Multilayer ceramic electronic component

Patent metadata

Field	Value
Publication number	US-10607776-B2
Application number	US-201615071803-A
Country	US
Kind code	B2
Filing date	Mar 16, 2016
Priority date	Jul 22, 2015
Publication date	Mar 31, 2020
Grant date	Mar 31, 2020

Abstract

A multilayer ceramic electronic component includes a ceramic body in which dielectric layers and internal electrodes are alternately stacked. The dielectric layers contain at least one dielectric grain having a ratio of a long axis to a short axis that is 3.5 or more. The internal electrodes contain a ceramic component containing a grain growth adjusting ingredient for dielectric grains. Each dielectric layer includes interfacial portions adjacent to the internal electrodes and a central portion disposed between the interfacial portions, and concentrations of the grain growth adjusting ingredient in the interfacial portions and the central portion are different from each other.

First claim

What is claimed is:

1. A multilayer ceramic electronic component comprising:
a ceramic body in which dielectric layers and internal electrodes are alternately stacked,
wherein the internal electrodes contain a ceramic component containing a grain growth adjusting ingredient for dielectric grains, and the dielectric layers each include interfacial portions adjacent to the internal electrodes and a central portion disposed between the interfacial portions, and
wherein a ratio of a number of the dielectric grains having a ratio of a long axis to a short axis that is 3.5 or more contained in a particular dielectric layer to a total number of the dielectric grains contained in the particular dielectric layer is 0.1% to 30%.

2. The multilayer ceramic electronic component of claim 1 , wherein the internal electrodes contain the ceramic component trapped therein, and a cross-sectional area occupied by the ceramic component is 3% to 30% of the entire cross-sectional area of the internal electrodes.

3. The multilayer ceramic electronic component of claim 1 , wherein a ratio (T 2 /T 1 ) of a thickness T 2 of dielectric grains present in the interfacial portions adjacent to the internal electrodes to a thickness T 1 of the dielectric layer is 10 to 45%.

4. The multilayer ceramic electronic component of claim 1 , wherein an average particle size of dielectric grains present in the central portion disposed between the interfacial portions is equal to or less than 85% of an average particle size of dielectric grains present in the interfacial portions.

5. The multilayer ceramic electronic component of claim 1 , wherein a ratio (T 2 /T 1 ) of a thickness T 2 of dielectric grains present in the interfacial portions adjacent to the internal electrodes to a thickness T 1 of the dielectric layer is 2% to 30%.

6. The multilayer ceramic electronic component of claim 1 , wherein an average particle size of dielectric grains present in the interfacial portions is equal to or less than 85% of an average particle size of dielectric grains present in the central portion disposed between the interfacial portions.

7. The multilayer ceramic electronic component of claim 1 , wherein the grain growth adjusting ingredient includes a grain growth promoter selected from the group consisting of Li, Bi, B, Na and K, and a grain growth inhibitor selected from the group consisting of Mg, Si, V, Yb, Y, Zr, and S.

8. A multilayer ceramic electronic component comprising:
a ceramic body in which dielectric layers and internal electrodes are alternately stacked,
wherein the internal electrodes contain a grain growth adjusting ingredient for dielectric grains, the grain growth adjusting ingredient including one of a grain growth promoter and a grain growth inhibitor, and
wherein a ratio of a number of the dielectric grains, having a ratio of a long axis to a short axis that is 3.5 or more contained in a particular dielectric layer, to a total number of the dielectric grains contained in the particular dielectric layer is 0.1% to 30%.

9. The multilayer ceramic electronic component of claim 8 , wherein each dielectric layer includes interfacial portions adjacent to the internal electrodes and a central portion disposed between the interfacial portions, and a concentration of the grain growth promoter in the central portion is lower than that in the interfacial portions.

10. The multilayer ceramic electronic component of claim 9 , wherein a ratio (T 2 /T 1 ) of a thickness T 2 of dielectric grains present in the interfacial portions adjacent to the internal electrodes to a thickness T 1 of the dielectric layer is 10% to 45%.

