rowland circle having a second radius, wherein the first radius is greater than the second radius, and wherein the at least one sensor is operable to measure at least one physical property of the magnetic film at the particular location.

2. The device of claim 1 , wherein the particular location along the circumference of the Rowland circle is associated with a known wavelength, and wherein an amplitude of the at least one physical property is proportionate to an amplitude of the known wavelength of the source signal.

3. The device of claim 1 , wherein the at least one sensor is a loop antenna disposed vertically adjacent to the particular location, wherein the spin waves produce an oscillating magnetic field, and wherein the at least one physical property includes a voltage induced in the loop antenna by the oscillating magnetic field.

4. The device of claim 1 , wherein the at least one physical property includes a spin wave amplitude measured at the particular location of the magnetic film.

5. The device of claim 1 , further comprising:
a signal generator electrically coupled to the antenna and operable to generate the source signal, wherein the source signal is alternating current that causes the antenna to generate the magnetic field.

6. The device of claim 1 , wherein the magnetic film is formed from a ferromagnetic material.

7. The device of claim 1 , wherein the antenna is a microstrip.

8. The device of claim 1 , wherein the at least one physical property is measured based on a spin Hall effect or an inverse spin Hall effect.

9. The device of claim 1 , wherein the first radius is twice that of the second radius.

10. The device of claim 1 , wherein the magnetic film is formed from a ferrimagnetic material.

11. The device of claim 10 , wherein the ferrimagnetic material is yttrium iron garnet (YIG).

12. The device of claim 10 , wherein the ferrimagnetic material is Barium ferrite (BaM).

13. The device of claim 1 , further comprising:
a biasing field generator operable to produce a magnetic bias field across the magnetic film.

14. The device of claim 13 , wherein the biasing field generator is configured to:
apply a first biasing field strength causing waves of a first wavelength to focus at the particular location; and
apply a second biasing field strength causing waves of a second wavelength to focus at the particular location.

Assignees

• Univ Notre Dame Du Lac

Inventors

• Csaba Gyorgy
• Papp Adam
• Chisum Jonathan
• Porod Wolfgang
• Bernstein Gary

Classifications

• G01R23/16 Primary

  Spectrum analysis; Fourier analysis · CPC title

• G01R33/1284

  Spin resolved measurements; Influencing spins during measurements, e.g. in spintronics devices · CPC title