11. The multilayer ceramic electronic component of claim 9 , wherein an average particle size of dielectric grains present in the central portion disposed between the interfacial portions is equal to or less than 85% of an average particle size of dielectric grains present in the interfacial portions.

12. The multilayer ceramic electronic component of claim 8 , wherein each dielectric layer includes interfacial portions adjacent to the internal electrodes and a central portion disposed between the interfacial portions, a concentration of the grain growth inhibitor in the central portion is higher than that in the interfacial portions, and a concentration of the grain growth promoter in the interfacial portions is higher than that in the central portion.

13. The multilayer ceramic electronic component of claim 8 , wherein each dielectric layer includes interfacial portions adjacent to the internal electrodes and a central portion disposed between the interfacial portions, and a concentration of the grain growth inhibitor in the interfacial portions is higher than that in the central portion.

14. The multilayer ceramic electronic component of claim 13 , wherein a ratio (T 2 /T 1 ) of a thickness T 2 of dielectric grains present in the interfacial portions adjacent to the internal electrodes to a thickness T 1 of the dielectric layer is 2% to 30%.

15. The multilayer ceramic electronic component of claim 13 , wherein an average particle size of dielectric grains present in the interfacial portions is equal to or less than 85% of an average particle size of dielectric grains present in the central portion disposed between the interfacial portions.

16. The multilayer ceramic electronic component of claim 8 , wherein each dielectric layer includes interfacial portions adjacent to the internal electrodes and a central portion disposed between the interfacial portions, a concentration of the grain growth inhibitor in the interfacial portions is higher than that in the central portion, and a concentration of the grain growth promoter in the central portion is higher than that in the interfacial portions.

17. A multilayer ceramic electronic component comprising:
a plurality of internal electrodes that are stacked parallel to each other; and
a plurality of dielectric layers disposed between adjacent internal electrodes of the stacked internal electrodes,
wherein the internal electrodes and dielectric layers are stacked along a thickness direction of the multilayer ceramic electronic component, and each respective dielectric layer includes a grain growth adjusting ingredient, which is one or more of a grain growth promoter and a grain growth inhibitor, and
wherein a ratio of a number of the dielectric grains having a ratio of a long axis to a short axis that is 3.5 or more in a particular dielectric layer to a total number of the dielectric grains contained in the particular dielectric layer is 0.1% to 30%.

18. The multilayer ceramic electronic component of claim 17 , wherein the grain growth adjusting ingredient includes one or more elements selected from the group consisting of Li, Bi, B, Na, K, Mg, Si, V, Yb, Y, Zr, and S.

19. The multilayer ceramic electronic component of claim 17 , wherein the internal electrodes of the plurality of internal electrodes include the same grain growth adjusting ingredient as the dielectric layers.

20. The multilayer ceramic electronic component of claim 19 , wherein the internal electrodes include a ceramic component that is doped with the same grain growth adjusting ingredient.

21. The multilayer ceramic electronic component of claim 17 , wherein the concentration of the grain growth adjusting ingredient varies in the respective dielectric layer according to a distance to a nearest internal electrode, and the concentration of the grain growth adjusting ingredient is higher in the respective dielec

Assignees

• Samsung Electro Mech

Inventors

• Park Kum Jin
• Choi Chang Hak
• Yoo Jong Hoon
• Kim Doo Young
• Sin Min Gi
• Lee Chi Hwa
• Lee Chul Seung
• Kim Jong Han

Classifications

• H01G4/1227

  based on alkaline earth titanates · CPC title

• H01G4/012

  Form of non-self-supporting electrodes · CPC title

• H01G4/1218

  based on titanium oxides or titanates (H01G4/1245 takes precedence) · CPC title

• H01G4/005

  Electrodes · CPC title

• H01G4/30 Primary

  Stacked capacitors (H01G4/33 takes precedence) · CPC title